Patents by Inventor Pranjal Bhuyan

Pranjal Bhuyan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10482289
    Abstract: A computing device includes a hardware resource, a component to send a transaction signal including a target address of the hardware resource, a security data associated with an initiator of the transaction signal, and a safety data associated with the initiator, and an access control unit coupled to the component and the hardware resource, the access control unit to receive the transaction signal, determine whether security access is granted based on the transaction signal, determine whether safety access is granted based on the transaction signal, and allow access to the hardware resource based on both the security access and the safety access being granted.
    Type: Grant
    Filed: August 24, 2017
    Date of Patent: November 19, 2019
    Assignee: QUALCOMM Incorporated
    Inventors: David Barr, Dafna Shaool, Rahul Gulati, Pranjal Bhuyan
  • Patent number: 10481202
    Abstract: A self-test controller includes a memory configured to store a test patterns, configuration registers, and a memory data component. The test patterns are encoded in the memory using various techniques in order to save storage space. By using the configuration parameters, the memory data component is configured to decode the test patterns and perform multiple built-in self-test on a multitude of test cores. The described techniques allow for built-in self-test to be performed dynamically while utilizing less space in the memory.
    Type: Grant
    Filed: December 7, 2017
    Date of Patent: November 19, 2019
    Assignee: QUALCOMM Incorporated
    Inventors: Arvind Jain, Nishi Bhushan Singh, Rahul Gulati, Pranjal Bhuyan, Rakesh Kumar Kinger, Roberto Averbuj
  • Patent number: 10389379
    Abstract: Various additional and alternative aspects are described herein. In some aspects, the present disclosure provides a method of testing error-correcting code (ECC) logic. The method includes receiving data for storage in a memory. The method further includes receiving an address indicating a location in the memory to store the data. The method further includes determining if the received address matches at least one of one or more test addresses. The method further includes operating the ECC logic in a normal mode when the received address does not match at least one of the one or more test addresses. The method further includes operating the ECC logic in a test mode when the received address does match at least one of the one or more test addresses.
    Type: Grant
    Filed: May 12, 2017
    Date of Patent: August 20, 2019
    Assignee: QUALCOMM Incorporated
    Inventors: Rahul Gulati, Palkesh Jain, Pranjal Bhuyan, Mohammad Reza Kakoee
  • Publication number: 20190065785
    Abstract: A computing device includes a hardware resource, a component to send a transaction signal including a target address of the hardware resource, a security data associated with an initiator of the transaction signal, and a safety data associated with the initiator, and an access control unit coupled to the component and the hardware resource, the access control unit to receive the transaction signal, determine whether security access is granted based on the transaction signal, determine whether safety access is granted based on the transaction signal, and allow access to the hardware resource based on both the security access and the safety access being granted.
    Type: Application
    Filed: August 24, 2017
    Publication date: February 28, 2019
    Inventors: David Barr, Dafna SHAOOL, Rahul GULATI, Pranjal BHUYAN
  • Publication number: 20190018408
    Abstract: Devices and methods are disclosed for verifying the integrity of a sensing system. In one aspect, a vehicle includes an integrated circuit configured to support a message-based protocol between the integrated circuit and a sensor device associated with the vehicle, and send a sensor capability safety support message, as part of the message-based protocol, to determine one or more capabilities of the sensor device. The integrated circuit is also configured to receive, in response to the sensor capability safety support message, identification data corresponding to the sensor device, from the sensor device. The memory is configured to store a plurality of request data corresponding to a plurality of fields supported by the message-based protocol and associated with the integrated circuit and the sensor device capabilities, and store the response, including the identification data, from the sensor device.
    Type: Application
    Filed: July 12, 2017
    Publication date: January 17, 2019
    Inventors: Rahul Gulati, Mainak Biswas, Pranjal Bhuyan, Anshuman Saxena
  • Publication number: 20180331692
    Abstract: Various additional and alternative aspects are described herein. In some aspects, the present disclosure provides a method of testing error-correcting code (ECC) logic. The method includes receiving data for storage in a memory. The method further includes receiving an address indicating a location in the memory to store the data. The method further includes determining if the received address matches at least one of one or more test addresses. The method further includes operating the ECC logic in a normal mode when the received address does not match at least one of the one or more test addresses. The method further includes operating the ECC logic in a test mode when the received address does match at least one of the one or more test addresses.
    Type: Application
    Filed: May 12, 2017
    Publication date: November 15, 2018
    Inventors: Rahul GULATI, Palkesh JAIN, Pranjal BHUYAN, Mohammad Reza KAKOEE
  • Patent number: 10061644
    Abstract: Systems and methods are disclosed for error correction control (ECC) for a memory device comprising a data portion and an ECC portion, the memory device coupled to a system on a chip (SoC). The SoC includes an ECC cache. On receipt of a request to write a line of data to the memory, a determination is made if the data is compressible. If so, the data line is compressed. ECC bits are generated for the compressed or uncompressed data line. A determination is made if an ECC cache line is associated with the received data line. If the data line is compressible, the ECC bits are appended to the compressed data line and the appended data line is stored in the data portion of the memory. Otherwise, the ECC bits are stored in the ECC cache and the data line is stored in the data portion of the memory.
    Type: Grant
    Filed: January 12, 2016
    Date of Patent: August 28, 2018
    Assignee: QUALCOMM Incorporated
    Inventors: Nhon Quach, Mainak Biswas, Pranjal Bhuyan, Jeffrey Shabel, Robert Hardacker, Rahul Gulati, Mattheus Heddes
  • Publication number: 20180231609
    Abstract: A self-test controller includes a memory configured to store a test patterns, configuration registers, and a memory data component. The test patterns are encoded in the memory using various techniques in order to save storage space. By using the configuration parameters, the memory data component is configured to decode the test patterns and perform multiple built-in self-test on a multitude of test cores. The described techniques allow for built-in self-test to be performed dynamically while utilizing less space in the memory.
    Type: Application
    Filed: December 7, 2017
    Publication date: August 16, 2018
    Inventors: Arvind JAIN, Nishi BHUSHAN SINGH, Rahul GULATI, Pranjal BHUYAN, Rakesh Kumar KINGER, Roberto AVERBUJ
  • Patent number: 9955150
    Abstract: A display processor of a display system may receive an image that includes a test pattern. An input checksum may be associated with the test pattern. Hardware units of the display processor may process the image. The display system may generate an output checksum based at least in part on the test pattern after processing of the image. The display system may detect a fault in the hardware units of the display processor based on determining a difference between the input checksum and the output checksum.
    Type: Grant
    Filed: September 24, 2015
    Date of Patent: April 24, 2018
    Assignee: QUALCOMM Incorporated
    Inventors: Rahul Gulati, John Chi Kit Wong, Pranjal Bhuyan, Sanjay Gupta, Hemang Jayant Shah
  • Publication number: 20170222430
    Abstract: An integrated circuit (IC) is disclosed herein for short-resistant output pin circuitry. In an example aspect, an integrated circuit includes a short-resistant pin and an adjacent pin. The integrated circuit also includes a short-resistant pad that is coupled to the short-resistant pin and an adjacent pad that is coupled to the adjacent pin. The integrated circuit further includes short-resistant circuitry that is coupled to the short-resistant pad and the adjacent pad. The short-resistant circuitry is implemented to detect a short-circuit condition between the short-resistant pin and the adjacent pin and to reduce an effect of the short-circuit condition on the short-resistant pin.
    Type: Application
    Filed: February 1, 2016
    Publication date: August 3, 2017
    Inventors: Virendra Bansal, Rahul Gulati, Pranjal Bhuyan, Palkesh Jain
  • Publication number: 20170123897
    Abstract: Systems and methods are disclosed for error correction control (ECC) for a memory device comprising a data portion and an ECC portion, the memory device coupled to a system on a chip (SoC). The SoC includes an ECC cache. On receipt of a request to write a line of data to the memory, a determination is made if the data is compressible. If so, the data line is compressed. ECC bits are generated for the compressed or uncompressed data line. A determination is made if an ECC cache line is associated with the received data line. If the data line is compressible, the ECC bits are appended to the compressed data line and the appended data line is stored in the data portion of the memory. Otherwise, the ECC bits are stored in the ECC cache and the data line is stored in the data portion of the memory.
    Type: Application
    Filed: January 12, 2016
    Publication date: May 4, 2017
    Inventors: Nhon Quach, Mainak Biswas, Pranjal Bhuyan, Jeffrey Shabel, Robert Hardacker, Rahul Gulati, Mattheus Heddes
  • Publication number: 20170094268
    Abstract: A display processor of a display system may receive an image that includes a test pattern. An input checksum may be associated with the test pattern. Hardware units of the display processor may process the image. The display system may generate an output checksum based at least in part on the test pattern after processing of the image. The display system may detect a fault in the hardware units of the display processor based on determining a difference between the input checksum and the output checksum.
    Type: Application
    Filed: September 24, 2015
    Publication date: March 30, 2017
    Inventors: Rahul Gulati, John Chi Kit Wong, Pranjal Bhuyan, Sanjay Gupta, Hemang Jayant Shah