Abstract: The present invention provides a tire monitor apparatus and monitored vehicle tire. A module which monitors tire information is supported by a rubber ply affixed to the inside surface of the tire. The module has electrical components for monitoring tire information by collecting, storing and/or reading information about the tire. A retainer assembly is used to secure the module to the rubber ply such that the module is support within the tire's cavity. The module is mounted to be removed, exchanged, etc. In one embodiment, the monitor module may be isolated from tire loads such that the durability of the monitoring system is improved. The fastener assembly has first parts carried by the rubber ply and second fastener parts built into the module. The first and second fastener parts cooperate to support said module from said rubber ply. The first part may be in the form of a shaft or stem having an axial length which allows the module to be retained at an offset distance from the ply and tire.

Abstract: The present invention provides a tire monitor retainer assembly and monitored vehicle tire. A module which monitors tire information is supported by a rubber ply affixed to the inside surface of the tire. The module has electrical components for monitoring tire information by collecting, storing and/or reading information about the tire. A fastener assembly is used to secure the module to the rubber ply such that the module is support within the tire's cavity. The module is mounted to be isolated from tire loads such that the durability of the monitoring system is improved. The fastener assembly has first parts carried by the rubber ply and second fastener parts built into the module. The first and second fastener parts cooperate to support said module from said rubber ply. The module is made with a retainer opening having edges to receive a fastener device having standoff or indexing elements.

Abstract: An iterative test method which is operable in the presence of measurement noise uses the result of a particular measurement on a device to decide whether to pass or fail the-device or to take another measurement. The pass/fail decision is made by computing certain statistical values which "compare" the measurement result to a predefined pass/fail limit. Another test measurement is made if the result of the present measurement is too "close" to the pass/fail limit to make an accurate decision. If the result is not too "close" to the limit then a pass/fail decision is made based on whether the measurement is on the pass or fail side of the limit. The statistical values used to compare the measurement value to the limit can be Z-statistics or Student-t statistics depending on the test environment and the noise characteristics. Overall feedback can be added to dynamically adjust the statistical values in order to bring overall error rates into alignment with predetermined error rate targets.