Patents by Inventor Peter Haberlein

Peter Haberlein has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6344740
    Abstract: A guide device for linear guidance of elongated objects, particularly for positioning wires passing a nondestructive eddy current test device, can be the inlet nozzle or outlet nozzle, and has a brush arrangement integrated into a guide sleeve. The brush arrangement damps vibration of the wires or other elongated objects transiting the test device. A wire guided by the guide device is protected at its surface and subjected to little or no transverse vibration in the vicinity of the test probe of the test device, resulting in improved measurement accuracy.
    Type: Grant
    Filed: May 25, 1999
    Date of Patent: February 5, 2002
    Assignee: Institut Dr. Friedrich Forster Prufgeratebau GmbH & Co. KG
    Inventor: Peter Häberlein
  • Patent number: 5550468
    Abstract: A method and apparatus for testing an elongate product for faults and defects, which comprises a rotatable testing head which permits the elongate product to be passed coaxially therethrough and which mounts a pair of testing probes so as to permit adjustment of their operating diameter. In order to automatically adjust the positions of the probes to accommodate elongate products of different sizes, there is provided an external adjustment unit, which stops the testing head in a predetermined angular position. The adjustment unit contains an external adjustment drive and when the rotation of the testing head has stopped, the external adjustment drive is advanced into operative engagement with the adjustable mounting of the testing probes.
    Type: Grant
    Filed: March 23, 1994
    Date of Patent: August 27, 1996
    Assignee: Institut Dr. Friedrich Forster Prufgeratebau GmbH & Co. KG
    Inventors: Peter Haberlein, Hans Link
  • Patent number: 4314203
    Abstract: A test arrangement for non-destructive defect testing of metallic test pieces includes test probes which contactingly move across the surface of a test piece. Resilient members act on the testhead carrying the probes, one at each side of the testhead center of gravity, enabling the testhead to extend beyond the test piece edge while maintaining good contact between the probes and test piece. The testhead is adjustable with respect to the test piece surface and is maintained at a constant spacing from the test piece irrespective of test piece surface irregularities.
    Type: Grant
    Filed: April 9, 1979
    Date of Patent: February 2, 1982
    Assignee: Institut Dr. Friedrich Forster Prufgeratebau
    Inventor: Peter Haberlein
  • Patent number: 4270089
    Abstract: A scanning test head is provided which maintains a constant speed over the scanning path with the constancy of the speed in the scanning zone being dependent solely on the drive motor characteristics. An endless belt received on a pair of spaced rollers carries a pin which, on being driven around the closed path, serves to define the head scanning path.
    Type: Grant
    Filed: September 25, 1978
    Date of Patent: May 26, 1981
    Assignee: Samsonite Corporation
    Inventor: Peter Haberlein
  • Patent number: 4063159
    Abstract: A magnetic field probe is supported within a hollow base at one end by a resilient spring element and at its other end by a member adjustable to move the probe transversely of the axis defined by the probe ends. The spring element biases the probe in a direction transversely of the probe axis.
    Type: Grant
    Filed: June 18, 1976
    Date of Patent: December 13, 1977
    Assignee: Institut Dr. Friedrich Forster, Prufgeratebau
    Inventor: Peter Haberlein