Abstract: The present disclosure provides a measurement device comprising at least two measurement signal inputs, and at least two multi-channel analog-to-digital converters, each multi-channel analog-to-digital converter comprising two ADC signal inputs and being selectively operable in an interleaved operating mode or a non-interleaved operating mode, wherein each one of the measurement signal inputs of consecutive pairs of signal inputs is coupled to a different one of the multi-channel analog-to-digital converters. The present disclosure further provides a respective method.

Abstract: The present disclosure provides a measurement application device comprising at least one signal acquisition interface configured to acquire an analog input signal and output a digital input signal, a first decimator for each signal acquisition interface, each one of the first decimators being configured to reduce the number of samples of the respective digital input signal and output a first decimated digital input signal, at least one second decimator for each signal acquisition interface, each one of the second decimators being configured to reduce the number of samples of the respective digital input signal and output a second decimated digital input signal, and at least one decoder for each one of the second decimators, each one of the decoders being configured to decode the respective second decimated digital input signal according to a respective protocol and provide a respective decoded input signal.

Abstract: The present disclosure provides an oscilloscope post processing system for an oscilloscope, the oscilloscope post processing system comprising an acquisition memory that stores samples that represent at least one signal acquired by the oscilloscope, and an interval selector that is coupled to the acquisition memory and reads at least some of the stored samples from the memory and outputs at least one first set of the stored samples and at least one second set of the stored samples. Further, the present disclosure provides a respective method, and a respective measurement device.

Abstract: The present disclosure provides a measurement device comprising at least two measurement signal inputs, and at least two multi-channel analog-to-digital converters, each multi-channel analog-to-digital converter comprising two ADC signal inputs and being selectively operable in an interleaved operating mode or a non-interleaved operating mode, wherein each one of the measurement signal inputs of consecutive pairs of signal inputs is coupled to a different one of the multi-channel analog-to-digital converters. The present disclosure further provides a respective method.

Abstract: The present invention provides an improved testing of a complex device under test, in particular a parallel analysis of signals of a device under test. Multiple signals of the device under test may be acquired and characteristic parameters of the acquired signals may be determined. The determined characteristic parameters of the multiple signals may be stored. In particular, the characteristic parameters may be stored in form of an array, table or spread sheet.

Abstract: An electrical test and measurement device is described that has at least one analog channel comprising an analog input, an attenuator circuit, an amplifier unit, and a digitizer. The electrical test and measurement device comprises another digitizer allocated to a digitizer input of the electrical test and measurement device. The digitizer input is configured to be connected to a measurement extension device. Further, a measurement extension device and a test and measurement system are described.

Abstract: A method of analyzing a signal is described. The method includes: setting a trigger condition to be applied; applying the trigger condition; acquiring at least two acquisitions associated with the input signal, each acquisition including a trigger event that matches the trigger condition set; determining a trigger time for each trigger event; storing a time stamp with each trigger event; and generating a histogram based on the time stamps stored, the histogram providing number of trigger events versus time. Further, a signal analysis device for analyzing a signal is described.

Abstract: A method for performing a Bus autoset function is described. A maximum amplitude of an analog signal is detected. The analog signal is converted into a logical signal. A frame in the logical signal is detected. A scale of an output unit is set such that the whole frame is output. Further, a measurement device is described.

Abstract: An electrical measurement device is described with an acquisition unit that is configured to receive an input signal, a post-processing unit, and a visualization unit. The acquisition unit comprises an acquisition trigger unit and an acquisition memory, the acquisition memory being configured to acquire sampled output data and to store the sampled output data by control of the acquisition trigger unit. The post-processing unit comprises a measurement unit that is configured to process at least parts of the sampled output data and to generate processed sampled output data. The post-processing unit further comprises a measurement trigger unit that is configured to evaluate the processed sampled output data in view of a measurement trigger condition, the measurement trigger unit being configured to output a measurement trigger event if the measurement trigger condition is met. The measurement trigger unit is further configured to control the visualization unit.

Abstract: The present invention provides an improved testing of a complex device under test, in particular a parallel analysis of signals of a device under test. Multiple signals of the device under test may be acquired and characteristic parameters of the acquired signals may be determined. The determined characteristic parameters of the multiple signals may be stored. In particular, the characteristic parameters may be stored in form of an array, table or spread sheet.

Abstract: A method for assigning an input channel of a signal analyzer to a signal decoder has the steps of analyzing a digital representation of a signal received by an input channel and generating a characteristic signal parameter of the signal. The parameter is compared to expected values and the corresponding input channel is assigned to the signal decoder according to the result of the comparison. Further, a signal analyzer for measuring a bus signal is shown.

Abstract: A measuring device measures an input signal. The measuring device comprises at least two domains of measurement each for analyzing the signal in its corresponding manner, a selector for selecting a first domain of measurement or a second domain of measurement out of the at least two domains of measurement. A controller is in communication with the selector. The controller is configured to set a first bandwidth for the first domain of measurement and a second bandwidth for the second domain of measurement.

Abstract: A measurement device for measuring the impedance of a device under test is described. Said measurement device comprises at least one signal generator for generating a signal with a certain frequency wherein said signal is used for testing said device under test. Said measurement device further has at least one shunt resistor that is used for determining the electric current of said signal. Said device also comprise at least two voltage channels for measuring the voltage across said device under test. Said measurement device is an oscilloscope having at least four voltage inputs and wherein said measurement device is configured to derive the impedance of said device from said electric current and said voltage. Further, a method for measuring the impedance of a device under test is described.

Abstract: A measurement arrangement and method for providing at least one combined measurement dataset, said measurement arrangement comprising at least one measurement device configured to generate measurement data in a measurement session, and a mobile device configured to generate measurement session context data of said measurement session, said measurement device and said mobile device being connected via at least one wireless link for data transfer, wherein the measurement data generated by said measurement device and associated measurement session context data generated by said mobile device are linked to provide a combined measurement dataset.

Abstract: A method for assigning an input channel of a signal analyzer to a signal decoder has the steps of analyzing a digital representation of a signal received by an input channel and generating a characteristic signal parameter of the signal. The parameter is compared to expected values and the corresponding input channel is assigned to the signal decoder according to the result of the comparison. Further, a signal analyzer for measuring a bus signal is shown.

Abstract: An electrical measurement device is described with an acquisition unit that is configured to receive an input signal, a post-processing unit, and a visualization unit. The acquisition unit comprises an acquisition trigger unit and an acquisition memory, the acquisition memory being configured to acquire sampled output data and to store the sampled output data by control of the acquisition trigger unit. The post-processing unit comprises a measurement unit that is configured to process at least parts of the sampled output data and to generate processed sampled output data. The post-processing unit further comprises a measurement trigger unit that is configured to evaluate the processed sampled output data in view of a measurement trigger condition, the measurement trigger unit being configured to output a measurement trigger event if the measurement trigger condition is met. The measurement trigger unit is further configured to control the visualization unit.

Abstract: An electrical test and measurement device is described that has at least one analog channel comprising an analog input, an attenuator circuit, an amplifier unit, and a digitizer. The electrical test and measurement device comprises another digitizer allocated to a digitizer input of the electrical test and measurement device. The digitizer input is configured to be connected to a measurement extension device. Further, a measurement extension device and a test and measurement system are described.

Abstract: A method for performing a Bus autoset function is described. A maximum amplitude of an analog signal is detected. The analog signal is converted into a logical signal. A frame in the logical signal is detected. A scale of an output unit is set such that the whole frame is output. Further, a measurement device is described.

Abstract: A measuring device measures an input signal. The measuring device comprises at least two domains of measurement each for analyzing the signal in its corresponding manner, a selector for selecting a first domain of measurement or a second domain of measurement out of the at least two domains of measurement. A controller is in communication with the selector. The controller is configured to set a first bandwidth for the first domain of measurement and a second bandwidth for the second domain of measurement.

Abstract: A measuring system comprises a measuring device for measuring data with respect to a measurement setup comprising circuits with the aid of a probe, and at least one mobile device wirelessly connected to the measuring device, wherein the at least one mobile device displays a live view of the measurement setup superimposed on at least one measurement result of the measuring device.