Abstract: Charged particle microscopy systems, sensors, and techniques are provided. A charged particle sensor can include a housing, configured to be incorporated into a scanning electron microscope (SEM). The charged particle sensor can include a detector cell, mechanically coupled with the housing. The detector cell can include an acceptor layer including a semiconducting material characterized by a bandgap equal to or greater than about 2.0 eV. The acceptor layer can define a first surface and a second surface opposing the first surface. The detector cell can include a first conducting layer disposed on the first surface, a second conducting layer disposed on the second surface, a first contact, electrically coupled with the first conducting layer, and a second contact, electrically coupled with the second conducting layer.

Abstract: A projector headlamp includes light sources, a cooling system and reflector comprising an upper part with a first focal point and second focal point and a lower part with a first focal point and second focal point. The headlamp also includes an aperture with a cutoff edge proximate an optical axis of the headlamp and a convergent lens. The convergent lens includes at least two segments with their own first focal points, the first segment in a lower part of the convergent lens has a greater optical power than a second segment in an upper part, the first focal points of the segments located near the optical axis of the headlamp between the light sources and the lens. The light sources comprise at least two light sources, a first adjoins the first focal point of the upper part and a second adjoins the first focal point of the bottom part.

Abstract: A projector headlamp includes light sources, a cooling system and reflector comprising an upper part with a first focal point and second focal point and a lower part with a first focal point and second focal point. The headlamp also includes an aperture with a cutoff edge proximate an optical axis of the headlamp and a convergent lens. The convergent lens includes at least two segments with their own first focal points, the first segment in a lower part of the convergent lens has a greater optical power than a second segment in an upper part, the first focal points of the segments located near the optical axis of the headlamp between the light sources and the lens. The light sources comprise at least two light sources, a first adjoins the first focal point of the upper part and a second adjoins the first focal point of the bottom part.

Abstract: The imaging spectrograph comprises of the first optical system (104), the spectral filter unit, the second optical system (124), and the detector (114). The spectral filter unit comprises of at least one optical filter (110), which position to both optical systems (104, 124) satisfies the conditions zz?=ff? and zz?=ff? where z is the distance between the object (102) and the front focal point of the first optical system (104), z? is the distance between the optical filter (110) and the rear focal point of the first optical system (104), f and f? are the front and rear focal lengths of the first optical system (104), respectively, Z is the distance between the optical filter (110) and the front focal point of the second optical system (124), z? is the distance between the photosensitive area of the detector (114) and the rear focal point of the second optical system (124), and f and f? are the front and rear focal lengths of the second optical system (124), respectively.