Patents by Inventor Petr Herman

Petr Herman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6721050
    Abstract: The method uses a physical phenomenon of dispersion of the optical rotation for identification of the spectral characteristics of light Polychromatic linearly polarized radiation passes through the environment that rotates a polarization plane of its spectral components, depending on their wavelength. After a subsequent passage through the analyzing polarizer, a dependence of the light intensity S(&phgr;) on the angle &phgr;, that the analyzing polarizer forms with the polarization plane of the analyzed light, is measured. S(&phgr;) is in a mathematical relationship with the spectrum of the analyzed radiation I(&lgr;), where &lgr; is a wavelength. S(&phgr;) allows for the determination of the spectral characteristics of the analyzed radiation. In devices based on the above principle, the collimated polarized beam of the analyzed radiation passes first through the optical element that exhibits a dispersion of the optical rotation, i.e.
    Type: Grant
    Filed: March 8, 2001
    Date of Patent: April 13, 2004
    Assignee: Microcosm Inc.
    Inventors: Jaroslav Vecer, Petr Herman
  • Patent number: 6646743
    Abstract: The method utilizes the physical phenomenon known as dispersion of the optical rotation. After passage of linearly polarized electromagnetic radiation through the optically active environment (rotator), with the rotating power characterized by a parameter p, and then through the analyzing polarizer, the function R(p) can be measured. For the given active medium and the relative orientation of polarization planes of the input light beam and the analyzing polarizer, R(p) has an unambiguous relation with the spectrum I(&lgr;) of the analyzed radiation (&lgr; stands for wavelength) and allows its unambiguous determination by special mathematical methods. In devices based on the above mentioned principle a linearly polarized collimated beam of analyzed radiation propagates through the optical rotator then passes through the analyzer and strikes a single-channel or multi-channel detector which measures R(p) as a function of the parameter p.
    Type: Grant
    Filed: March 8, 2002
    Date of Patent: November 11, 2003
    Inventors: Petr Herman, Jaroslav Ve{haeck over (c)}e{haeck over (r)}
  • Publication number: 20020159067
    Abstract: The method utilizes the physical phenomenon known as dispersion of the optical rotation. After passage of linearly polarized electromagnetic radiation through the optically active environment (rotator), with the rotating power characterized by a parameter p, and then through the analyzing polarizer, the function R(p) can be measured. For the given active medium and the relative orientation of polarization planes of the input light beam and the analyzing polarizer, R(p) has an unambiguous relation with the spectrum I(&lgr;) of the analyzed radiation (&lgr; stands for wavelength) and allows its unambiguous determination by special mathematical methods. In devices based on the above mentioned principle a linearly polarized collimated beam of analyzed radiation propagates through the optical rotator then passes through the analyzer and strikes a single-channel or multi-channel detector which measures R(p) as a function of the parameter p.
    Type: Application
    Filed: March 8, 2002
    Publication date: October 31, 2002
    Inventors: Petr Herman, Jaroslav Vecer
  • Publication number: 20010024276
    Abstract: The method uses a physical phenomenon of dispersion of the optical rotation for identification of the spectral characteristics of light. Polychromatic linearly polarized radiation passes through the environment that rotates a polarization plane of its spectral components, depending on their wavelength. After a subsequent passage through the analyzing polarizer, a dependence of the light intensity S((&phgr;) on the angle &phgr;, that the analyzing polarizer forms with the polarization plane of the analyzed light, is measured. S((&phgr;) is in a mathematical relationship with the spectrum of the analyzed radiation I(&lgr;), where &lgr; is a wavelength. S((&phgr;) allows for the determination of the spectral characteristics of the analyzed radiation.
    Type: Application
    Filed: March 8, 2001
    Publication date: September 27, 2001
    Inventors: Petr Herman, Jaroslav Vecer