Patents by Inventor Ray Wakefield

Ray Wakefield has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for using probe card
    Patent number: 8120375
    Abstract: An apparatus for use with a wafer prober and a probe card comprising a stiffening member having a feature defining a first plane. The stiffening member is mountable atop the central portion of the probe card. A reference member is provided to mount to the wafer prober and has an underside with a feature defining a second plane. When the feature of the stiffening member defining the first plane is urged against the feature of the reference member defining a second plane the probe tips of the probe card are substantially planarized relative to the wafer prober.
    Type: Grant
    Filed: August 17, 2006
    Date of Patent: February 21, 2012
    Assignee: Nextest Systems Corporation
    Inventors: Craig Z. Foster, Ray Wakefield
  • System for testing DUT and tester for use therewith
    Patent number: 7385385
    Abstract: A tester configured to stack with at least one other tester to provide a test system for simultaneously testing a number of devices in parallel on different testers, or testing a device having more pins than can be accommodated by a single tester. The tester includes a test site with a number of pin electronics channels, an interface for interfacing with the device, and a computer for interfacing with a host computer in the test system. The testers can be fastened directly to one another or to a common frame. Preferably, the interface enables a single device board to simultaneously engage interfaces on multiple testers. More preferably, the interface extends from a top surface of the tester to engage the device board. Vents in top and front surfaces of an enclosure enables movement of air to cool components of the tester without interference from testers on either side or a back of the enclosure.
    Type: Grant
    Filed: June 12, 2002
    Date of Patent: June 10, 2008
    Assignee: Nextest Systems Corporation
    Inventors: Paul Magliocco, Ray Wakefield, Paul G. Trudeau
  • Probe card and method for using probe card, wafer prober utilizing same
    Publication number: 20060279302
    Abstract: An apparatus for use with a wafer prober and a probe card comprising a stiffening member having a feature defining a first plane. The stiffening member is mountable atop the central portion of the probe card. A reference member is provided to mount to the wafer prober and has an underside with a feature defining a second plane. When the feature of the stiffening member defining the first plane is urged against the feature of the reference member defining a second plane the probe tips of the probe card are substantially planarized relative to the wafer prober.
    Type: Application
    Filed: August 17, 2006
    Publication date: December 14, 2006
    Applicant: Nextest Systems Corporation
    Inventors: Craig Foster, Ray Wakefield
  • Apparatus for planarizing a probe card and method using same
    Patent number: 7098650
    Abstract: An apparatus for use with a wafer prober and a probe card comprising a stiffening member having a feature defining a first plane. The stiffening member is mountable atop the central portion of the probe card. A reference member is provided to mount to the wafer prober and has an underside with a feature defining a second plane. When the feature of the stiffening member defining the first plane is urged against the feature of the reference member defining a second plane the probe tips of the probe card are substantially planarized relative to the wafer prober.
    Type: Grant
    Filed: July 28, 2004
    Date of Patent: August 29, 2006
    Assignee: Nextest Systems Corporation
    Inventors: Craig Z. Foster, Ray Wakefield
  • Apparatus for planarizing a probe card and method using same
    Publication number: 20050062464
    Abstract: An apparatus for use with a wafer prober and a probe card comprising a stiffening member having a feature defining a first plane. The stiffening member is mountable atop the central portion of the probe card. A reference member is provided to mount to the wafer prober and has an underside with a feature defining a second plane. When the feature of the stiffening member defining the first plane is urged against the feature of the reference member defining a second plane the probe tips of the probe card are substantially planarized relative to the wafer prober.
    Type: Application
    Filed: July 28, 2004
    Publication date: March 24, 2005
    Inventors: Craig Foster, Ray Wakefield
  • Stackable semiconductor test system and method for operating same
    Publication number: 20030062888
    Abstract: A tester configured to stack with at least one other tester to provide a test system for simultaneously testing a number of devices in parallel on different testers, or testing a device having more pins than can be accommodated by a single tester. The tester includes a test site with a number of pin electronics channels, an interface for interfacing with the device, and a computer for interfacing with a host computer in the test system. The testers can be fastened directly to one another or to a common frame. Preferably, the interface enables a single device board to simultaneously engage interfaces on multiple testers. More preferably, the interface extends from a top surface of the tester to engage the device board. Vents in top and front surfaces of an enclosure enables movement of air to cool components of the tester without interference from testers on either side or a back of the enclosure.
    Type: Application
    Filed: June 12, 2002
    Publication date: April 3, 2003
    Inventors: Paul Magliocco, Ray Wakefield, Paul G. Trudeau