Patents by Inventor Peter Schuck

Peter Schuck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9399448
    Abstract: A brake actuation apparatus and method are described. An air cylinder is pivotally attached to an operating unit of the brake actuation apparatus. The air cylinder extends away from the operating unit and is configured to connect to the brake pedal to actuate a brake of the towed vehicle through the brake pedal. A stabilizing cable has one end attached to the firewall of the towed vehicle and an opposite end releaseably attached to the brake actuation apparatus, such that when the air cylinder applies pressure to the towed vehicle's brake pedal, the stabilizer cable transfers reaction to the towed vehicle's firewall and supplies a stable anchor point.
    Type: Grant
    Filed: January 16, 2015
    Date of Patent: July 26, 2016
    Inventor: Peter Schuck
  • Publication number: 20160207508
    Abstract: A brake actuation apparatus and method are described. An air cylinder is pivotally attached to an operating unit of the brake actuation apparatus. The air cylinder extends away from the operating unit and is configured to connect to the brake pedal to actuate a brake of the towed vehicle through the brake pedal. A stabilizing cable has one end attached to the firewall of the towed vehicle and an opposite end releaseably attached to the brake actuation apparatus, such that when the air cylinder applies pressure to the towed vehicle's brake pedal, the stabilizer cable transfers reaction to the towed vehicle's firewall and supplies a stable anchor point.
    Type: Application
    Filed: January 16, 2015
    Publication date: July 21, 2016
    Inventor: Peter Schuck
  • Patent number: 8479311
    Abstract: The invention relates to a device for an atomic force microscope (AFM) for the study and/or modification of surface properties. The device comprises a cantilever (flexible bar) having an integrated, piezoresistive sensor, an integrated bimorphic actuator, and a measuring tip. The measuring tip carries at least two metal electrodes, which can be activated via electrical terminals. The measuring tip and/or the cantilever have at least one nanoscopic hole through which synchrotron radiation or laser light is directed onto the material surface to be studied. Furthermore, the invention relates to a method for the study and modification of surface properties and surface-proximal properties, which can be executed using such a device. To this end, atomic force microscopy (AFM), surface enhanced Raman scattering (SERS), photo emission spectroscopy (XPS, XAS), and material modification by local exposure are executed in sequence or simultaneously using the same device.
    Type: Grant
    Filed: December 10, 2008
    Date of Patent: July 2, 2013
    Assignees: Technische Universitat Ilmenau, Synchrotron Soleil, The Regents of the University of California
    Inventors: Stefan Kubsky, Deirdre Olynick, Peter Schuck, Jan Meijer, Ivo W. Rangelow
  • Publication number: 20110055985
    Abstract: The invention relates to a device for an atomic force microscope (AFM) for the study and/or modification of surface properties. The device comprises a cantilever (flexible bar) having an integrated, piezoresistive sensor, an integrated bimorphic actuator, and a measuring tip. The measuring tip carries at least two metal electrodes, which can be activated via electrical terminals. The measuring tip and/or the cantilever have at least one nanoscopic hole through which synchrotron radiation or laser light is directed onto the material surface to be studied. Furthermore, the invention relates to a method for the study and modification of surface properties and surface-proximal properties, which can be executed using such a device. To this end, atomic force microscopy (AFM), surface enhanced Raman scattering (SERS), photo emission spectroscopy (XPS, XAS), and material modification by local exposure are executed in sequence or simultaneously using the same device.
    Type: Application
    Filed: December 10, 2008
    Publication date: March 3, 2011
    Applicants: TECHNISCHE UNIVERSITAT ILMENAU, SYNCHROTRON SOLEIL, THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
    Inventors: Stefan Kubsky, Deirdre Olynick, Peter Schuck, Jan Meijer, Ivo W. Rangelow
  • Publication number: 20040028559
    Abstract: A device and method for molecular or microanalytical sensing that includes a sample chamber containing a sensing device a first and second microchannel fluidly connected to the sample chamber and at least one pump for pumping a fluid sample back and forth from the first microchannel through the sample chamber to the second microchannel. At least one of the microchannels or the sample chamber has a width that causes molecular mixing of the sample by laminar flow as the sample is pumped back and forth. The microchannels may have a width of, for example, from about 10 mm to about 1 mm or from about 50 mm to about 500 mm. The sample chamber may have a volume of, for example, about 1 nl to about 10 ml or from about 10 nl to about 100 nl. The method is particularly useful for assessing the interaction between molecules in a solution with molecules immobilized on a surface or with the surface itself as in, for example, a biosensor.
    Type: Application
    Filed: May 5, 2003
    Publication date: February 12, 2004
    Inventor: Peter Schuck
  • Patent number: D284591
    Type: Grant
    Filed: August 15, 1983
    Date of Patent: July 8, 1986
    Assignee: Affaril Handelsanstalt
    Inventor: Peter Schuck