Patents by Inventor R. Keith Lee

R. Keith Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe contactor and production method thereof
    Patent number: 6452407
    Abstract: A probe contactor is formed on a planar surface of a substrate by a photolithography technology. The probe contactor is configured by a substrate having an interconnect trace thereon which is an electric conductive path, and a contactor formed on the substrate through a photolithography process. The contactor has a base portion vertically formed on the substrate, a horizontal portion, one end of which is formed on the base portion, and a contact portion formed on another end of the horizontal portion. A spring force of the horizontal portion of the contactor provides a contact force when the probe contactor is pressed against a contact target. The contact portion of the contactor is sharpened so that when the contactor is pressed against the contact target, it scrubs a surface of the contact target.
    Type: Grant
    Filed: December 18, 2000
    Date of Patent: September 17, 2002
    Assignee: Advantest Corp.
    Inventors: Theodore A. Khoury, Mark R. Jones, R. Keith Lee
  • Probe contactor and production method thereof
    Publication number: 20010026166
    Abstract: A probe contactor for testing a semiconductor wafer, a packaged LSI or a printed circuit board is formed on a planar surface of a substrate by a photolithography technology. The contactor is formed of a substrate having an interconnect trace thereon which is an electric conductive path, and a contactor formed on the substrate through a photolithography process. The contactor has a base portion vertically formed on the substrate, a horizontal portion, one end of which is formed on the base portion, and a contact portion formed on another end of the horizontal portion. A spring force of the horizontal portion of the contactor provides a contact force when the probe contactor is pressed against the device to be tested.
    Type: Application
    Filed: December 18, 2000
    Publication date: October 4, 2001
    Inventors: Theodore A. Khoury, Mark R. Jones, R. Keith Lee