Patents by Inventor Peter Kenneth Hellier
Peter Kenneth Hellier has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9157722Abstract: A measurement probe, for a co-ordinate positioning apparatus such as a machine tool, is described that includes a stylus holder that is deflectably mounted to a probe housing. One or more sensors are provided for sensing deflection of the stylus holder relative to the probe housing. A processor is included for producing a trigger signal when the deflection sensed by the one or more sensors meets a trigger condition, such as a deflection threshold. The probe also includes an accelerometer for measuring acceleration of the measurement probe. The trigger condition applied by the processor is alterable, during use, in response to the acceleration measured by the accelerometer. In this manner, false triggering can be suppressed.Type: GrantFiled: January 31, 2014Date of Patent: October 13, 2015Assignee: RENISHAW PLCInventors: Michael John Wooldridge, Peter Kenneth Hellier, Robert Charles D'Olier Umfreville
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Patent number: 9121683Abstract: A measurement probe, for a co-ordinate positioning apparatus such as a machine tool, is described that includes a stylus holder that is deflectably mounted to a probe housing. One or more sensors are provided for sensing deflection of the stylus holder relative to the probe housing. A processor is included for producing a trigger signal when the deflection sensed by the one or more sensors meets a trigger condition, such as a deflection threshold. The probe also includes an accelerometer for measuring acceleration of the measurement probe. The trigger condition applied by the processor is alterable, during use, in response to the acceleration measured by the accelerometer. In this manner, false triggering can be suppressed.Type: GrantFiled: January 31, 2014Date of Patent: September 1, 2015Assignee: RENISHAW PLCInventors: Michael John Wooldridge, Peter Kenneth Hellier, Robert Charles D'Olier Umfreville
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Publication number: 20140144033Abstract: A measurement probe, for a co-ordinate positioning apparatus such as a machine tool, is described that includes a stylus holder that is deflectably mounted to a probe housing. One or more sensors are provided for sensing deflection of the stylus holder relative to the probe housing. A processor is included for producing a trigger signal when the deflection sensed by the one or more sensors meets a trigger condition, such as a deflection threshold. The probe also includes an accelerometer for measuring acceleration of the measurement probe. The trigger condition applied by the processor is alterable, during use, in response to the acceleration measured by the accelerometer. In this manner, false triggering can be suppressed.Type: ApplicationFiled: January 31, 2014Publication date: May 29, 2014Applicant: Renishaw PLCInventors: Michael John WOOLDRIDGE, Peter Kenneth HELLIER, Robert Charles D'Olier UMFREVILLE
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Patent number: 8676533Abstract: A measurement probe, for a co-ordinate positioning apparatus such as a machine tool, is described that includes a stylus holder that is deflectably mounted to a probe housing. One or more sensors are provided for sensing deflection of the stylus holder relative to the probe housing. A processor is included for producing a trigger signal when the deflection sensed by the one or more sensors meets a trigger condition, such as a deflection threshold. The probe also includes an accelerometer for measuring acceleration of the measurement probe. The trigger condition applied by the processor is alterable, during use, in response to the acceleration measured by the accelerometer. In this manner, false triggering can be suppressed.Type: GrantFiled: March 9, 2009Date of Patent: March 18, 2014Assignee: Renishaw PLCInventors: Michael John Wooldridge, Peter Kenneth Hellier, Robert Charles D'Olier Umfreville
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Patent number: 8464054Abstract: A measurement probe, such as a touch trigger measurement probe, is described that comprises a measurement portion for measuring an object and a data transfer portion for receiving data from and/or transmitting data to an associated unit. The measurement device also comprises an authentication module for verifying the authenticity of the associated unit. The authentication module may include a processor for running a one-way hash algorithm. Authenticity may be established using a challenge and response authentication process.Type: GrantFiled: July 8, 2008Date of Patent: June 11, 2013Assignee: Renishaw PLCInventors: Tim Prestidge, Jonathan Paul Fuge, Peter Kenneth Hellier, John Styles, Jamie Buckingham
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Patent number: 8402270Abstract: A measurement probe, such as a touch trigger measurement probe, is described that comprises a measurement portion for measuring an object and a data transfer portion for receiving data from and/or transmitting data to an associated unit. The measurement device also comprises an authentication module for verifying the authenticity of the associated unit. The authentication module may include a processor for running a one-way hash algorithm. Authenticity may be established using a challenge and response authentication process.Type: GrantFiled: July 8, 2008Date of Patent: March 19, 2013Assignee: Renishaw PLCInventors: Tim Prestidge, Jonathan Paul Fuge, Peter Kenneth Hellier, John Styles, Jamie Buckingham
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Publication number: 20110004437Abstract: A measurement probe, for a co-ordinate positioning apparatus such as a machine tool, is described that includes a stylus holder that is deflectably mounted to a probe housing. One or more sensors are provided for sensing deflection of the stylus holder relative to the probe housing. A processor is included for producing a trigger signal when the deflection sensed by the one or more sensors meets a trigger condition, such as a deflection threshold. The probe also includes an accelerometer for measuring acceleration of the measurement probe. The trigger condition applied by the processor is alterable, during use, in response to the acceleration measured by the accelerometer. In this manner, false triggering can be suppressed.Type: ApplicationFiled: March 9, 2009Publication date: January 6, 2011Applicant: RENISHAW PLCInventors: Michael John Wooldridge, Peter Kenneth Hellier, Robert Charles D'Olier Umfreville
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Patent number: 7765708Abstract: A ‘go, no-go’ method is described for determining whether the dimensions of an object, such as a workpiece, conform to tolerance. The method uses a measurement probe, such as a touch trigger, analogue, or non-contact probe, mounted on a measuring apparatus such as a coordinate measuring machine, machine tool, or a lathe. The method comprises the step of driving the measurement probe around a path relative to the object, said path being based on a tolerance of the object. The path relative to the object may include at least a first path based on the maximum tolerance of the object and a second path based on the minimum tolerance of the object. The method additionally comprises the steps of monitoring any probe measurement data acquired by the measurement probe as the probe is driven around the path, and indicating if the dimensions of the object do not conform to tolerance only if there is a change in state of the probe measurement data that is acquired as the measurement probe is driven around the path.Type: GrantFiled: June 6, 2007Date of Patent: August 3, 2010Assignee: Renishaw PLCInventor: Peter Kenneth Hellier
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Patent number: 7689379Abstract: A dimensional measurement probe (10) is mounted in a machine tool (48), which reorientates the probe about at least one axis A. Strain gauges (34) sense when a stylus (20) of the probe contacts a workpiece (50), to produce a trigger signal. False trigger signals may be produced when the probe is reorientated. To overcome this, the reorientation is detected by monitoring changes in the fluctuations of the strain gauge outputs, caused by vibrations of the stylus.Type: GrantFiled: June 15, 2006Date of Patent: March 30, 2010Assignee: Renishaw PLCInventors: Jonathan Paul Fuge, Michael John Wooldridge, Jamie John Buckingham, Peter Kenneth Hellier
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Patent number: 7603789Abstract: A probe for position determining apparatus has a probe body (18) and a workpiece-contacting stylus (14). A strain sensitive structure connects the probe body and the stylus, and includes bendable members (32). The bendable members have an asymmetric cross-section, e.g. “T” shaped. A strain gauge (33) is mounted to the stem of the “T” to detect the bending caused when the stylus contacts a workpiece. This enables the strain sensitive structure to be both robust and sensitive to the bending.Type: GrantFiled: March 24, 2006Date of Patent: October 20, 2009Assignee: Renishaw PLCInventors: Peter Kenneth Hellier, David Roberts McMurtry
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Publication number: 20090235547Abstract: A ‘go, no-go’ method is described for determining whether the dimensions of an object, such as a workpiece, conform to tolerance. The method uses a measurement probe, such as a touch trigger, analogue, or non-contact probe, mounted on a measuring apparatus such as a coordinate measuring machine, machine tool, or a lathe. The method comprises the step of driving the measurement probe around a path relative to the object, said path being based on a tolerance of the object. The path relative to the object may include at least a first path based on the maximum tolerance of the object and a second path based on the minimum tolerance of the object. The method additionally comprises the steps of monitoring any probe measurement data acquired by the measurement probe as the probe is driven around the path, and indicating if the dimensions of the object do not conform to tolerance only if there is a change in state of the probe measurement data that is acquired as the measurement probe is driven around the path.Type: ApplicationFiled: June 6, 2007Publication date: September 24, 2009Applicant: RENISHAW PLCInventor: Peter Kenneth Hellier
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Publication number: 20090099803Abstract: A dimensional measurement probe (10) is mounted in a machine tool (48), which reorientates the probe about at least one axis A. Strain gauges (34) sense when a stylus (20) of the probe contacts a workpiece (50), to produce a trigger signal. False trigger signals may be produced when the probe is reorientated. To overcome this, the reorientation is detected by monitoring changes in the fluctuations of the strain gauge outputs, caused by vibrations of the stylus.Type: ApplicationFiled: June 15, 2006Publication date: April 16, 2009Applicant: RENISHAW PLCInventors: Jonathan Paul Fuge, Michael John Wooldridge, Jamie John Buckingham, Peter Kenneth Hellier
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Publication number: 20080163507Abstract: A probe for position determining apparatus has a probe body (18) and a workpiece-contacting stylus (14). A strain sensitive structure connects the probe body and the stylus, and includes bendable members (32). The bendable members have an asymmetric cross-section, e.g. “T” shaped. A strain gauge (33) is mounted to the stem of the “T” to detect the bending caused when the stylus contacts a workpiece. This enables the strain sensitive structure to be both robust and sensitive to the bending.Type: ApplicationFiled: March 24, 2006Publication date: July 10, 2008Applicant: Renishaw PLCInventors: Peter Kenneth Hellier, David Roberts McMurtry