Abstract: Techniques and systems for two scanners to inspect objects based on an initial scanning of all objects and an additional scanning of objects that are determined by the initial scanning to potentially include one or more suspect regions. In one implementation, a system can include a primary scanner for performing the initial or primary scanning and a smaller secondary scanner for the additional or secondary scanning to provide efficient and accurate inspection of objects while maintaining a desired throughput of the inspection. In another implementation, a single scanner can be used to perform both the initial scanning and the additional scanning while maintaining a sufficient throughput of a line of objects under inspection.

Abstract: Techniques, systems, and devices are disclosed for analyzing a point of closest approach (PoCA) image of a volume of interest (VOI) comprising a set of recorded PoCA points from charged particle detector measurements to detect an object within the VOI. The VOI is partitioned into a set of equally-sized bins with each bin including a subset of the PoCA points. A bin metric is determined for each bin. A subset of the bins is selected based on the detected bin metric with the subset of bins being most likely to contain objects. A potential object for each selected bin is determined by determining a location and a size for the potential object based at least on the PoCAs inside the bin. A figure of merit (FOM) of the potential object is determined as a measure of the likelihood that the potential object is truly a threat object.

Abstract: Methods, devices, systems and computer program products produce and utilize improved momentum estimates for charged particles such as electrons and muons. One method for measuring momentum includes obtaining charged particle tomographic data at one or more charged particle position detectors corresponding to scattering angles of charged particles that pass through an object volume. The distribution of scattering angles associated with the charged particles is determined using measured data collected from the position detectors, based on deviations of local trajectories of the charged particles in one or more planes relative to a reference trajectory. The method also includes determining a length of the scattering material based on the characteristics of the position detectors and the charged particles' angle of incidence on the position detectors, and obtaining charged particle momentum estimates based on the determined distribution of scattering angles and the length of the scattering material.

Abstract: Techniques and systems for two scanners to inspect objects based on an initial scanning of all objects and an additional scanning of objects that are determined by the initial scanning to potentially include one or more suspect regions. In one implementation, a system can include a primary scanner for performing the initial or primary scanning and a smaller secondary scanner for the additional or secondary scanning to provide efficient and accurate inspection of objects while maintaining a desired throughput of the inspection. In another implementation, a single scanner can be used to perform both the initial scanning and the additional scanning while maintaining a sufficient throughput of a line of objects under inspection.

Abstract: Techniques and systems for using cosmic ray-produced muons to inspect objects based on an initial scanning of all objects and an additional scanning of objects that are determined by the initial scanning to potentially include one or more suspect regions. In one implementation, a system can include a primary scanner for performing the initial or primary scanning and a smaller secondary scanner for the additional or secondary scanning to provide efficient and accurate inspection of objects while maintaining a desired throughput of the inspection. In another implementation, a single scanner can be used to perform both the initial scanning and the additional scanning while maintaining a sufficient throughput of a line of objects under inspection.

Abstract: Methods, devices, systems and computer program products produce and utilize improved momentum estimates for charged particles such as electrons and muons. One method for measuring momentum includes obtaining charged particle tomographic data at one or more charged particle position detectors corresponding to scattering angles of charged particles that pass through an object volume. The distribution of scattering angles associated with the charged particles is determined using measured data collected from the position detectors, based on deviations of local trajectories of the charged particles in one or more planes relative to a reference trajectory. The method also includes determining a length of the scattering material based on the characteristics of the position detectors and the charged particles' angle of incidence on the position detectors, and obtaining charged particle momentum estimates based on the determined distribution of scattering angles and the length of the scattering material.

Abstract: Techniques, systems, and devices are disclosed for analyzing a point of closest approach (PoCA) image of a volume of interest (VOI) comprising a set of recorded PoCA points from charged particle detector measurements to detect an object within the VOI. The VOI is partitioned into a set of equally-sized bins with each bin including a subset of the PoCA points. A bin metric is determined for each bin. A subset of the bins is selected based on the detected bin metric with the subset of bins being most likely to contain objects. A potential object for each selected bin is determined by determining a location and a size for the potential object based at least on the PoCAs inside the bin. A figure of merit (FOM) of the potential object is determined as a measure of the likelihood that the potential object is truly a threat object.

Abstract: Techniques and systems for using cosmic ray-produced muons to inspect objects based on an initial scanning of all objects and an additional scanning of objects that are determined by the initial scanning to potentially include one or more suspect regions. In one implementation, a system can include a primary scanner for performing the initial or primary scanning and a smaller secondary scanner for the additional or secondary scanning to provide efficient and accurate inspection of objects while maintaining a desired throughput of the inspection. In another implementation, a single scanner can be used to perform both the initial scanning and the additional scanning while maintaining a sufficient throughput of a line of objects under inspection.