Patents by Inventor Ray N. M. Tag-at

Ray N. M. Tag-at has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9476926
    Abstract: In one embodiment, a method for determining electrostatic discharge (ESD) includes building a slider delta comparison map using slider electrical and/or row bar quasi testing results, wherein row bar quasi testing is performed on row bars of multiple sliders, and wherein slider electrical testing is performed on individual sliders, determining whether a test device in a parent job passes primary ESD delta criteria, when the test device fails the primary ESD delta criteria: flagging the parent job of the test device as a reroute job and performing automatic actual parts rerouting for any jobs related to the parent job to pull parts from a test bin as opposed to a supply bin, wherein all parts pulled from the test bin are tested prior to assembly as opposed to parts pulled from the supply bin which are not 100% tested.
    Type: Grant
    Filed: June 11, 2013
    Date of Patent: October 25, 2016
    Assignee: HGST Netherlands B.V.
    Inventors: Ciaran A. Fox, Ma. V. C. Maceren, Ray N. M. Tag-at
  • Publication number: 20140236504
    Abstract: In one embodiment, a method for determining electrostatic discharge (ESD) includes building a slider delta comparison map using slider electrical and/or row bar quasi testing results, wherein row bar quasi testing is performed on row bars of multiple sliders, and wherein slider electrical testing is performed on individual sliders, determining whether a test device in a parent job passes primary ESD delta criteria, when the test device fails the primary ESD delta criteria: flagging the parent job of the test device as a reroute job and performing automatic actual parts rerouting for any jobs related to the parent job to pull parts from a test bin as opposed to a supply bin, wherein all parts pulled from the test bin are tested prior to assembly as opposed to parts pulled from the supply bin which are not 100% tested.
    Type: Application
    Filed: June 11, 2013
    Publication date: August 21, 2014
    Inventors: Ciaran A. Fox, Ma. V. C. Maceren, Ray N. M. Tag-at