Patents by Inventor Pradeep K. Shetty

Pradeep K. Shetty has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for real time classification and performance monitoring of batch processes
    Patent number: 8090676
    Abstract: Systems and methods (300) for offline/online performance monitoring of batch processes (BPs) involving obtaining archived data (AD) obtained during runs of BP and including information defining a batch quality attribute for each run. The method also involves forming clusters by classifying AD for the runs into classes based on the batch quality attribute(s) and building a first multivariate statistical model (MSM) using AD. The method can further involve building a wavelet analysis based feature matrix (FM) using AD, forming a first projection (1200) by projecting FM onto a first MSM, building a second MSM (1300) using information obtained from the first projection, and computing centroids (C902, . . . , C918) and boundary profiles for the clusters (902, . . . , 918). The method can involve performing an online/offline performance monitoring (700/800) using an integrated version of the first and second MSM, a classification algorithm, centroids, and boundary profiles.
    Type: Grant
    Filed: September 11, 2008
    Date of Patent: January 3, 2012
    Assignee: Honeywell International Inc.
    Inventors: Shailesh Rajnikant Patel, Ramprasad Yelchuru, Srikanth Ryali, Pradeep K. Shetty, Gudi Ravindra
  • SYSTEMS AND METHODS FOR REAL TIME CLASSIFICATION AND PERFORMANCE MONITORING OF BATCH PROCESSES
    Publication number: 20100063611
    Abstract: Systems and methods (300) for offline/online performance monitoring of batch processes (BPs) involving obtaining archived data (AD) obtained during runs of BP and including information defining a batch quality attribute for each run. The method also involves forming clusters by classifying AD for the runs into classes based on the batch quality attribute(s) and building a first multivariate statistical model (MSM) using AD. The method can further involve building a wavelet analysis based feature matrix (FM) using AD, forming a first projection (1200) by projecting FM onto a first MSM, building a second MSM (1300) using information obtained from the first projection, and computing centroids (C902, . . . , C918) and boundary profiles for the clusters (902, . . . , 918). The method can involve performing an online/offline performance monitoring (700/800) using an integrated version of the first and second MSM, a classification algorithm, centroids, and boundary profiles.
    Type: Application
    Filed: September 11, 2008
    Publication date: March 11, 2010
    Inventors: Shailesh Rajnikant Patel, Ramprasad Yelchuru, Srikanth Ryali, Pradeep K. Shetty, Gudi Ravindra