Patents by Inventor Peter W. Lorraine

Peter W. Lorraine has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210133429
    Abstract: According to some embodiments, a system, method and non-transitory computer-readable medium are provided to measure mental processes of a subject including receiving a first image representative of a face of a subject from an image capture device; determining one or more first facial geometry features from the first image; comparing the one or more first facial geometry features to one or more corresponding target facial geometry features; modulating the one or more first facial geometry features based upon the comparing of the one or more first facial geometry features to the one or more corresponding target facial geometry features to generate a first modulated image; displaying the first modulated image in a display device; receiving a second image of the face of the subject, the second image representative of a response of the subject to viewing the first modulated image; and analyzing the second image to determine a mental process associated with the subject.
    Type: Application
    Filed: November 1, 2019
    Publication date: May 6, 2021
    Inventor: Peter W. Lorraine
  • Patent number: 8113056
    Abstract: A mid infrared range laser source for ultrasound inspection having a high energy laser coupled with one or more harmonic generation devices. The high energy laser may be a CO2 laser and tuned to emit laser light at a single wavelength. The harmonic generation devices convert the laser beam into the mid infrared range for optimal ultrasound inspection.
    Type: Grant
    Filed: May 15, 2008
    Date of Patent: February 14, 2012
    Assignee: Lockheed Martin Corporation
    Inventors: Thomas E. Drake, Jr., Marc Dubois, Peter W. Lorraine, John B. Deaton, Jr., Robert Filkins
  • Patent number: 8064488
    Abstract: A compact high average power mid infrared range laser for ultrasound inspection. The laser comprises one of a Nd:YAG or Yb:YAG laser pumped by a diode at 808 nm to produce a 1 micron output beam. The 1 micron output beam is directed to an optical parametric oscillator where the beam wavelength is converted to 1.94 microns and conveyed to a mid infrared emission head. The emission head comprises one of a Ho:YAG or Ho:YLG laser optically coupled with a second optical parametric oscillator. The second optical parametric oscillator forms a generation output beam for creating ultrasonic displacements on a target. The generation output beam wavelength ranges from about 3 to about 4 microns, and can be 3.2 microns.
    Type: Grant
    Filed: May 15, 2008
    Date of Patent: November 22, 2011
    Assignee: Lockheed Martin Corporation
    Inventors: Thomas E. Drake, Jr., Marc Dubois, Peter W. Lorraine, John B. Deaton, Jr., Robert Filkins
  • Patent number: 8054470
    Abstract: A method of spectroscopic analysis of a material using a laser ultrasound system. The method includes measuring amplitude displacement of a target surface that has been excited with a generation laser. The amplitude displacements relate to the target's optical absorption properties. Amplitude displacements are generated over a range of laser wavelengths to obtain an optical absorption signature useful to identify the target material characteristics.
    Type: Grant
    Filed: May 15, 2008
    Date of Patent: November 8, 2011
    Assignee: Lockheed Martin Corporation
    Inventors: Peter W. Lorraine, Thomas E. Drake, Jr., John B. Deaton, Jr., Marc Dubois, Robert Filkins
  • Patent number: 7821646
    Abstract: A method of ultrasonic testing comprising conditioning a radiation wave from a laser source by efficiently converting the radiation wave's wavelength to a mid-IR wavelength for enhanced ultrasonic testing of a composite. The method includes passing the radiation wave through a first optical frequency converter where the radiation wave is converted into a signal wave and an idler wave, where the idler wave is at a mid-IR wavelength. The method further includes directing the signal and idler waves to a second optical frequency converter where the signal wave wavelength is converted to a mid-IR wavelength which combines with the idler wave to form a generation wave. The generation wave is directed at a composite surface to be tested.
    Type: Grant
    Filed: May 15, 2008
    Date of Patent: October 26, 2010
    Assignee: Lockheed Martin Corporation
    Inventors: Thomas E. Drake, Jr., Peter W. Lorraine, John B. Deaton, Jr., Marc Dubois, Robert Filkins
  • Patent number: 7667851
    Abstract: The invention is directed to a wave characteristic adjusting device used to compensate for a wave characteristic distortion caused by the scanning motion of a probe beam of a two-wave mixing interferometer. The invention is also directed to an apparatus and method for using the wave characteristic adjusting device in a rapid scanning laser ultrasound testing device. In a rapid scanning laser ultrasound testing device, a laser pulse is directed at periodic points along a path across the surface of a manufactured object. The laser pulse initiates an ultrasonic signal associated with the manufactured object. An interferometer may be used to measure the initiated ultrasonic signal. The interferometer scans a probe beam along a path similar to the sonic initiating laser. A pulse of the probe beam is directed at the manufactured object in the vicinity of the initiating laser pulse while continuously scanning. As a result, the probe beam pulse may exhibit a Doppler shift.
    Type: Grant
    Filed: January 30, 2002
    Date of Patent: February 23, 2010
    Assignee: Lockheed Martin Corporation
    Inventors: Marc Dubois, Thomas E. Drake, Robert J. Filkins, Peter W. Lorraine
  • Publication number: 20090285244
    Abstract: A compact high average power mid infrared range laser for ultrasound inspection. The laser comprises one of a Nd:YAG or Yb:YAG laser pumped by a diode at 808 nm to produce a 1 micron output beam. The 1 micron output beam is directed to an optical parametric oscillator where the beam wavelength is converted to 1.94 microns and conveyed to a mid infrared emission head. The emission head comprises one of a Ho:YAG or Ho:YLG laser optically coupled with a second optical parametric oscillator. The second optical parametric oscillator forms a generation output beam for creating ultrasonic displacements on a target. The generation output beam wavelength ranges from about 3 to about 4 microns, and can be 3.2 microns.
    Type: Application
    Filed: May 15, 2008
    Publication date: November 19, 2009
    Applicant: LOCKHEED MARTIN CORPORATION
    Inventors: Thomas E. Drake, JR., Marc Dubois, Peter W. Lorraine, John B. Deaton, JR., Robert Filkins
  • Publication number: 20090284752
    Abstract: A method of spectroscopic analysis of a material using a laser ultrasound system. The method includes measuring amplitude displacement of a target surface that has been excited with a generation laser. The amplitude displacements relate to the target's optical absorption properties. Amplitude displacements are generated over a range of laser wavelengths to obtain an optical absorption signature useful to identify the target material characteristics.
    Type: Application
    Filed: May 15, 2008
    Publication date: November 19, 2009
    Applicant: LOCKHEED MARTIN CORPORATION
    Inventors: Peter W. Lorraine, Thomas E. Drake, JR., John B. Deaton, JR., Marc Dubois, Robert Filkins
  • Publication number: 20090284751
    Abstract: A method of ultrasonic testing comprising conditioning a radiation wave from a laser source by efficiently converting the radiation wave's wavelength to a mid-IR wavelength for enhanced ultrasonic testing of a composite. The method includes passing the radiation wave through a first optical frequency converter where the radiation wave is converted into a signal wave and an idler wave, where the idler wave is at a mid-IR wavelength. The method further includes directing the signal and idler waves to a second optical frequency converter where the signal wave wavelength is converted to a mid-IR wavelength which combines with the idler wave to form a generation wave. The generation wave is directed at a composite surface to be tested.
    Type: Application
    Filed: May 15, 2008
    Publication date: November 19, 2009
    Applicant: LOCKHEED MARTIN CORPORATION
    Inventors: Thomas E. Drake, JR., Peter W. Lorraine, John B. Deaton, JR., Marc Dubois, Robert Filkins
  • Publication number: 20090282919
    Abstract: A mid infrared range laser source for ultrasound inspection that comprises a high energy laser coupled with one or more harmonic generation devices. The high energy laser may be a CO2 laser and tuned to emit laser light at a single wavelength. The harmonic generation devices convert the laser beam into the mid infrared range for optimal ultrasound inspection.
    Type: Application
    Filed: May 15, 2008
    Publication date: November 19, 2009
    Applicant: LOCKHEED MARTIN CORPORATION
    Inventors: Thomas E. Drake, JR., Marc Dubois, Peter W. Lorraine, John B. Deaton, JR., Robert Filkins
  • Patent number: 7480574
    Abstract: The invention is directed to a system and method for detecting defects in a manufactured object. These defects may include flaws, delaminations, voids, fractures, fissures, or cracks, among others. The system utilizes an ultrasound measurement system, a signal analyzer and an expected result. The signal analyzer compares the signal from the measurement system to the expected result. The analysis may detect a defect or measure an attribute of the manufactured object. Further, the analysis may be displayed or represented. In addition, the expected result may be generated from a model such as a wave propagation model. One embodiment of the invention is a laser ultrasound detection system in which a laser is used to generate an ultrasonic signal. The signal analyzer compares the measured ultrasonic signal to an expected result. This expected result is generated from a wave propagation model. The analysis is then displayed on a monitor.
    Type: Grant
    Filed: October 28, 2004
    Date of Patent: January 20, 2009
    Assignee: Lockheed Martin Corporation
    Inventors: Marc Dubois, Peter W. Lorraine, Robert J. Filkins
  • Patent number: 7474411
    Abstract: The present invention provides an optical filter assembly that reduces the phase and amplitude noise of a detection laser used to detect ultrasonic displacements. The filtered detection laser is directed to the surface of a remote target. Ultrasonic displacements at the surface scatter the filtered detection laser. Collection optics then gather phase modulated light scattered by the surface and direct the phase modulated light to an optical processor to produce a signal representative of the ultrasonic displacements with an improved SNR. Additional processors may determine the structure of the remote target.
    Type: Grant
    Filed: November 7, 2003
    Date of Patent: January 6, 2009
    Assignee: Lockheed Martin Corporation
    Inventors: Marc Dubois, Kent C. Burr, Thomas E. Drake, Jr., Peter W. Lorraine
  • Patent number: 7117134
    Abstract: The invention is directed to a laser ultrasound testing system with adaptive generation of sonic energy signals. The system may detect or test features of the manufactured object such as defects and layer properties. A laser generator initiates a sonic energy signal in a manufactured object. A measuring device measures the sonic energy signal. Then, a signal analyzer and/or a model processor determine if the signal is optimized. If the signal is not optimized, optimized operating characteristics of the laser generator are calculated. These optimized operating characteristics may include wavelength, beam dimension, temporal profile and power. Next, the laser generator initiates an improved sonic energy signal by utilizing the optimized operating characteristics. In this manner, more accurate testing and detection is achieved.
    Type: Grant
    Filed: October 18, 2001
    Date of Patent: October 3, 2006
    Assignee: Lockheed Martin Corporation
    Inventors: Marc Dubois, Peter W. Lorraine, Robert J. Filkins, Thomas E. Drake
  • Patent number: 6856918
    Abstract: The invention is directed to a system and method for detecting defects in a manufactured object. These defects may include flaws, delaminations, voids, fractures, fissures, or cracks, among others. The system utilizes an ultrasound measurement system, a signal analyzer and an expected result. The signal analyzer compares the signal from the measurement system to the expected result. The analysis may detect a defect or measure an attribute of the manufactured object. Further, the analysis may be displayed or represented. In addition, the expected result may be generated from a model such as a wave propagation model. One embodiment of the invention is a laser ultrasound detection system in which a laser is used to generate an ultrasonic signal. The signal analyzer compares the measured ultrasonic signal to an expected result. This expected result is generated from a wave propagation model. The analysis is then displayed on a monitor.
    Type: Grant
    Filed: November 26, 2001
    Date of Patent: February 15, 2005
    Assignee: Lockheed Martin Corporation
    Inventors: Marc Dubois, Peter W. Lorraine, Robert J. Filkins, Thomas E. Drake
  • Patent number: 6732587
    Abstract: Ultrasonic testing techniques may involve the measurement of ultrasonic waves from the tested part. These waves may reflect from surfaces of various layers within the part. Further, these waves may reflect from faults, defects, voids, fractures, and others. As such, the measured ultrasonic wave is a complex mix of these reflections. One method for detecting flaws, defects, and others may be to express the signal in terms of a set of basis functions. These functions may be summed to produce the measured signal. Further, basis functions may be chosen such that a select set of the basis functions characterize the fault and/or defect. In one exemplary embodiment, the coefficients associated with the basis function may be non-zero when a defect is present. As such, a defect may be detected quickly and automatically.
    Type: Grant
    Filed: February 6, 2002
    Date of Patent: May 11, 2004
    Assignee: Lockheed Martin Corporation
    Inventors: Peter W. Lorraine, Marc Dubois, Robert J. Filkins, Barbara Venchiarutti
  • Patent number: 6684701
    Abstract: The invention provides for ultrasonically measuring the porosity in a sample composite material by accessing only one side of the sample composite material and includes the steps of measuring a sample ultrasonic signal from the sample composite material, normalizing the sample ultrasonic signal relative to the surface echo of the sample composite material, and isolating a sample back-wall echo signal from the sample ultrasonic signal. A sample frequency spectrum of the sample back-wall ultrasonic signal is then determined. Next, the method and system include the steps of measuring a reference ultrasonic signal from a reference composite material, normalizing the reference ultrasonic signal relative to the surface echo of the reference composite material; and isolating a reference back-wall echo signal from the sample ultrasonic signal. A reference frequency spectrum of the reference back-wall ultrasonic signal is then determined.
    Type: Grant
    Filed: July 13, 2001
    Date of Patent: February 3, 2004
    Assignee: Lockheed Martin Corporation
    Inventors: Marc Dubois, John B. Deaton, Jr., Peter W. Lorraine, Thomas E. Drake, Jr., Robert J. Filkins
  • Patent number: 6668654
    Abstract: A system and method for testing a physical attribute of a manufactured object that includes a laser generator and pulse generator that generate a plurality of Dirac-like pulses. The pulses, directed at an object, cause a sonic signal to be initiated indicative of the physical attribute of the manufactured object, and are detected. The system also controls the width of the Dirac-like pulses and time separation between pulses. A display may also be used to present the detected signal or physical attribute. The Dirac-like pulses are structured to produce a particular output in the manufactured object. The Dirac-like pulses may be altered dynamically in the presence of deviations from the expected output. One embodiment of the Dirac-like pulses is a series of pulses with pulse widths less than 20% a time separation between successive pulses.
    Type: Grant
    Filed: August 15, 2001
    Date of Patent: December 30, 2003
    Assignee: Lockheed Martin Corporation
    Inventors: Marc Dubois, Peter W. Lorraine, Robert J. Filkins
  • Publication number: 20030145655
    Abstract: Ultrasonic testing techniques may involve the measurement of ultrasonic waves from the tested part. These waves may reflect from surfaces of various layers within the part. Further, these waves may reflect from faults, defects, voids, fractures, and others. As such, the measured ultrasonic wave is a complex mix of these reflections. One method for detecting flaws, defects, and others may be to express the signal in terms of a set of basis functions. These functions may be summed to produce the measured signal. Further, basis functions may be chosen such that a select set of the basis functions characterize the fault and/or defect. In one exemplary embodiment, the coefficients associated with the basis function may be non-zero when a defect is present. As such, a defect may be detected quickly and automatically.
    Type: Application
    Filed: February 6, 2002
    Publication date: August 7, 2003
    Applicant: Lockheed Martin Corporation
    Inventors: Peter W. Lorraine, Marc Dubois, Robert J. Filkins, Barbara Venchiarutti
  • Publication number: 20030101007
    Abstract: The invention is directed to a system and method for detecting defects in a manufactured object. These defects may include flaws, delaminations, voids, fractures, fissures, or cracks, among others. The system utilizes an ultrasound measurement system, a signal analyzer and an expected result. The signal analyzer compares the signal from the measurement system to the expected result. The analysis may detect a defect or measure an attribute of the manufactured object. Further, the analysis may be displayed or represented. In addition, the expected result may be generated from a model such as a wave propagation model. One embodiment of the invention is a laser ultrasound detection system in which a laser is used to generate an ultrasonic signal. The signal analyzer compares the measured ultrasonic signal to an expected result. This expected result is generated from a wave propagation model. The analysis is then displayed on a monitor.
    Type: Application
    Filed: November 26, 2001
    Publication date: May 29, 2003
    Applicant: Lockheed Martin Corporation
    Inventors: Marc Dubois, Peter W. Lorraine, Robert J. Filkins, Thomas E. Drake
  • Publication number: 20030078681
    Abstract: The invention is directed to a laser ultrasound testing system with adaptive generation of sonic energy signals. The system may detect or test features of the manufactured object such as defects and layer properties. A laser generator initiates a sonic energy signal in a manufactured object. A measuring device measures the sonic energy signal. Then, a signal analyzer and/or a model processor determine if the signal is optimized. If the signal is not optimized, optimized operating characteristics of the laser generator are calculated. These optimized operating characteristics may include wavelength, beam dimension, temporal profile and power. Next, the laser generator initiates an improved sonic energy signal by utilizing the optimized operating characteristics. In this manner, more accurate testing and detection is achieved.
    Type: Application
    Filed: October 18, 2001
    Publication date: April 24, 2003
    Applicant: Lockheed Martin Corporation
    Inventors: Marc Dubois, Peter W. Lorraine, Robert J. Filkins, Thomas E. Drake