Patents by Inventor Philippe Roussel
Philippe Roussel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240101733Abstract: The present document relates to amphiphilic poly(monoglycerol acrylate) (PMGA) polymers, comprising an hydrophilic repeating unit of monoglycerol acrylate and one or more biodegradable hydrophobic group and their use and methods of use in the delivery of bioactive agents. Additionally, the invention provides a method for preparing monoglycerol acrylate-based polymers.Type: ApplicationFiled: December 4, 2023Publication date: March 28, 2024Inventors: Sabrina Roussel, Nicolas Bertrand, Philippe Grenier
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Patent number: 10776552Abstract: An integrated circuit design tool for modeling resistance of an interconnect specifies a structure of the interconnect in a data structure in memory in or accessible by the computer system using 3D coordinate system. For each of a plurality of volume elements in the specified structure, the tool specifies a location and one of first and second materials of the interconnect having specified resistivities, and for each volume element generates a model resistivity for the volume element as a function of resistivity of volume elements within a neighborhood of the volume element and a specified transition region length ?.Type: GrantFiled: November 27, 2017Date of Patent: September 15, 2020Assignee: Synopsys, Inc.Inventors: Victor Moroz, Ibrahim Avci, Shuqing Li, Philippe Roussel, Ivan Ciofi
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Publication number: 20180157783Abstract: An integrated circuit design tool for modeling resistance of an interconnect specifies a structure of the interconnect in a data structure in memory in or accessible by the computer system using 3D coordinate system. For each of a plurality of volume elements in the specified structure, the tool specifies a location and one of first and second materials of the interconnect having specified resistivities, and for each volume element generates a model resistivity for the volume element as a function of resistivity of volume elements within a neighborhood of the volume element and a specified transition region length ?.Type: ApplicationFiled: November 27, 2017Publication date: June 7, 2018Applicant: Synopsys, Inc.Inventors: Victor Moroz, Ibrahim Avci, Shuqing Li, Philippe Roussel, Ivan Ciofi
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Patent number: 8339146Abstract: Calibration method for calibrating transient behavior of a TLP test system. The system comprises a TLP generator, probe needles, nominally impedance matched transmission lines and measurement equipment, connected between the transmission lines and the TLP generator, for detecting transient behavior of a device under test by simultaneously capturing voltage and current waveforms as a result of generated pulses. The calibration method comprises (a) applying the TLP test system on an open and capturing first voltage and current waveforms; (b) applying the TLP test system on a calibration element having a known finite impedance and a known transient response and capturing second voltage and current waveforms; (c) transforming the captured first and second current and voltage waveforms to the frequency domain, and (d) determining calibration data for the transient behavior of the TLP test system on the basis of the transformed first and second voltage and current waveforms.Type: GrantFiled: December 21, 2009Date of Patent: December 25, 2012Assignees: IMEC, Hanwa Electronic Ind. Co., Ltd.Inventors: Philippe Roussel, Dimitri Linten
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Patent number: 8037430Abstract: One inventive aspect relates to a method of determining an estimate of system-level yield loss for an electronic system comprising individual components subject to manufacturing process variability leading to manufacturing defects. The method comprises obtaining a description of the composition of the electronic system in terms of which individual components are used. The method further comprises obtaining statistical properties of the performance of individual components of the electronic system with respect to first and second performance variables, e.g. energy consumption and delay, the statistical properties including correlation information of the first and second performance variables. The method further comprises obtaining information about execution of an application on the system, e.g. a number of accesses of a component by an application.Type: GrantFiled: June 27, 2007Date of Patent: October 11, 2011Assignee: IMECInventors: Antonis Papanikolaou, Miguel Miranda, Philippe Roussel
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Publication number: 20110178789Abstract: A method and device for performing a characterization of a description of the composition of an electronic system in terms of components used are disclosed. Performances of the components are described by at least two statistical parameters and one deterministic parameter. In one aspect, the method includes selecting a plurality of design of experiments (DoE) points, performing simulations on the selected DoE points, thus obtaining system responses, and determining a response model using the selected DoE points and the system responses. Selecting the DoE points includes making a first selection of a reduced set of chosen DoE points for the statistical parameters representing the statistical properties of the many possible statistical parameter realizations, and making a second selection of DoE points for the deterministic parameter representing the possible limited set of values that such parameter can take.Type: ApplicationFiled: January 12, 2011Publication date: July 21, 2011Applicants: IMEC, Katholieke Universiteit LeuvenInventors: Miguel Miranda, Philippe Roussel, Lucas Brusamarello
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Publication number: 20100156447Abstract: Calibration method for calibrating transient behaviour of a TLP test system. The system comprises a TLP generator, probe needles, nominally impedance matched transmission lines and measurement equipment, connected between the transmission lines and the TLP generator, for detecting transient behaviour of a device under test by simultaneously capturing voltage and current waveforms as a result of generated pulses. The calibration method comprises (a) applying the TLP test system on an open and capturing first voltage and current waveforms; (b) applying the TLP test system on a calibration element having a known finite impedance and a known transient response and capturing second voltage and current waveforms; (c) transforming the captured first and second current and voltage waveforms to the frequency domain, and (d) determining calibration data for the transient behaviour of the TLP test system on the basis of the transformed first and second voltage and current waveforms.Type: ApplicationFiled: December 21, 2009Publication date: June 24, 2010Applicants: IMEC, HANWA ELECTRONIC IND. CO., LTDInventors: Philippe Roussel, Dimitri Linten
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Publication number: 20090039036Abstract: A method of processing the slurry coming from a cracker by causing solid particles contained in the slurry to settle out, the method consisting of introducing said slurry, on leaving the cracker at a temperature of about 350° C., into the base of a vertical settler having a rotary bowl and an Archimedes' screw, in extracting the clarified phase from the top portion thereof and the solid phase from the bottom portion thereof, and in causing the clarified phase to cool.Type: ApplicationFiled: February 9, 2007Publication date: February 12, 2009Inventor: Philippe Roussel
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Publication number: 20080005707Abstract: One inventive aspect relates to a method of determining an estimate of system-level yield loss for an electronic system comprising individual components subject to manufacturing process variability leading to manufacturing defects. The method comprises obtaining a description of the composition of the electronic system in terms of which individual components are used. The method further comprises obtaining statistical properties of the performance of individual components of the electronic system with respect to first and second performance variables, e.g. energy consumption and delay, the statistical properties including correlation information of the first and second performance variables. The method further comprises obtaining information about execution of an application on the system, e.g. a number of accesses of a component by an application.Type: ApplicationFiled: June 27, 2007Publication date: January 3, 2008Applicant: Interuniversitair Microelektronica Centrum vzw (IMEC)Inventors: Antonis Papanikolaou, Miguel Miranda, Philippe Roussel
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Patent number: 6777972Abstract: A method for detecting breakdown in a dielectric layer. The method includes applying a signal to the dielectric layer, measuring a plurality of sets of readings having values, which are in relation to the signal, searching and identifying outlier readings in each of the sets, the outlier readings being defined by the fact that they have values which are significantly higher or lower than the majority of the values of the set, selecting from each of the sets, one reading which is not one of the outlier readings, and comparing the value of the one selected reading to a reference value, so that the exceeding of the value leads to the conclusion that a predefined probability is present for having a breakdown state in the layer.Type: GrantFiled: April 22, 2002Date of Patent: August 17, 2004Assignee: Interuniversitair Microelektronica Centrum (IMEC, vzw)Inventors: Philippe Roussel, Robin Degraeve, Geert Van den Bosch
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Publication number: 20030016046Abstract: The present invention is related to a method for detecting breakdown in a dielectric layer. The method includes applying a signal to the dielectric layer, measuring a plurality of sets of readings having values, which are in relation to the signal, searching and identifying outlier readings in each of the sets, the outlier readings being defined by the fact that they have values which are significantly higher or lower than the majority of the values of the set, selecting from each of the sets, one reading which is not one of the outlier readings, and comparing the value of the one selected reading to a reference value, so that the exceeding of the value leads to the conclusion that a predefined probability is present for having a breakdown state in the layer.Type: ApplicationFiled: April 22, 2002Publication date: January 23, 2003Inventors: Philippe Roussel, Robin Degraeve, Geert Van den Bosch
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Patent number: 4506962Abstract: The invention concerns contact lenses for observation or irradiation of the eye. The contact lens contains, for useful radiation, an entry face (1), a surface (2) reflecting by total reflection and an approximately spherical exit surface (3). Entry face (1) constitutes a wave surface for useful radiation.Type: GrantFiled: August 10, 1982Date of Patent: March 26, 1985Assignee: LASAG AGInventor: Philippe Roussel
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Patent number: 4499897Abstract: The optical head of an installation for observation and treatment by a laser beam of an eye comprises a mirror disposed between an observing microscope and a focusing lens for reflecting towards the latter a treatment and a marking laser radiation beam forming a visible envelope of the treatment beam. That mirror has an outer portion intersecting the marking beam only and an inner portion intersecting the treatment beam only. That inner portion has a reflection coefficient which is maximum for the wavelength of the treatment beam and minimum for the wavelength of the marking beam, so that the latter only is allowed to reach the observing microscope after reflection on the zone of the eye to be treated.Type: GrantFiled: March 7, 1983Date of Patent: February 19, 1985Assignee: Lasag AGInventor: Philippe Roussel
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Patent number: 4409979Abstract: A device for observing the eye in order to treat the same comprising optical elements producing optical illumination beams which issue from a light source. The beams consist of parallel rays whose axes are eccentric and parallel to the axis of the focussing lens and traverse the lens. Observation beams and illuminating beams are combined in one optical system. Beams emerging from the focussing lens or the eccentric illuminating rays exhibit a certain inclination relative to the axial observation beam.Type: GrantFiled: November 28, 1980Date of Patent: October 18, 1983Assignee: Lasag AGInventors: Philippe Roussel, Franz Fankhauser, Eugen van der Zypen
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Patent number: 4391275Abstract: The invention relates to a method for the surgical treatment of the eye by perforation, by laser radiation, of a tissue or inner wall of the eyeball having a resistance to the free circulation of the aqueous humour. A laser radiation burst comprising at least one pulse of duration d comprised between 10 and 60 ns and of radiated energy comprised between 30 and 300 millijoules is produced and focussed at a determined distance p inside the wall. The radiation is focussed according to a solid angle .OMEGA. determining a density of radiated energy causing ionization of the propagation medium.A shock wave is also produced due to this ionization close to the mean direction of propagation of the radiated, thereby allowing the tissue or inner wall to be perforated.Type: GrantFiled: November 28, 1980Date of Patent: July 5, 1983Assignee: Lasag AGInventors: Franz Fankhauser, Eugen van der Zypen, Philippe Roussel
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Patent number: 4283146Abstract: An optical detector for the detection of very small objects comprises a first optical system defining an optical path and being operable to transmit electromagnetic radiation onto an object to be detected; a second optical system defining an optical path parallel to said optical path of said first optical system and being operable to receive said electromagnetic radiation after diffusion and reflection by said object; and a converging lens associated in common with said first and second optical systems and arranged such that said optical paths of said first and second optical systems are parallel to and symmetrical about the axis of said converging lens on one side thereof.Type: GrantFiled: November 30, 1978Date of Patent: August 11, 1981Assignee: Lasag S.A.Inventor: Philippe Roussel
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Patent number: D855174Type: GrantFiled: October 16, 2017Date of Patent: July 30, 2019Assignee: HONEYWELL INTERNATIONAL INC.Inventors: Nicole Fofack, Philippe Roussel