Patents by Inventor Randall Rooney
Randall Rooney has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11915775Abstract: Embodiments of the disclosure are drawn to apparatuses and methods for bad row mode. The memory may prevent proper access operations (e.g., read operations) from being performed on a selected bad row of the memory as part of a bad row mode. For example, the memory may store a bad row address and when an access address matches the bad row address, may suppress one or more signals, change data read from the address, or combinations thereof. The bad row mode may be used to provide a positive control for post package repair (PPR) operations on the memory. A controller may enter the memory into bad row mode and then test the memory to determine if the selected bad row can be located and repaired via PPR.Type: GrantFiled: September 29, 2021Date of Patent: February 27, 2024Assignee: Micron Technology, Inc.Inventors: Jack Riley, Scott Smith, Christian Mohr, Gary Howe, Joshua Alzheimer, Yoshinori Fujiwara, Sujeet Ayyapureddi, Randall Rooney
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Patent number: 11790974Abstract: A memory device may enforce compliance with a refresh command requirement in some examples. When a controller fails to comply with the refresh command requirement, the memory device may prevent the controller from accessing a memory array. The controller may regain access by providing one or more commands, such as a refresh command. In some examples, the memory may enforce compliance with a refresh command requirement responsive to a value written to the mode register. In some examples, the memory may enforce compliance with the refresh command requirement after an initialization operation has completed.Type: GrantFiled: November 17, 2021Date of Patent: October 17, 2023Assignee: MICRON TECHNOLOGY, INC.Inventors: Markus Geiger, Randall Rooney
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Publication number: 20230154519Abstract: A memory device may enforce compliance with a refresh command requirement in some examples. When a controller fails to comply with the refresh command requirement, the memory device may prevent the controller from accessing a memory array. The controller may regain access by providing one or more commands, such as a refresh command. In some examples, the memory may enforce compliance with a refresh command requirement responsive to a value written to the mode register. In some examples, the memory may enforce compliance with the refresh command requirement after an initialization operation has completed.Type: ApplicationFiled: November 17, 2021Publication date: May 18, 2023Applicant: MICRON TECHNOLOGY, INC.Inventors: Markus Geiger, Randall Rooney
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Publication number: 20230096291Abstract: Embodiments of the disclosure are drawn to apparatuses and methods for bad row mode. The memory may prevent proper access operations (e.g., read operations) from being performed on a selected bad row of the memory as part of a bad row mode. For example, the memory may store a bad row address and when an access address matches the bad row address, may suppress one or more signals, change data read from the address, or combinations thereof. The bad row mode may be used to provide a positive control for post package repair (PPR) operations on the memory. A controller may enter the memory into bad row mode and then test the memory to determine if the selected bad row can be located and repaired via PPR.Type: ApplicationFiled: September 29, 2021Publication date: March 30, 2023Applicant: MICRON TECHNOLOGY, INC.Inventors: Jack Riley, Scott Smith, Christian Mohr, Gary Howe, Joshua Alzheimer, Yoshinori Fujiwara, Sujeet Ayyapureddi, Randall Rooney
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Patent number: 8659961Abstract: Memories, memory repair logic, and methods for repairing a memory having redundant memory are disclosed. One such memory includes programmable elements associated with respective redundant memory configured to have memory addresses mapped thereto, the programmable elements configured to be programmed with at least portions of the memory addresses. Such a memory further includes repair logic coupled to the programmable elements and configured to identify programmable elements available for programming to map memory addresses to respective redundant memory. One method for remapping a memory address of a memory to redundant memory includes receiving at least a portion of a memory address to be remapped to redundant memory, determining whether a programmable element associated with the redundant memory is available for programming, and when a programmable element is available, programming the programmable element such that the memory address will be mapped to the associated redundant memory.Type: GrantFiled: September 14, 2012Date of Patent: February 25, 2014Assignee: Micron Technology, Inc.Inventors: Randall Rooney, Steve Zerza
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Publication number: 20130010557Abstract: Memories, memory repair logic, and methods for repairing a memory having redundant memory are disclosed. One such memory includes programmable elements associated with respective redundant memory configured to have memory addresses mapped thereto, the programmable elements configured to be programmed with at least portions of the memory addresses. Such a memory further includes repair logic coupled to the programmable elements and configured to identify programmable elements available for programming to map memory addresses to respective redundant memory. One method for remapping a memory address of a memory to redundant memory includes receiving at least a portion of a memory address to be remapped to redundant memory, determining whether a programmable element associated with the redundant memory is available for programming, and when a programmable element is available, programming the programmable element such that the memory address will be mapped to the associated redundant memory.Type: ApplicationFiled: September 14, 2012Publication date: January 10, 2013Inventors: RANDALL ROONEY, Steve Zerza
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Patent number: 8289790Abstract: Memories, memory repair logic, and methods for repairing a memory having redundant memory are disclosed. One such memory includes programmable elements associated with respective redundant memory configured to have memory addresses mapped thereto, the programmable elements configured to be programmed with at least portions of the memory addresses. Such a memory further includes repair logic coupled to the programmable elements and configured to identify programmable elements available for programming to map memory addresses to respective redundant memory. One method for remapping a memory address of a memory to redundant memory includes receiving at least a portion of a memory address to be remapped to redundant memory, determining whether a programmable element associated with the redundant memory is available for programming, and when a programmable element is available, programming the programmable element such that the memory address will be mapped to the associated redundant memory.Type: GrantFiled: May 13, 2010Date of Patent: October 16, 2012Assignee: Micron Technology, Inc.Inventors: Randall Rooney, Steve Zerza
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Publication number: 20110280091Abstract: Memories, memory repair logic, and methods for repairing a memory having redundant memory are disclosed. One such memory includes programmable elements associated with respective redundant memory configured to have memory addresses mapped thereto, the programmable elements configured to be programmed with at least portions of the memory addresses. Such a memory further includes repair logic coupled to the programmable elements and configured to identify programmable elements available for programming to map memory addresses to respective redundant memory. One method for remapping a memory address of a memory to redundant memory includes receiving at least a portion of a memory address to be remapped to redundant memory, determining whether a programmable element associated with the redundant memory is available for programming, and when a programmable element is available, programming the programmable element such that the memory address will be mapped to the associated redundant memory.Type: ApplicationFiled: May 13, 2010Publication date: November 17, 2011Applicant: Micron Technology, Inc.Inventors: Randall Rooney, Steve Zerza
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Patent number: 7051253Abstract: According to an embodiment of the present invention, a method is provided for determining a fail string for a device. The method includes determining a test pattern for a portion of an address space wherein the test pattern includes at least one address in the address space and the portion of the address space includes at least one x address and at least one y addresses. The method executes a test a plurality of times for each test pattern, wherein every combination of the test pattern is tested, wherein the combinations include each address held at a first potential for at least a first test and a second potential for at least a second test. The method includes determining a fail string for the device including pass/fail results for the test pattern, and combining the pass/fail results in the fail string.Type: GrantFiled: August 16, 2001Date of Patent: May 23, 2006Assignee: Infineon Technologies Richmond LPInventors: Randall Rooney, Joerg Vollrath
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Publication number: 20030084387Abstract: According to an embodiment of the present invention, a method is provided for determining a fail string for a device. The method includes determining a test pattern for a portion of an address space wherein the test pattern includes at least one address in the address space and the portion of the address space includes at least one x address and at least one y addresses. The method executes a test a plurality of times for each test pattern, wherein every combination of the test pattern is tested, wherein the combinations include each address held at a first potential for at least a first test and a second potential for at least a second test. The method includes determining a fail string for the device including pass/fail results for the test pattern, and combining the pass/fail results in the fail string.Type: ApplicationFiled: August 16, 2001Publication date: May 1, 2003Inventors: Randall Rooney, Joerg Vollrath
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Publication number: 20030063510Abstract: A memory includes a memory array having a plurality of storage elements; a plurality of replacement storage elements; a plurality of address storage units, each operable to store a replacement address associated with a respective one of the replacement storage elements; a plurality of enable storage units, each operable to store at least first and second enable bits associated with a respective one of the replacement storage elements; and a decode unit operable to (i) activate one of the replacement storage elements when the at least first and second enable bits associated therewith are in an enable state and an input address matches the replacement address associated with the replacement storage element, and (ii) deactivate the replacement storage element when the at least first and second enable bits associated therewith have changed to a disable state.Type: ApplicationFiled: July 18, 2002Publication date: April 3, 2003Applicant: Infineon Technologies North America Corp.Inventors: Joerg Vollrath, Randall Rooney
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Patent number: 6538939Abstract: A memory includes a memory array having a plurality of storage elements; a plurality of replacement storage elements; a plurality of address storage units, each operable to store a replacement address associated with a respective one of the replacement storage elements; a plurality of enable storage units, each operable to store at least first and second enable bits associated with a respective one of the replacement storage elements; and a decode unit operable to (i) activate one of the replacement storage elements when the at least first and second enable bits associated therewith are in an enable state and an input address matches the replacement address associated with the replacement storage element, and (ii) deactivate the replacement storage element when the at least first and second enable bits associated therewith have changed to a disable state.Type: GrantFiled: July 18, 2002Date of Patent: March 25, 2003Assignee: Infineon Technologies Richmond, LPInventors: Joerg Vollrath, Randall Rooney
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Patent number: 6490209Abstract: A memory includes a memory array having a plurality of storage elements; a plurality of replacement storage elements; a plurality of address storage units, each operable to store a replacement address associated with a respective one of the replacement storage elements; a plurality of enable storage units, each operable to store at least first and second enable bits associated with a respective one of the replacement storage elements; and a decode unit operable to (i) activate one of the replacement storage elements when the at least first and second enable bits associated therewith are in an enable state and an input address matches the replacement address associated with the replacement storage element, and (ii) deactivate the replacement storage element when the at least first and second enable bits associated therewith have changed to a disable state.Type: GrantFiled: October 2, 2001Date of Patent: December 3, 2002Assignee: Infineon Technologies Richmond, LPInventors: Joerg Vollrath, Randall Rooney