Abstract: An apparatus and method for controlling a test controller is disclosed. An apparatus includes test controllers of a first type configured to operate according to a first protocol and test controllers of a second type configured to operate according to a second protocol. A test controller of the second type may be associated with one of the test controllers of the first type, with the former controlling the latter. The test controllers of the second type may each control associated ones of the test controllers of the second type in parallel and independently of one another.

Abstract: A built-in self-test (BIST) circuit for detecting power supply droops is disclosed. In one embodiment, the BIST circuit includes a transition circuit configured to launch logical signals into a delay line. The BIST circuit also includes a comparator configured to compare a logic signal based on that input into the delay line with one output from the delay line. A mismatch resulting from the comparison is indicative of a power supply droop. The BIST circuit may also include circuitry for calibrating the delay line. The calibration may be performed by enabling a feedback path between the output of the delay line and its input. Enabling the feedback path may form a ring oscillator utilizing the delay line. A counter may count the number of transitions caused by the ring oscillator in a predetermined time. The resulting count may be used to determine if the delay is in a desired range.

Abstract: A system and method for efficiently performing timing characterization of high-speed clocks signals with low-speed input/output pins. An integrated circuit includes a clock generator that generates a high-speed clock signal. A clock characterizer circuit receives the high-speed clock signal. The clock characterizer generates a corresponding low-speed clock signal. The generated low-speed clock signal is output through a low-speed general-purpose input/output (GPIO) pin for measurement. The generated low-speed clock signal is sent to a sequential element for staging. The staging of the generated low-speed clock signal is done with sequential elements that use a reverse polarity of a clock signal than the polarity used by a previous stage. The high-speed clock signal is used for the staging. The output of each stage is sent to a low-speed GPIO pin for measurement.

Abstract: A method and apparatus for detecting clock glitches during at-speed testing of integrated circuits is disclosed. In one embodiment, an integrated circuit includes a scan chain having a number of scan elements coupled in a series configuration. Each of the scan elements is coupled to receive a clock signal that may be cycled during a test operation. A subset of the scan elements are arranged to form, along with other components, a counter. Test stimulus data shifted into the scan chain to perform a test may include an initial count value that is shifted into the scan elements of the counter. When the test is performed, the count value is updated responsive to cycling of the clock signal. The updated count value is shifted from the counter along with other test result data, and may be used to determine if the number of clock cycles received during the test.

Abstract: A system and method for efficiently performing timing characterization of high-speed clocks signals with low-speed input/output pins. An integrated circuit includes a clock generator that generates a high-speed clock signal. A clock characterizer circuit receives the high-speed clock signal. The clock characterizer generates a corresponding low-speed clock signal. The generated low-speed clock signal is output through a low-speed general-purpose input/output (GPIO) pin for measurement. The generated low-speed clock signal is sent to a sequential element for staging. The staging of the generated low-speed clock signal is done with sequential elements that use a reverse polarity of a clock signal than the polarity used by a previous stage. The high-speed clock signal is used for the staging. The output of each stage is sent to a low-speed GPIO pin for measurement.

Abstract: A method and apparatus for detecting clock glitches during at-speed testing of integrated circuits is disclosed. In one embodiment, an integrated circuit includes a scan chain having a number of scan elements coupled in a series configuration. Each of the scan elements is coupled to receive a clock signal that may be cycled during a test operation. A subset of the scan elements are arranged to form, along with other components, a counter. Test stimulus data shifted into the scan chain to perform a test may include an initial count value that is shifted into the scan elements of the counter. When the test is performed, the count value is updated responsive to cycling of the clock signal. The updated count value is shifted from the counter along with other test result data, and may be used to determine if the number of clock cycles received during the test.

Abstract: A built-in self-test (BIST) circuit for detecting power supply droops is disclosed. In one embodiment, the BIST circuit includes a transition circuit configured to launch logical signals into a delay line. The BIST circuit also includes a comparator configured to compare a logic signal based on that input into the delay line with one output from the delay line. A mismatch resulting from the comparison is indicative of a power supply droop. The BIST circuit may also include circuitry for calibrating the delay line. The calibration may be performed by enabling a feedback path between the output of the delay line and its input. Enabling the feedback path may form a ring oscillator utilizing the delay line. A counter may count the number of transitions caused by the ring oscillator in a predetermined time. The resulting count may be used to determine if the delay is in a desired range.