Abstract: A portable near-field measurement system for mapping radio frequency characteristics spherically about a test object is presented. The system includes an anechoic chamber, a rotatable annular platter, a rotatable platter, a stationary platform, and frequency converters. The chamber is an enclosure with an absorber material fastened to the interior thereof. The annular platter is disposed horizontally within the chamber and fastened to an azimuth positioner that rotates the annular platter about an azimuth rotation axis. The rotatable platter is disposed vertically within the chamber and rotatable about an elevation rotation axis via an elevation positioner. Azimuth and elevation axes intersect perpendicularly. A gantry arm with probe is fastened to and extends from the rotatable platter. A vertical arm is fastened between the annular platter and elevation positioner. Platters have front and back surfaces. A stationary platform is centered within the annular platter and attachable to a test column.

Abstract: A portable near-field measurement system for mapping radio frequency characteristics spherically about a test object is presented. The system includes an anechoic chamber, a rotatable annular platter, a rotatable platter, a stationary platform, and frequency converters. The chamber is an enclosure with an absorber material fastened to the interior thereof. The annular platter is disposed horizontally within the chamber and fastened to an azimuth positioner that rotates the annular platter about an azimuth rotation axis. The rotatable platter is disposed vertically within the chamber and rotatable about an elevation rotation axis via an elevation positioner. Azimuth and elevation axes intersect perpendicularly. A gantry arm with probe is fastened to and extends from the rotatable platter. A vertical arm is fastened between the annular platter and elevation positioner. Platters have front and back surfaces. A stationary platform is centered within the annular platter and attachable to a test column.

Abstract: An apparatus for studying the electromagnetic behavior of an electromagnetic wave-emitting or electromagnetic wave-receiving tool is provided. An anechoic chamber is configured to receive the tool as well as a person handling the tool. At least one analysis antenna is configured to pick-up the electromagnetic waves emitted from or received by the tool. Signals outputted by the analysis antenna are processed, and a radiation diagram associated with the electromagnetic tool is displayed. The radiation diagram is displayed inside the anechoic chamber so that the person handling the electromagnetic tool observes how the handling of the tool affects its electromagnetic behavior.

Abstract: A device determines at least one characteristic of electromagnetic radiation emitted from a test object. A support receives the object. A network of probes is distributed along a substantially circular arc, and the support is disposed in a plane formed by the network of probes or in a plane parallel to the plane formed by the network of probes. The network of probes or the support is pivoted in the plane formed by the network of probes or in the plane parallel to the plane formed by the network of probes about a point located in that plane to vary an angle formed between a given one of the network of probes and the support, and thereby allow measurements to be taken at plural angular positions of the network of probes relative to the test object.

Abstract: A radiometry system including an aperture synthesis antenna array type, including plural antenna elements, distributed in an antenna plane relative to at least one axis, according to a determined law. Each antenna element includes first and second coupling probes sensitive to hyper-frequency electromagnetic signals with dual linear polarization in quadrature (arbitrarily referred to as horizontal and vertical polarizations). The probes are connected two by two with electric receiving circuits to create a synthetic aperture. The horizontal (fH1-fH4) and vertical (fV1-fV4) coupling probes of successive antenna elements (eA1-eA4) are oriented in the antenna plane (At′), along each of the axes (&Dgr;), such that at least one of the horizontal or vertical probes (fH1-fH4, fV1-f4) presents a 180° phase shift from one antenna element to the other (eA1-eA4), with the phase shift obtained by a sequential 90° rotation of those probes (fH1-fH4, fV1-fV4).