Abstract: A confocal laser scanning microscope for examining a sample has a light source, which generates an illumination light beam, and a scanning unit which deflects the illumination light beam such that it optically scans the sample. A main beam splitter separates the illumination light beam from detection light emerging from the sample. The detection light separated from the illumination light beam passes at least partially through a detection pinhole diaphragm. At least two detector units detect the detection light passing through the detection pinhole diaphragm. An optical element is arranged in the beam direction between the detection pinhole diaphragm and the detector units and splits the detection light into at least two beam bundles and spectrally decomposes it within the beam bundles.

Abstract: A confocal laser scanning microscope for examining a sample has a light source, which generates an illumination light beam, and a scanning unit which deflects the illumination light beam such that it optically scans the sample. A main beam splitter separates the illumination light beam from detection light emerging from the sample. The detection light separated from the illumination light beam passes at least partially through a detection pinhole diaphragm. At least two detector units detect the detection light passing through the detection pinhole diaphragm. An optical element is arranged in the beam direction between the detection pinhole diaphragm and the detector units and splits the detection light into at least two beam bundles and spectrally decomposes it within the beam bundles.

Abstract: An arrangement and method are provided for determining the distance between an objective of a microscope and a sample examined with the microscope. Fitted on the objective or in the immediate vicinity of the objective is a capacitive sensor in whose measuring range the sample and/or a microscope slide supporting the sample is located or into which it can be brought. The sample and/or the slide causing a measurable change in the capacitance of the sensor. From the change in the capacitance of the sensor, the distance of the sample and/or of the microscope slide from the sensor is determined, and thus the distance of the sample from the objective. A capacitive distance sensor can be applied in such an arrangement by which a stray field can be generated between at least two electrodes. The capacitance experiences a measurable change owing to an object introduced into the stray field. The electrodes of the sensor are arranged as substantially coaxial lateral surfaces.

Abstract: A sample carrier (30) for microscopy, in particular for confocal microscopy, and a method for producing the sample carrier (30), are disclosed. The sample carrier (30) has a first coverslip (32) and a second coverslip (33). The second coverslip (33) carries an mirror (29) which is equipped in such a way that it surrounds a sample region (34). Also provided is a frame (35) that retains the first and the second coverslip (32 and 33). The coverslips located in the frame (35) form a cavity (38), that cavity (38) being filled with a medium which has approximately the same refractive index as the first and the second coverslip (32 and 33).

Abstract: A method for adjusting two objective lenses in a 4Pi system of a scanning microscope includes imaging a reference object in respective pupils of the objective lenses so as to form a respective Fourier image for each of the objective lenses from a respective image of the reference object. The respective Fourier images are brought into coincidence by moving at least one of the objective lenses relative to the other.

Abstract: A 4Pi microscope provided with an interferometer wherein two lenses (31, 33) are arranged in such a way that they are opposite to each other on different sides of a sample plane (35); also comprising an optical element (19) which is used to inject illuminating light (3) into the interferometer and/or used to discharge detection light (41) from the interferometer and to deflect a detection beam path, containing a reflecting means (51) which reflects illuminating light discharged by the optical element back into the interferometer and/or which allows detection light which is deflected onto the deflection beam to pass, also reflecting other discharged detection light which is not deflected onto the detection beam path into the interferometer.

Abstract: The invention concerns a fine tuning device for moving and/or tilting an object. The inventive fine tuning device is characterized in that a support element can rotate about an axis of rotation being guided by a guiding element. To provide tilting between the support element and the guide element, a guiding plane is defined which intersects the axis of rotation by an angle other than 90°; to provide displacement, the object is fixed on the support element with a lateral offset relative to the axis of rotation.

Abstract: An arrangement and method are provided for determining the distance between an objective of a microscope and a sample examined with the microscope. Fitted on the objective or in the immediate vicinity of the objective is a capacitive sensor in whose measuring range the sample and/or a microscope slide supporting the sample is located or into which it can be brought. The sample and/or the slide causing a measurable change in the capacitance of the sensor. From the change in the capacitance of the sensor, the distance of the sample and/or of the microscope slide from the sensor is determined, and thus the distance of the sample from the objective. A capacitive distance sensor can be applied in such an arrangement by which a stray field can be generated between at least two electrodes. The capacitance experiences a measurable change owing to an object introduced into the stray field. The electrodes of the sensor are arranged as substantially coaxial lateral surfaces.

Abstract: A method for adjusting two objective lenses in a 4Pi system of a scanning microscope includes imaging a reference object in respective pupils of the objective lenses so as to form a respective Fourier image for each of the objective lenses from a respective image of the reference object. The respective Fourier images are brought into coincidence by moving at least one of the objective lenses relative to the other.

Abstract: A 4Pi microscope provided with an interferometer wherein two lenses (31, 33) are arranged in such a way that they are opposite to each other on different sides of a sample plane (35); also comprising an optical element (19) which is used to inject illuminating light (3) into the interferometer and/or used to discharge detection light (41) from the interferometer and to deflect a detection beam path, containing a reflecting means (51) which reflects illuminating light discharged by the optical element back into the interferometer and/or which allows detection light which is deflected onto the deflection beam to pass, also reflecting other discharged detection light which is not deflected onto the detection beam path into the interferometer.

Abstract: A deflection means which is rotatably and/or pivotably mounted in a bearing which comprises a Ferrofluid. The deflection means is part of an adjustable beam deflection device for deflecting a light beam. The deflection means is rotatable and/or pivotable about several axes.

Abstract: A deflection means which is rotatably and/or pivotably mounted in a bearing which comprises a Ferrofluid. The deflection means is part of an adjustable beam deflection device for deflecting a light beam. The deflection means is rotatable and/or pivotable about several axes.

Abstract: A sample carrier (30) for microscopy, in particular for confocal microscopy, and a method for producing the sample carrier (30), are disclosed. The sample carrier (30) comprises a first coverslip (32) and a second coverslip (33). The second coverslip (33) carries an mirror (29) which is equipped in such a way that it surrounds a sample region (34). Also provided is a frame (35) that retains the first and the second coverslip (32 and 33). The coverslips located in the frame (35) form a cavity (38), that cavity (38) being filled with a medium which has approximately the same refractive index as the first and the second coverslip (32 and 33).

Abstract: The invention proposes a method for the optimization of the interferometric examination of scattering objects, wherein intensity-modulated light is divided, one beam is directed into an object and the other beam is directed to a reference mirror, the reflected light is guided to a detector module, where it is converted to an interference signal and this signal is evaluated. The method is characterized by the fact that light of at least two different central wavelengths is irradiated and the converted interference signals of both central wavelengths are phase-shifted in order to compensate for their expected dispersion.