Abstract: A scan assembly of an image generator sweeps an image beam in a first dimension at a first rate and bi-directionally in a second dimension at a slower rate. Sweeping the beam bi-directionally in the vertical dimension (generally the dimension of the lower sweep rate) can reduce the scanning power by eliminating the flyback period, and, where the scan assembly includes a mechanical reflector, can reduce the error in the beam position without a feedback loop by reducing the number of harmonics in the vertical sweep function. Furthermore, because the image beam is “on” longer due to the elimination of the flyback period, the scanned image is often brighter for a given beam intensity. The scan assembly may also sweep the image beam non-linearly in the vertical dimension, and this sweep may be bi-directional or uni-directional. Sweeping the beam non-linearly can also reduce the error in the beam position by reducing the number of harmonics in the vertical sweep function.

Abstract: A scan assembly of an image generator sweeps an image beam in a first dimension at a first rate and bi-directionally in a second dimension at a slower rate. Sweeping the beam bi-directionally in the vertical dimension (generally the dimension of the lower sweep rate) can reduce the scanning power by eliminating the flyback period, and, where the scan assembly includes a mechanical reflector, can reduce the error in the beam position without a feedback loop by reducing the number of harmonics in the vertical sweep function. Furthermore, because the image beam is “on” longer due to the elimination of the flyback period, the scanned image is often brighter for a given beam intensity. The scan assembly may also sweep the image beam non-linearly in the vertical dimension, and this sweep may be bi-directional or uni-directional. Sweeping the beam non-linearly can also reduce the error in the beam position by reducing the number of harmonics in the vertical sweep function.

Abstract: A circuit for detecting a phase error between a clock signal and a beam position includes a beam generator, a sensor, and a phase detector. The beam generator directs a beam toward a beam sweeper in response to the clock signal, and the sensor detects the beam as directed from the beam sweeper. The phase detector determines from the detected beam the error in the clock phase relative to the beam position. Such a circuit can automatically detect the phase error in the pixel clock and correct this error, thus eliminating the need for a manual phase-error corrector. The circuit may also be able to adjust the width and/or the height of a scan region, and thus may also be able to adjust the width and/or height of an image frame within the scan region.

Abstract: The invention is based upon the discovery that red blood cells contain phosphodiesterase 3B (PDE3B), and that inhibition of that phosphodiesterase allows for an enhanced accumulation of cAMP and subsequent release of ATP. It was further discovered that RBCs treated with insulin accumulate significantly less cAMP and release significantly less ATP than normal RBCs. Likewise, RBCs of patients suffering from type 2 diabetes (hyperinsulinemia) accumulate significantly less cAMP and release significantly less ATP than normal RBCs. It was further discovered that prostaglandin analogues synergistically work with phosphodiesterase 3B inhibitors to improve or increase cAMP accumulation and ATP release by RBCs. Thus the invention is directed to compositions and methods for improving ATP release by RBCs, via administering PDE3B inhibitor or a combination of PDE3B inhibitor and prostaglandin analogue.

Abstract: A circuit for detecting a phase error between a clock signal and a beam position includes a beam generator, a sensor, and a phase detector. The beam generator directs a beam toward a beam sweeper in response to the clock signal, and the sensor detects the beam as directed from the beam sweeper. The phase detector determines from the detected beam the error in the clock phase relative to the beam position. Such a circuit can automatically detect the phase error in the pixel clock and correct this error, thus eliminating the need for a manual phase-error corrector. The circuit may also be able to adjust the width and/or the height of a scan region, and thus may also be able to adjust the width and/or height of an image frame within the scan region.

Abstract: A scan assembly of an image generator sweeps an image beam in a first dimension at a first rate and bi-directionally in a second dimension at a slower rate. Sweeping the beam bi-directionally in the vertical dimension (generally the dimension of the lower sweep rate) can reduce the scanning power by eliminating the flyback period, and, where the scan assembly includes a mechanical reflector, can reduce the error in the beam position without a feedback loop by reducing the number of harmonics in the vertical sweep function. Furthermore, because the image beam is “on” longer due to the elimination of the flyback period, the scanned image is often brighter for a given beam intensity. The scan assembly may also sweep the image beam non-linearly in the vertical dimension, and this sweep may be bi-directional or uni-directional. Sweeping the beam non-linearly can also reduce the error in the beam position by reducing the number of harmonics in the vertical sweep function.

Abstract: Performance-enhancing, reduced-area metalization adhesion areas in force-sensing transducers are described.

Abstract: A method for improving the performance of a micromachined device, preferably an angular rate microsensor, is provided. The method includes collecting data on rate bias over a selected operating phase demodulation angles for at least one tine of a microsensor and determining optimum settings for phase demodulation angles at which the rate bias hysteresis over temperature is at a minimum by applying dynamic programming.

Abstract: Performance-enhancing, reduced-area metalization adhesion areas in force-sensing transducers are described.

Abstract: Performance-enhancing, reduced-area metalization adhesion areas in force-sensing transducers are described.

Abstract: Performance-enhancing, reduced-area metalization adhesion areas in force-sensing transducers are described.

Abstract: Performance-enhancing, reduced-area metalization adhesion areas in force-sensing transducers are described.