Patents by Inventor Reza Taheri
Reza Taheri has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20170353534Abstract: The current document is directed to virtualized PMUs provided by virtualization layers. The currently disclosed virtualized PMUs are decoupled from the underlying PMU hardware features of processors on which the virtualization layer executes. The decoupling is achieved, in part, by time multiplexing the underlying hardware PMU registers to provide a greater number of virtualized PMU registers than the number of hardware-PMU registers provided by at least some of the underlying hardware PMUs. The decoupling is also achieved by providing for monitoring, by the virtualized PMU registers, of computed processor events and approximated processor events in addition to the processor events monitored by the underlying hardware PMUs.Type: ApplicationFiled: August 25, 2017Publication date: December 7, 2017Applicant: VMware, Inc.Inventors: Reza Taheri, Kalyan Saladi, Daniel Michael Hecht, Jin Heo, Jeffrey Buell
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Patent number: 9756118Abstract: The current document is directed to virtualized PMUs provided by virtualization layers. The currently disclosed virtualized PMUs are decoupled from the underlying PMU hardware features of processors on which the virtualization layer executes. The decoupling is achieved, in part, by time multiplexing the underlying hardware PMU registers to provide a greater number of virtualized PMU registers than the number of hardware-PMU registers provided by at least some of the underlying hardware PMUs. The decoupling is also achieved by providing for monitoring, by the virtualized PMU registers, of computed processor events and approximated processor events in addition to the processor events monitored by the underlying hardware PMUs.Type: GrantFiled: April 28, 2014Date of Patent: September 5, 2017Assignee: VMware, Inc.Inventors: Reza Taheri, Kalyan Saladi, Daniel Michael Hecht, Jin Heo, Jeffrey Buell
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Publication number: 20150378762Abstract: The current document is directed to methods and systems for monitoring the performance of memory management in virtual machines. By accurately measuring the performance of memory management in virtual machines, a virtualization layer can dynamically reconfigure virtual machines to use more optimal memory-management methods, intelligently schedule execution of virtual machines to increase memory-management performance, and migrate virtual machines among different servers and computer systems to increase memory-management performance.Type: ApplicationFiled: June 30, 2014Publication date: December 31, 2015Applicant: VMware, Inc.Inventors: Kalyan Saladi, Reza Taheri, Daniel Michael Hecht, Jin Heo, Jeffrey Buell
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Publication number: 20150312116Abstract: The current document is directed to virtualized PMUs provided by virtualization layers. The currently disclosed virtualized PMUs are decoupled from the underlying PMU hardware features of processors on which the virtualization layer executes. The decoupling is achieved, in part, by time multiplexing the underlying hardware PMU registers to provide a greater number of virtualized PMU registers than the number of hardware-PMU registers provided by at least some of the underlying hardware PMUs. The decoupling is also achieved by providing for monitoring, by the virtualized PMU registers, of computed processor events and approximated processor events in addition to the processor events monitored by the underlying hardware PMUs.Type: ApplicationFiled: April 28, 2014Publication date: October 29, 2015Applicant: VMware, Inc.Inventors: Reza Taheri, Kalyan Saladi, Daniel Michael Hecht, Jin Heo, Jeffrey Buell
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Patent number: 5926266Abstract: Apparatus for inspecting the surface of a sample includes a wide scanning interferometer, which is used to locate defects, or anomalies in the surface, and a narrow scanning interferometer, which is used to develop profiles of individual defects found by the narrow scanning interferometer. The sample may be driven in rotation about an axis, while the interferometers are independently moved radially to the axis.Type: GrantFiled: September 23, 1996Date of Patent: July 20, 1999Assignee: International Business Machines CorporationInventors: Alan D. Dorundo, Michael Gerard Lisanke, Huizong Lu, Richard J. McCormick, Lanphuong Thi Pena, Eric V. Schnetzer, Ali Reza Taheri
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Patent number: 5822211Abstract: A disk texturing process uses a single pulsed laser to texture disks within a first group, which are carried through the texturing process on a first spindle assembly, and from a second group, which are carried through the texturing process on a second spindle assembly. Preferably, disks from the first group are textured alternately with disks in the second group. A first level of least one texturing parameter is stored for use only as the process is applied to disks from the first group, while a second level of the same texturing parameter is stored for use only as the process is applied to disks from the second group. These levels may be derived from measurements of textured spots made with interferometric devices forming portions of a texturing station.Type: GrantFiled: November 13, 1996Date of Patent: October 13, 1998Assignee: International Business Machines CorporationInventors: Michael Barenboim, Peter Michael Baumgart, Peter P. Chrusch, Benny Michael Harper, Benjamin Kami, Pieter J. M. Kerstens, Michael Gerard Lisanke, Huizong Lu, Lanphuong Thi Pena, Eric V. Schnetzer, Hong S. Seing, Ali Reza Taheri, Andrew Ching Tam
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Patent number: 5784163Abstract: An interferometer forms a pair of projected sub-beams by decomposing a single coherent, linearly-polarized beam. These sub-beams are focussed by an objective lens onto a pair of test spots on a test surface. The reflections of these sub-beams are recombined to form an elliptically polarized return beam, which is broken into return sub-beams of opposing polarities in a polarizing beam splitter. The intensities of these return sub-beams are used to calculate a difference in height between the two test spots. When these test spots are aligned along a path of relative motion with the test surface, the resulting differences in height are added to form an accumulative profile of the test surface.Type: GrantFiled: September 23, 1996Date of Patent: July 21, 1998Assignee: International Business Machines CorporationInventors: Huizong Lu, Ali Reza Taheri
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Patent number: 5710631Abstract: An interferometer is used to locate and examine defects in a test surface of a test specimen. Defects are first located as the test surface is driven past the objective of the interferometer at a constant speed, with a darkfield interferogram being examined as it flows across a row of CCD elements. During this process, the location of each defect is stored. Next, the test specimen is sequentially moved into the locations at which static measurements are made using an area array of CCD elements. During these measurements, the phase angle relationship of the interferometer is varied so that heights of surface segments may be calculated. If some to these segments are located more than a quarter wave length of the interferometer light source from the surface at which the darkfield is established, a process is used to perform height corrections for segments within transition boundaries.Type: GrantFiled: January 27, 1997Date of Patent: January 20, 1998Assignee: International Business Machines CorporationInventors: Akram Aref Bou-Ghannam, Alan David Dorundo, Michael Gerard Lisanke, Huizong Lu, Lanphuong Thi Pena, Ali Reza Taheri, Samuel Sheung-Lok So, Kenneth Wayne Watts, Darell Smith Whitaker
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Patent number: 5703684Abstract: A glide height tester for inspecting a surface of a spinning magnetic disk includes a glide plate, which is mounted to pivot above the disk surface. A reflective surface fastened to the glide plate is imaged by interferometric apparatus which produces a calculated output indicating a first angle of the glide plate. The interferometric apparatus includes a Wollaston prism, which can be rotated 90-degrees to provide an output indicating a second angle of the glide plate, perpendicular to the first angle.Type: GrantFiled: September 23, 1996Date of Patent: December 30, 1997Assignee: International Business Machines CorporationInventors: Huizong Lu, Ali Reza Taheri
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Patent number: 5699160Abstract: Inspection apparatus for determining the profile of textured spots extending in a pattern along a surface of a magnetic disk includes an interferometer which illuminates first and second, adjacently disposed test spots on the surface. The disk and the interferometer are moved, relative to one another, so that one of the test spots traverses the textured spots in the pattern while the other test spot is moved along a flat portion of the disk surface. In one embodiment, the inspection apparatus is built into the device forming the textured spots, providing feedback controlling the texturing process.Type: GrantFiled: September 23, 1996Date of Patent: December 16, 1997Assignee: International Business Machines CorporationInventors: Michael Barenboim, Peter Michael Baumgart, Peter P. Chrusch, Benny Michael Harper, Benjamin Karni, Pieter J. M. Kerstens, Michael Gerard Lisanke, Hong S. Seing, Huizong Lu, Lanphuong Thi Pena, Ali Reza Taheri, Andrew Ching Tam