Patents by Inventor Ralf Netz

Ralf Netz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20100225910
    Abstract: 1.1. Method for the configuration a laser scanning microscope for a raster image correlation spectroscopy measurement and method for carrying out and evaluating a measurement of this kind. 2.1. Manual setting of the scan parameters for a raster image correlation spectroscopy measurement (RICS) is complicated because the effects of setting a certain parameter are not apparent due to the complex interaction between the various parameters and also depend on the physical-technical properties of the microscope. By means of an improved configuration method, mathematical transport models can be fitted to correlations determined by means of scanning fluorescence spectroscopy with few errors. With improved methods for carrying out or evaluating a RICS measurement, the amount of data to be stored can be reduced and RICS correlations of high statistical quality can be determined within a short period of time. 2.2.
    Type: Application
    Filed: September 30, 2008
    Publication date: September 9, 2010
    Inventors: Stephan Wagner-Conrad, Frank Hecht, Klaus Weisshart, Ralf Netz
  • Publication number: 20100097694
    Abstract: Method for actuation control of a microscope, in particular of a Laser Scanning Microscope, in which, at least one first illumination light, preferably moving at least in one direction, as well as at least one second illumination light moving at least in one direction, illuminate a sample through a beam combiner, a detection of the light coming from the sample takes place, whereby, at least one part of the illumination light is generated through the splitting of the light from a common illuminating unit, characterized in that, by means of a common control unit, a controlled splitting into the first and the second illumination light takes place, in which the intensity of the first illuminating light, specified by the user or specified automatically, is assigned a higher priority (is prioritized) compared to the specified value for the second illumination light, and an adjustment for the second illumination light takes place until a maximum value is obtained, which is determined by the value specified for the f
    Type: Application
    Filed: October 13, 2009
    Publication date: April 22, 2010
    Inventors: Bernhard Zimmermann, Ralf Netz, Frank Hecht, Joerg-Michael Funk, Ralf Engelmann
  • Patent number: 7656583
    Abstract: A beam corradiator for combining two radiation beams, preferably movable beams independent from each other in at least one direction, to scan and/or influence a sample, preferably a manipulation system and an imaging system, with a partially reflecting layer being provided for the corradiation, wherein the thickness of the layer is provided with a preferably consistent incline or decline over the optically effective cross-section of the beam corradiatior.
    Type: Grant
    Filed: April 6, 2007
    Date of Patent: February 2, 2010
    Assignee: Carl Zeiss Microimaging GmbH
    Inventors: Michael Goelles, Ralf Netz, Marcus Heidkamp, Joerg-Michael Funk
  • Publication number: 20090296207
    Abstract: Laser scanning microscope and its operating method in which at least two first and second light distributions activated independently of each other and that can move in at least one direction illuminate a sample with the help of a beam-combining element, and the light is detected by the sample as it comes in, characterized by the fact that the scanning fields created by the light distributions on the sample are made to overlap mutually such that a reference pattern is created on the sample with one of the light distributions, which is then captured and used to create the overlap with the help of the second light distribution (correction values are determined) and/or a reference pattern arranged in the sample plane or in an intermediate image plane is captured by both scanning fields and used to create the overlap (correction values are determined) and/or structural characteristics of the sample are captured by the two scanning fields as reference pattern and used to create the overlap in which correction valu
    Type: Application
    Filed: April 6, 2007
    Publication date: December 3, 2009
    Inventors: Michael Goelles, Ralf Netz, Frank Hecht, Joerg-Michael Funk
  • Publication number: 20090224174
    Abstract: A calibration device for managing a variety of performance tests and/or calibration tasks in a laser scanning microscope. The calibration device, which has focusing optics and a test structure arranged in the focal plane of the focusing optics, with structural elements detectable in reflected and/or transmitted light aligned to each other in a common mounting, can be switched into the microscope beam path in a laser scanning microscope, so that the pupil of the focusing optics coincides with the objective pupil of the laser scanning microscope or lies in a plane conjugated to it.
    Type: Application
    Filed: January 29, 2009
    Publication date: September 10, 2009
    Inventors: Ralf Netz, Wolfgang Bathe, Joerg Steinert, Werner Kleinschmidt, Ingo Fahlbusch, Michael Brehm
  • Publication number: 20080130125
    Abstract: A beam corradiator for combining two radiation beams, preferably movable beams independent from each other in at least one direction, to scan and/or influence a sample, preferably a manipulation system and an imaging system, with a partially reflecting layer being provided for the corradiation, wherein the thickness of the layer is provided with a preferably consistent incline or decline over the optically effective cross-section of the beam corradiatior.
    Type: Application
    Filed: April 6, 2007
    Publication date: June 5, 2008
    Inventors: Michael Goelles, Ralf Netz, Marcus Heidkamp, Joerg-Michael Funk
  • Publication number: 20080068709
    Abstract: Method for actuation control of a microscope, in particular of a Laser Scanning Microscope, in which, at least one first illumination light, preferably moving at least in one direction, as well as at least one second illumination light moving at least in one direction, illuminate a sample through a beam combination, a detection of the light coming from the sample takes place, whereby, at least one part of the illumination light is generated through the splitting of the light from a common illuminating unit, characterized in that, by means of a common control unit, a controlled splitting into the first and the second illumination light takes place, in which the intensity of the first illuminating light, specified by the user or specified automatically, is assigned a higher priority (is prioritized) compared to the specified value for the second illumination light, and an adjustment for the second illumination light takes place until a maximum value is obtained, which is determined by the value specified for th
    Type: Application
    Filed: April 6, 2007
    Publication date: March 20, 2008
    Inventors: Bernhard Zimmermann, Ralf Netz, Frank Hecht, Joerg-Michael Funk, Ralf Engelmann