Patents by Inventor Philippe De Bettignies

Philippe De Bettignies has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10114204
    Abstract: An optical beam scanning microscopy apparatus includes a light source adapted to emit an optical beam (2) and a microscope objective (1) adapted for focusing the optical beam (2) in an object plane (11). The microscopy apparatus includes first and second reflecting optical elements (M-X1, M-X2) disposed in series on the optical path of the optical beam (2) between the light source and the microscope objective (1), first elements of angular tilting (21, 25) adapted for tilting the first reflecting optical elements (M-X1, M-XY1) according to a first predetermined rotation angle (RX1), and second elements of angular tilting (22, 26) adapted for tilting the second reflecting optical elements (M-X2, M-XY2) according to a second rotation angle (RX2), in such a way as to angularly tilt the axis (12) of the optical beam (2) by pivoting about the center (O) of the pupil of the microscope objective (1).
    Type: Grant
    Filed: April 17, 2015
    Date of Patent: October 30, 2018
    Assignee: HORIBA JOBIN YVON SAS
    Inventors: Emmanuel Fretel, Damien Andrezejeusky, Rene Boidin, Philippe De Bettignies
  • Publication number: 20170045722
    Abstract: An optical beam scanning microscopy apparatus includes a light source adapted to emit an optical beam (2) and a microscope objective (1) adapted for focusing the optical beam (2) in an object plane (11). The microscopy apparatus includes first and second reflecting optical elements (M-X1, M-X2) disposed in series on the optical path of the optical beam (2) between the light source and the microscope objective (1), first elements of angular tilting (21, 25) adapted for tilting the first reflecting optical elements (M-X1, M-XY1) according to a first predetermined rotation angle (RX1), and second elements of angular tilting (22, 26) adapted for tilting the second reflecting optical elements (M-X2, M-XY2) according to a second rotation angle (RX2), in such a way as to angularly tilt the axis (12) of the optical beam (2) by pivoting about the center (O) of the pupil of the microscope objective (1).
    Type: Application
    Filed: April 17, 2015
    Publication date: February 16, 2017
    Inventors: Emmanuel FRETEL, Damien ANDREZEJEUSKY, Rene BOIDIN, Philippe DE BETTIGNIES
  • Patent number: 9068889
    Abstract: The present invention relates to a method and optical device for Raman spectroscopy and for observing a sample, said device including an optical means for superimposing an excitation laser beam having a spectral band B0 and an observation beam having a spectral band BV so as to form a combined excitation and observation incident beam, and an optical separation means arranged in the path of a collected beam coming from scattering on the sample and including a first filtering means, a second filtering means capable of spatially separating said collected beam into a first secondary beam and two tertiary beams, each of which includes a spectral band selected from the spectral band B0 of the laser, the spectral band BV of the observation beam, and the spectral band BR of the Raman scattering beam, respectively.
    Type: Grant
    Filed: December 20, 2011
    Date of Patent: June 30, 2015
    Assignee: Horiba Jobin Yvon SAS
    Inventors: Emmanuel Froigneux, Philippe De Bettignies
  • Publication number: 20130271760
    Abstract: The present invention relates to a method and optical device for Raman spectroscopy and for observing a sample, said device including an optical means for superimposing an excitation laser beam having a spectral band B0 and an observation beam having a spectral band BV so as to form a combined excitation and observation incident beam, and an optical separation means arranged in the path of a collected beam coming from scattering on the sample and including a first filtering means, a second filtering means capable of spatially separating said collected beam into a first secondary beam and two tertiary beams, each of which includes a spectral band selected from the spectral band B0 of the laser, the spectral band BV of the observation beam, and the spectral band BR of the Raman scattering beam, respectively.
    Type: Application
    Filed: December 20, 2011
    Publication date: October 17, 2013
    Applicant: HORIBA JOBIN YVON SAS
    Inventors: Emmanuel Froigneux, Philippe De Bettignies