Patents by Inventor Po Wen Chin

Po Wen Chin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Graphical editor for defining memory test sequences
    Patent number: 6029262
    Abstract: A technique for specifying test signals such as to be applied to a memory integrated circuit, by graphically displaying and editing a sequence of test cycles, together with a graphic indication of parameters that specify which of the test cycles are to be repeated. The preparation of detailed instructions for tester equipment may therefore be carried out automatically by computer software that interprets the graphic indications and generates tester microcode. As a result, knowledge of test equipment programming is not required to prepare test programs.
    Type: Grant
    Filed: November 25, 1997
    Date of Patent: February 22, 2000
    Assignee: Mosaid Technologies Incorporated
    Inventors: Jack A. Medd, Po Wen Chin