Patents by Inventor Ramachandra R. Katragadda

Ramachandra R. Katragadda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for identifying defects in a semiconductor
    Patent number: 6292582
    Abstract: A system and method allow for associating a descriptive label with an anomaly on a manufactured object, such as a semiconductor wafer. The method includes placing the manufactured device on a moveable stage; capturing and preparing a digital-pixel-based representation of the image; symbolically decomposing the digital-pixel-based representation of the image to create a primitive-based representation of the image; analyzing the primitive-based representation of the image to detect and locate the anomaly; isolating primitives associated with the anomaly; comparing the isolated primitives associated with the anomaly with primitives in a knowledge base to locate a set of primitives in the knowledge base most like the isolated primitives associated with the anomaly; and assigning a label associated with the set of primitives in the knowledge base that was most similar to the isolated primitives associated with the anomaly.
    Type: Grant
    Filed: May 30, 1997
    Date of Patent: September 18, 2001
    Inventors: YouLing Lin, A. Kathleen Hennessey, Ramachandra R. Katragadda, Ramakrishna Pattikonda, Rajasekar Reddy, C. Rinn Cleavelin, Howard V. Hastings, II, Wan S. Wong