Abstract: An apparatus and associated method for reflecting elastic waves that propagate from an excitation source to an excitation-sensitive component in a device. The device has an enclosure with a base constructed of a first metal. An elastic wave reflector is constructed of a different second metal and is operably affixed to the base. The elastic wave reflector defines a support surface to which the excitation-sensitive component is operably affixed within the enclosure.

Abstract: A storage device testing system that includes a rack and a vibration management material. The rack includes at least one test slot that is configured to receive a storage device for testing. The test slot is substantially exposed to air on at least one side. The vibration management material is capable of absorbing and/or diffusing air-borne vibration. The vibration management material is disposed so as to attenuate air-borne vibration coupled to the test slot.

Abstract: A method for monitoring a gas leakage rate from a hermetically sealed device, such as a hermetically sealed data storage device with an interior helium atmosphere. In some embodiments, a diffusion rate of inert gas from a hermetically sealed first device is monitored until steady state diffusion is reached, and a standard time constant for the first device is identified. Next, the diffusion rate is monitored for a second sealed device for a portion of the time required for the first device to achieve steady state diffusion, and the time required for the second device to reach steady state diffusion using the standard time constant is calculated.

Abstract: An apparatus and associated method for reflecting elastic waves that propagate from an excitation source to an excitation-sensitive component in a device. The device has an enclosure with a base constructed of a first metal. An elastic wave reflector is constructed of a different second metal and is operably affixed to the base. The elastic wave reflector defines a support surface to which the excitation-sensitive component is operably affixed within the enclosure.

Abstract: A method for monitoring a gas leakage rate from a hermetically sealed device, such as a hermetically sealed data storage device with an interior helium atmosphere. In some embodiments, a diffusion rate of inert gas from a hermetically sealed first device is monitored until steady state diffusion is reached, and a standard time constant for the first device is identified. Next, the diffusion rate is monitored for a second sealed device for a portion of the time required for the first device to achieve steady state diffusion, and the time required for the second device to reach steady state diffusion using the standard time constant is calculated.

Abstract: A semiconductor assembly comprises a semiconductor package comprising a substrate, a die positioned on the substrate, and a lid positioned on the die. A receiver receives the semiconductor package. A clamp engages the lid of the semiconductor package and the receiver and applies a clamping force to the lid of the semiconductor package to hold the semiconductor package to the receiver. A spring member having a clamp contact portion and a substrate contact portion is positioned between the clamp and the substrate of the semiconductor package so that the clamp contact portion of the spring member contacts the clamp and so that the substrate contact portion of the spring member contacts the substrate of the semiconductor package, the spring member transferring a portion of the clamping force from the lid of the semiconductor package to the substrate of the semiconductor package.