Abstract: Optical systems are provided. In an embodiment, the optical system includes a first anamorphic optic having a first focal length and a first focal line, where the first focal line is parallel to a cross track direction. A second anamorphic optic has a second focal length and a second focal line, where the second focal length is different than the first first focal length. The second anamorphic optic is positioned such that the first focal line and the second focal line are in about the same location. The first and second anamorphic optics are aligned along an optical signal path, and are configured to provide afocal magnification to a signal beam along an along track direction to produce a magnified beam. A line scan imager includes an objective lens and a linear detector, and the second anamorphic optic is configured to direct the magnified beam at the objective lens.

Abstract: Optical systems are provided. In an embodiment, the optical system includes a first anamorphic optic having a first focal length and a first focal line, where the first focal line is parallel to a cross track direction. A second anamorphic optic has a second focal length and a second focal line, where the second focal length is different than the first first focal length. The second anamorphic optic is positioned such that the first focal line and the second focal line are in about the same location. The first and second anamorphic optics are aligned along an optical signal path, and are configured to provide afocal magnification to a signal beam along an along track direction to produce a magnified beam. A line scan imager includes an objective lens and a linear detector, and the second anamorphic optic is configured to direct the magnified beam at the objective lens.

Abstract: A scalable imaging spectrometer, using anamorphic optical elements to form an intermediate focus in only one dimension. Light reflects off an object to form an incident beam. The beam reflects off an anamorphic objective mirror to form a line focus at a slit. At the slit, the beam is focused along the spectral dimension, but remains substantially collimated along the spatial dimension. The beam is then recollimated in the spectral dimension by a second anamorphic mirror, reflects off a diffraction grating, passes through a lens, and is brought to focus on a two dimensional detector, which produces both spectral and spatial information about the object. Because there is no intermediate focus in the spatial dimension, there are no off-axis aberrations from the anamorphic mirrors, and the field of view may be substantially increased over prior art spectrometers in the spatial dimension.

Abstract: A method of attaching electrodes to optical substrates with embedded waveguides includes applying the electrode pattern to a separate superstrate from the electro-optic material containing the waveguide. This allows for the change of the index of refraction and/or the dipole moment of an electro-optic material using low voltages. In0 addition, the electrode superstrate can be detached from the waveguide substrate and repositioned and aligned to different waveguides. Removable electrodes add flexibility and increase yield by allowing the electrodes to be re-aligned to the waveguides when improper alignment occurs.

Abstract: A method of attaching electrodes to optical substrates with embedded waveguides includes applying the electrode pattern to a separate superstrate from the electro-optic material containing the waveguide. This allows for the change of the index of refraction and/or the dipole moment of an electro-optic material using low voltages. IN addition, the electrode superstrate can be detached from the waveguide substrate and repositioned and aligned to different waveguides. Removable electrodes add flexibility and increase yield by allowing the electrodes to be re-aligned to the waveguides when improper alignment occurs.