Patents by Inventor Richard C. Knepfle

Richard C. Knepfle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of aligning probe for eddy current inspection
    Patent number: 7657389
    Abstract: A system and method using a touch probe device for eddy current inspection. The touch probe provides a simple approach for coming within close contact of the specimen while maintaining a normal angle and pressure at the right positions. The use of the touch probe further reduces the total time for the eddy current inspection. The touch probe aligns the probe to a specimen to be inspected, for the purpose of reducing measurement errors and increasing productivity.
    Type: Grant
    Filed: August 23, 2006
    Date of Patent: February 2, 2010
    Assignee: General Electric Company
    Inventors: Ui W. Suh, Richard C. Knepfle
  • Seafood Utensil
    Publication number: 20080229586
    Abstract: A seafood utensil functioning as both a seafood fork and cutting tool, the seafood utensil including a grip portion operably configured for gripping between the thumb and forefinger of a diner, a first tine including a pivot operably configured to function as a fulcrum when cutting shellfish, and a second tine including an edge operably configured to cut through shellfish, the first tine and the second tine being in spaced apart relation.
    Type: Application
    Filed: March 21, 2007
    Publication date: September 25, 2008
    Inventors: Richard C. Knepfle, David Olmutz, Candace Paul, Gary Waters
  • METHOD OF ALIGNING PROBE FOR EDDY CURRENT INSPECTION
    Publication number: 20070244659
    Abstract: A system and method using a touch probe device for eddy current inspection. The touch probe provides a simple approach for coming within close contact of the specimen while maintaining a normal angle and pressure at the right positions. The use of the touch probe further reduces the total time for the eddy current inspection. The touch probe aligns the probe to a specimen to be inspected, for the purpose of reducing measurement errors and increasing productivity.
    Type: Application
    Filed: August 23, 2006
    Publication date: October 18, 2007
    Applicant: General Electric Company
    Inventors: Ui Won Suh, Richard C. Knepfle