Abstract: Systems and methods are provided for identifying an atomic element in proximity to an integrated circuit. Trace amounts of a contaminant are identifiable. The atomic element is exposed to neutron radiation to convert a portion of the atomic element into a radioactive isotope of the atomic element. Upsets are measured for the binary states of the memory cells of the integrated circuit during a time period following the exposure to the neutron radiation. The atomic element is identified from the upsets of the binary states of the memory cells of the integrated circuit.

Abstract: Methods and systems are provided for determining a characteristic of an atomic particle affecting a programmable logic device (PLD). The PLD is configured to generate a value at one or more outputs. A source generates a packet of atomic particles. The departure from the source is indicated for the packet of the atomic particles. The PLD is impacted with the packet of the atomic particles. A change is detected in the value of one or more outputs of the PLD. The change in the value of the output or outputs is a result of the impact of the PLD by one of the atomic particles from the packet. A time interval is determined between the departure of the packet of the atomic particles from the source and the change in the value of the output or outputs.