Patents by Inventor Philippe Felix Catoul

Philippe Felix Catoul has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4003261
    Abstract: A measuring or sampling probe is to be lowered to a desired depth in molten metal. The probe is mounted on a tiltable elongate probe-carrier which can be lowered and raised. The probe-carrier is telescopic, its length being adjustable between given limits.
    Type: Grant
    Filed: March 3, 1976
    Date of Patent: January 18, 1977
    Assignee: Centre de Recherches Metallurgiques-Centrum Voor Research in de Metallurgie
    Inventors: Jean Adolphe Nautet, Philippe Felix Catoul
  • Patent number: 4003260
    Abstract: A measuring or sampling probe is to be lowered to a desired depth in a molten metal. The probe is mounted on a probe carrier which can be lowered and raised. A contact detector, which emits a control signal when the detector comes into contact with the upper surface of the molten metal, is fixed on the probe carrier at a distance above the probe.
    Type: Grant
    Filed: November 25, 1974
    Date of Patent: January 18, 1977
    Assignee: Centre de Recherches Metallurgiques-Centrum voor Research in de Metallurgie
    Inventor: Philippe Felix Catoul