Abstract: The invention relates to a substrate carrier assembly for use in a system for growing epitaxial layers on semiconductor substrates by chemical vapor deposition, said substrate carrier assembly comprising a substrate carrier having a first surface side, an area part of said first surface being provided with recessed pockets for accommodating—during use—said semiconductor substrates, as well as one or more shielding segments configured as removable-positioned plate shaped elements having a covering surface side for substantially covering the remaining area part of said first surface neighboring said pockets, as well as interlocking means for interlocking said one or more shielding segments with said substrate carrier. Moreover the invention also relates to a substrate carrier as well as a shielding segment for use in such substrate carrier assembly.

Abstract: An automatic sampling method for introducing a diluted viscous sample into an instrument for analysis for trace elements. The automatic sampling system includes a tube assembly, a member for mounting the tube assembly in proper relation, means for maintaining, between sampling, the free end of the tube assembly in a cleaning solution, and means for inserting the free end of the tube assembly into a sample contained within a container. Preferably, the instrument is a spectrometer, the samples are organic and aqueous samples, such as oils, brines, sludges, plating solutions and the like, and the trace elements include wear metals and also other elements, such as calcium, barium, zinc, sodium, magnesium, boron, phosphor and the like.

Abstract: An automatic sampling system and method for introducing a diluted viscous sample into an instrument for analysis for trace elements. The automatic sampling system includes a tube assembly, a member for mounting the tube assembly in proper relation, means for maintaining, between sampling, the free end of the tube assembly in a cleaning solution, and means for inserting the free end of the tube assembly into a sample contained within a container. Preferably, the instrument is a spectrometer, the samples are organic and aqueous samples, such as oils, brines, sludges, plating solutions and the like, and the trace elements include wear metals and also other elements, such as calcium, barium, zinc, sodium, magnesium, boron, phosphor and the like.