Patents by Inventor Raf Nysen

Raf Nysen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measurement probe unit for metrology applications
    Patent number: 10267629
    Abstract: The present invention provides a dimensional measurement probe unit (100) for attachment to a probe head (200) of a localizer (300), comprising: a measurement probe (150) for dimensional measurement of an object (400); a revolute joint (170) integrated into the measurement probe (150); and a probe unit interface (120) for repeated dismountable connection to a probe head (200) wherein the probe unit interface (120) is revolutely connected to the measurement probe (150) by the revolute joint (170).
    Type: Grant
    Filed: April 8, 2015
    Date of Patent: April 23, 2019
    Assignee: NIKON METROLOGY NV
    Inventors: Frank Thys, Hans Thielemans, Raf Nysen, Laurens Van Horenbeek
  • Optical scanning probe
    Patent number: 9696146
    Abstract: The present invention relates to a scanning probe (100) for the dimensional acquisition of an object (400) by irradiating the object (400) with light and detecting reflected light comprising: a detection unit (120) comprising an imaging sensor (122) and a sensor lens assembly (124) for detecting the reflected light, a light projecting unit (141) comprising a light source (142) for generating light, and source optics (145) for focusing the light, and light plane generating optics (143) for generating a light plane (149) for irradiating the object, and an adjustment mechanism (155) comprised in the light projecting unit (141), for adjusting the position or orientation of the light plane relative to the detection unit. It further relates to a method for assembly of a scanning probe (100).
    Type: Grant
    Filed: March 28, 2013
    Date of Patent: July 4, 2017
    Assignee: NIKON METROLOGY NV
    Inventors: Patrick Blanckaert, Frank Thys, Raf Nysen, Geert Vandenhoudt
  • OPTICAL SCANNING PROBE
    Publication number: 20150043008
    Abstract: The present invention relates to a scanning probe (100) for the dimensional acquisition of an object (400) by irradiating the object (400) with light and detecting reflected light comprising: a detection unit (120) comprising an imaging sensor (122) and a sensor lens assembly (124) for detecting the reflected light, a light projecting unit (141) comprising a light source (142) for generating light, and source optics (145) for focusing the light, and light plane generating optics (143) for generating a light plane (149) for irradiating the object, and an adjustment mechanism (155) comprised in the light projecting unit (141), for adjusting the position or orientation of the light plane relative to the detection unit. It further relates to a method for assembly of a scanning probe (100).
    Type: Application
    Filed: March 28, 2013
    Publication date: February 12, 2015
    Inventors: Patrick Blanckaert, Frank Thys, Raf Nysen, Geert Vandenhoudt