Abstract: A method for compensating for an error function is disclosed, wherein a field device has a sensor unit. The method includes transferring properties of the sensor unit to the field device. The properties contain information regarding process variables collected by the sensor unit. The method includes transferring the device status of the field device or the sensor unit to a plurality of field devices, and establishing a substitution system, wherein the properties of the sensor unit and the device status are known to the plurality of field devices, and the field devices independently determine which process variable of a sensor unit can substitute a process variable of another sensor unit with a predetermined degree of accuracy. The method also includes transferring the substitute variable to the higher-level unit in the event that at least one predetermined device status of a field device or a sensor unit arises.

Abstract: The invention relates to an apparatus for the calibration of a thermometer in situ, wherein the apparatus has a temperature sensor (S) for determining a temperature (T); wherein a reference element (K) is provided for calibrating the temperature sensor (S); wherein the reference element (K) at least partially comprises a ferroelectric material (D), which experiences a phase transformation at at least one predetermined temperature (TPh) in a temperature range relevant for calibrating the temperature sensor (S).

Abstract: The invention relates to an apparatus for the calibration of a thermometer in situ, wherein the apparatus has a temperature sensor (S) for determining a temperature (T); wherein a reference element (K) is provided for calibrating the temperature sensor (S); wherein the reference element (K) at least partially comprises a ferroelectric material (D), which experiences a phase transformation at at least one predetermined temperature (TPh) in a temperature range relevant for calibrating the temperature sensor (S).

Abstract: The invention relates to an apparatus for the calibration of a thermometer in situ, wherein the apparatus has a temperature sensor (S) for determining a temperature (T); wherein a reference element (K) is provided for calibrating the temperature sensor (S); wherein the reference element (K) at least partially comprises a ferroelectric material (D), which experiences a phase transformation at least one predetermined temperature (TPh) in a temperature range relevant for calibrating the temperature sensor (S).

Abstract: A resistance temperature sensor with a first temperature sensor element and a second temperature sensor element, wherein the first temperature sensor element comprises a first measuring path and the second temperature sensor element a second measuring path, wherein the first and the second measuring paths extend on a substrate, wherein the substrate has an anisotropic thermal expansion with at least two mutually differing expansion directions (a, c), and wherein a projection of the first measuring path on the expansion directions (a) differs from a projection of the second measuring path on the expansion directions (c).

Abstract: A resistance temperature sensor with a first temperature sensor element and a second temperature sensor element, wherein the first temperature sensor element comprises a first measuring path and the second temperature sensor element a second measuring path, wherein the first and the second measuring paths extend on a substrate, wherein the substrate has an anisotropic thermal expansion with at least two mutually differing expansion directions (a, c), and wherein a projection of the first measuring path on the expansion directions (a) differs from a projection of the second measuring path on the expansion directions (c).

Abstract: The invention relates to an apparatus for the calibration of a thermometer in situ, wherein the apparatus has a temperature sensor (S) for determining a temperature (T); wherein a reference element (K) is provided for calibrating the temperature sensor (S); wherein the reference element (K) at least partially comprises a ferroelectric material (D), which experiences a phase transformation at least one predetermined temperature (TPh) in a temperature range relevant for calibrating the temperature sensor (S).

Abstract: A resistance temperature sensor with a first temperature sensor element and a second temperature sensor element, wherein the first temperature sensor element comprises a first measuring path and the second temperature sensor element a second measuring path, wherein the first and the second measuring paths extend on a substrate, wherein the substrate has an anisotropic thermal expansion with at least two mutually differing expansion directions (a, c), and wherein a projection of the first measuring path on the expansion directions (a) differs from a projection of the second measuring path on the expansion directions (c).

Abstract: A test method and a test device for testing an integrated circuit are configured to allow for a test device which dispenses with the hardware provision of the boundary scan cells in the device. For this purpose, the boundary scan cells are reproduced by way of a boundary scan program. All functionalities of the chain of boundary scan cells and the TAP interface are fulfilled by the use of the boundary scan program, which is executed by a program-controlled control device that is controlled by the integrated circuit.