Patents by Inventor Phillip M. Truckle

Phillip M. Truckle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6977515
    Abstract: A method of manufacturing a probe test head for testing of semiconductor integrated circuits includes: defining shapes of a plurality of probes as one or more masks; a step for fabricating the plurality of probes using the mask; and disposing the plurality of probes through corresponding holes in a first die and a second die. The step for fabricating the plurality of probes may include one of photo-etching and photo-defined electroforming.
    Type: Grant
    Filed: October 24, 2003
    Date of Patent: December 20, 2005
    Assignee: Wentworth Laboratories, Inc.
    Inventors: Francis T. McQuade, Charles L. Barto, Phillip M. Truckle
  • Publication number: 20040157350
    Abstract: A method of manufacturing a probe test head for testing of semiconductor integrated circuits includes: defining shapes of a plurality of probes as one or more masks; a step for fabricating the plurality of probes using the mask; and disposing the plurality of probes through corresponding holes in a first die and a second die. The step for fabricating the plurality of probes may include one of photo-etching and photo-defined electroforming.
    Type: Application
    Filed: October 24, 2003
    Publication date: August 12, 2004
    Applicant: Wentworth Laboratories, Inc.
    Inventors: Francis T. McQuade, Charles L. Barto, Phillip M. Truckle