Patents by Inventor PETR STRELEC

PETR STRELEC has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10520454
    Abstract: A method, target, and apparatus are disclosed for investigating a specimen using X-ray tomography. The specimen in mounted on a specimen holder. An X-ray target has a substrate of relatively low-atomic-number material carrying an array of mutually isolated nuggets of a relatively high-atomic number material. X-rays are generated by irradiating a single nugget in the target with a charged particle beam, which then illuminates the specimen along a first line of sight through the specimen. A flux of X-rays transmitted through the specimen is detected to form a first image. The illumination process is repeated for a series of different lines of sight through the specimen, to produce a series of images. A mathematical reconstruction on the series of images is then performed to produce a tomogram of at least part of the specimen.
    Type: Grant
    Filed: May 2, 2017
    Date of Patent: December 31, 2019
    Assignee: FEI Company
    Inventors: Petr Strelec, Ondrej Shanel
  • Publication number: 20190293574
    Abstract: Methods and apparatuses are disclosed herein to correct for inconsistencies in CT scans based on pi-lines. An example method at least includes acquiring a plurality of projections of a sample, each projection of the plurality of projections acquired at a different location around the sample based on a trajectory, determining pairs of opposing projections from the plurality of projections based on a respective pi-line, and determining an amount of inconsistency between respective pi-line data for each pair of opposing projections, where the pi-line data is based, at least in part, on attenuation data.
    Type: Application
    Filed: March 20, 2018
    Publication date: September 26, 2019
    Inventors: Andrew KINGSTON, Olaf DELGADO-FRIEDRICHS, Glenn MYERS, Shane LATHAM, Adrian SHEPPARD, Trond VARSLOT, Petr Strelec
  • Publication number: 20180323032
    Abstract: A method, target, and apparatus are disclosed for investigating a specimen using X-ray tomography. The specimen in mounted on a specimen holder. An X-ray target has a substrate of relatively low-atomic-number material carrying an array of mutually isolated nuggets of a relatively high-atomic number material. X-rays are generated by irradiating a single nugget in the target with a charged particle beam, which then illuminates the specimen along a first line of sight through the specimen. A flux of X-rays transmitted through the specimen is detected to form a first image. The illumination process is repeated for a series of different lines of sight through the specimen, to produce a series of images. A mathematical reconstruction on the series of images is then performed to produce a tomogram of at least part of the specimen.
    Type: Application
    Filed: May 2, 2017
    Publication date: November 8, 2018
    Applicant: FEI Company
    Inventors: PETR STRELEC, Ondrej Shanel