Abstract: A method and a measurement setup for determination of optical properties of a device under test in both directions in transmission and in reflection, includes a coding device distinguishably coding at least two parts of a provided measurement signal, feeding elements feeding the at least two parts into the DUT from both directions, receiving elements receiving the signals from both directions transmitted and reflected by the DUT, identifying at least the coded parts in the signals transmitted and reflected by the DUT, and analyzing at least the identified parts to determine at least one optical property of the DUT from both directions in transmission and in reflection.

Abstract: For determining an insertion loss (LDUT) of an optical component (20) having one or more connections (C1, C2), a connection insertion loss (LC1, LC2) is determined for one or more of the connections (C1, C2) by means a reflectometric measurement, and a total insertion loss (Ltotal) of the optical component (20) is determined together with its one or more connections (C1, C2). The insertion loss (LDUT) of the optical component (20) can then be determined from the determined total insertion loss (Ltotal) and each determined connection insertion loss (LC1, LC2).

Abstract: The present invention relates to a method and a measurement setup for determination of optical properties of a device under test in both directions in transmission and in reflection, comprising: a coding device distinguishable coding at least two parts of a provided measurement signal, feeding elements feeding the at least two parts into the DUT from both directions, receiving elements receiving the signals from both directions transmitted and reflected by the DUT, identifying at least the coded parts in the signals transmitted and reflected by the DUT, and analyzing at least the identified parts to determine at least one optical property of the DUT from both directions in transmission and in reflection.

Abstract: A wavelength-determining unit for determining the wavelengths of a plurality of successive optical signals &lgr;(t) includes a wavemeter unit for determining first wavelength values &lgr;1(t) for the optical signals &lgr;(t). An absolute-measuring unit having unambiguous wavelength properties at known absolute wavelength values determines second wavelength values &lgr;2(t) as such of the known absolute wavelength values covered by the optical signals &lgr;(t). An evaluation unit receives the determined first &lgr;1(t) and second &lgr;2(t) wavelength values and provides forcorrected wavelength values &lgr;1′(t) based on a comparison of the determined first &lgr;1(t) and second &lgr;2(t) wavelength values.

Abstract: The present invention relates to determination of optical properties, e.g. polarization dependent loss (PDL), polarization mode dispersion (PMD), differential group delay (DGD), insertion loss, return loss and/or chromatic dispersion (CD), of a device under test (DUT) in transmission and in reflection of an optical beam. The invention is disclosing an element that is at least partly transmissive and at least partly reflective.

Abstract: For measuring a polarization dependent parameter of an optical device under test—DUT—, an optical source provides an optical stimulus signal at variable wavelengths, and a polarization translator translates the polarization state of the optical stimulus signal applied from the optical source at its input to its output in a deterministic way dependent on the wavelength of the optical stimulus signal. A receiving unit receives an optical response signal from the DUT to the applied optical stimulus signal, and an analyzing unit analyzes received optical response signals for different wavelengths for determining values of the polarization dependent parameter of the DUT.

Abstract: The present invention relates to calibration and verification of a measurement setup for determination of optical properties, e.g. polarization dependent loss (PDL), polarization mode dispersion (PMD), differential group delay (DGD), insertion loss, return loss and/or chromatic dispersion (CD), of a device under test (DUT) in transmission and in reflection of an optical beam. The invention is disclosing an element that is at least partly transmissive and at least partly reflective.

Abstract: The present invention relates determination of optical properties, e.g. polarization dependent loss (PDL), polarization mode dispersion (PMD), differential group delay (DGD), insertion loss, return loss and/or chromatic dispersion (CD), of a device under test (DUT) in transmission and in reflection of an optical beam. The invention is disclosing an element that is at least partly transmissive and at least partly reflective.

Abstract: For measuring a polarization dependent parameter of an optical device under test —DUT—(30), an optical source (10) provides an optical stimulus signal at variable wavelengths, and a polarization translator (20) translates the polarization state of the optical stimulus signal applied from the optical source (10) at its input to its output in a deterministic way dependent on the wavelength of the optical stimulus signal. A receiving unit (40) receives an optical response signal from the DUT (30) to the applied optical stimulus signal, and an analyzing unit (60) analyzes received optical response signals for different wavelengths for determining values of the polarization dependent parameter of the DUT (30).

Abstract: A wavelength-determining unit (20) for determining the wavelengths of a plurality of successive optical signals &lgr;(t) comprises a wavemeter unit (30) for determining first wavelength values &lgr;1(t) for the optical signals &lgr;(t). An absolute-measuring unit (40) having unambiguous wavelength properties at known absolute wavelength values determines second wavelength values &lgr;2(t) as such of the known absolute wavelength values covered by the optical signals &lgr;(t). An evaluation unit (50) receives the determined first &lgr;1(t) and second &lgr;2(t) wavelength values and for provides corrected wavelength values &lgr;1′(t) based on a comparison of the determined first &lgr;1(t) and second &lgr;2(t) wavelength values.