Abstract: A power FET and a replica FET on a semiconductor chip coupled to a logic control circuit on a second semiconductor chip within a single housing. A power FET and a scaled down replica of the power FET are disposed on a semiconductor chip. The power FET is used as a switch to couple a DC power source to a load. A fraction of the power FET drain current passes through the replica FET and an external resistance. When the voltage across the external resistance exceeds a maximum value based upon the maximum allowable power FET drain current, the logic control circuit enters into a pulsed gate (PG) mode of operation. The first step in the PG mode is to switch both FETs into a non-conducting state for a predefined period of time. After this time period, a ramp voltage applied between gate and source of both FETs will switch them back into a current conducting state while holding the power FET drain current below its upper limit in the presence of a high capacitance load.