Abstract: Integrated circuit transmit modules include an integrated circuit substrate, a baseband I/Q modulator in the integrated circuit substrate that modulates an input signal to produce in-phase (I) and quadrature (Q) baseband modulated inputs, and a built-in self-test (BIST) module in the integrated circuit substrate that monitors the I and Q baseband modulated outputs, to determine whether the baseband I/Q modulator is operating properly. The BIST module generates test input data for the baseband I/Q modulator. Alternatively or in addition, the BIST module can monitor the I and Q baseband modulated outputs in response to a communications input signal from a digital signal processor. The BIST module can generate a status signal to indicate whether the baseband I/Q modulator is operating properly.

Abstract: In order to test the functional and parametric characteristics of a unit without overloading a host computer, the host computer downloads a testing program to a plurality of digital signal processor modules which do all of the functional environmental emulation data generation and analysis of the data received from the unit under test. A reconfigurable application interface module is also programmed at the same time as the digital signal processor modules and is thus configured to accept basic emulation data generated by the digital signal processor modules and convert those data to the data environment that the unit under test is expected to experience in use. The application interface module also converts the data received from the unit under test into a format that the digital signal processor modules can analyze, the results of which analysis are made available to the host computer.