Abstract: The present disclosure relates to methods and apparatuses for sensing distortions in patterns of reflected light to create profiles representing surface topographies of absorbent structures during the manufacture of absorbent articles. Inspection systems may include sensors arranged adjacent an advancing absorbent structure on a converting line. In turn, a controller may monitor and affect various operations on the converting line. The inspection systems herein may also include a radiation source that illuminates a surface of an absorbent structure with a predetermined pattern of light extending in the cross direction CD. The sensor senses distortions in patterns of light reflected from the illuminated surface of the absorbent structure and triangulates changes in elevation of the illuminated surface of the absorbent structure relative to the sensor.

Abstract: The present disclosure relates to methods and apparatuses sensing emitted light caused by fluorescence of adhesive to determine characteristics of absorbent structures during the manufacture of absorbent articles. Some absorbent articles may have absorbent structures that include an absorbent core disposed between a topsheet and a backsheet. And one or more of the absorbent structure components may be assembled with adhesive that fluoresces when excited by ultraviolet light. Aspects of the present methods relate to an inspection system that may be configured to interact with, monitor, and/or control a converting line. The inspection system may include a radiation source that illuminates a surface of an absorbent structure with ultraviolet light. A sensor may be adapted to receive light caused by fluorescence of the adhesive while being irradiated with the ultraviolet light. In turn, the inspection system may determine characteristics of the absorbent structure based on the detected emitted light.

Abstract: The present disclosure relates to methods and apparatuses for sensing distortions in patterns of reflected light to create profiles representing surface topographies of absorbent structures during the manufacture of absorbent articles. Inspection systems may include sensors arranged adjacent an advancing absorbent structure on a converting line. In turn, a controller may monitor and affect various operations on the converting line. The inspection systems herein may also include a radiation source that illuminates a surface of an absorbent structure with a predetermined pattern of light extending in the cross direction CD. The sensor senses distortions in patterns of light reflected from the illuminated surface of the absorbent structure and triangulates changes in elevation of the illuminated surface of the absorbent structure relative to the sensor.