Patents by Inventor Rafael BEN AMI

Rafael BEN AMI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Determination of defect location for examination of a specimen
    Patent number: 11423529
    Abstract: There is provided a method and a system configured to obtain an image of a one or more first areas of a semiconductor specimen acquired by an examination tool, determine data Datt informative of defectivity in the one or more first areas, determine one or more second areas of the semiconductor specimen for which presence of a defect is suspected based at least on an evolution of Datt, or of data correlated to Datt, in the one or more first areas, and select the one or more second areas for inspection by the examination tool.
    Type: Grant
    Filed: February 18, 2020
    Date of Patent: August 23, 2022
    Assignee: Applied Materials Isreal Ltd.
    Inventors: Doron Girmonsky, Rafael Ben Ami, Boaz Cohen, Dror Shemesh
  • DETERMINATION OF DEFECT LOCATION FOR EXAMINATION OF A SPECIMEN
    Publication number: 20210256687
    Abstract: There is provided a method and a system configured to obtain an image of a one or more first areas of a semiconductor specimen acquired by an examination tool, determine data Datt informative of defectivity in the one or more first areas, determine one or more second areas of the semiconductor specimen for which presence of a defect is suspected based at least on an evolution of Datt, or of data correlated to Datt, in the one or more first areas, and select the one or more second areas for inspection by the examination tool.
    Type: Application
    Filed: February 18, 2020
    Publication date: August 19, 2021
    Inventors: Doron GIRMONSKY, Rafael BEN AMI, Boaz COHEN, Dror SHEMESH