Abstract: An improved user interface for use with systems that display images. The interface allows easy control over the appearance of images. The user interface allows motion of a single input device to control at least two parameters of an image mapping. The controls impact the appearance of the image in real time. An operator may use the interface to optimize the appearance of a region of the image. The invention is described in connection with a contraband detection system that includes a touch screen input device. Images formed by the inspection systems are mapped to a display, with parameters provided through the touch screen controlling the mapping. The interface is employed to control the contrast of the image displayed for the operator. The value of one parameter obtained through the interface controls an intensity level at which the contrast mapping is nonlinear. The value of the second parameter obtained through the interface controls the amount of the nonlinearity.

Abstract: Various novel apparatuses and methods for generating X-rays are disclosed. In some embodiments, for example, an apparatus may be configured and arranged so that, for at least one interception point on a particular portion of a scan path on a surface of a target along which a steering element steers an accelerated electron beam (e-beam), both an angle and its complement between a line corresponding to a direction in which the accelerated e-beam is traveling at the interception point and a line oriented normal to the surface of the target at such interception point are greater than forty five degrees.

Abstract: A system may comprise a cathode, a target, one or more switches, and a conductive element. The cathode may be configured and arranged to generate an electron beam, and the target may be configured and arranged to emit radiation when electrons in the electron beam impact the target after being accelerated by an energy source. The one or more switches may be configured and arranged to apply either a first voltage or a second voltage from a power supply between the cathode and the target. The conductive element may be disposed between the cathode and the target so as to inhibit the electron beam generated by the cathode from reaching the target when a signal is applied to the conductive element.

Abstract: An apparatus may comprise a frame supporting at least first and second skewed radiation sources and at least first and second radiation detectors. The first and second radiation detectors may be substantially non-contiguous such that a substantial gap exists between the first and second radiation detectors that is free of any radiation detectors. Each of the first and second radiation detectors may also configured and arranged to detect radiation emitted by each of the first and second skewed radiation sources.

Abstract: A method for operating an inspection system is disclosed in which an item under inspection may be moved in a first direction relative to and at least partially between at least one radiation source and at least some radiation detectors illuminated by the at least one radiation source. The radiation source and detectors may be operated such that ray paths extending linearly between the at least one radiation source and at least some of the radiation detectors form acute angles with respect to a plane having a normal direction coinciding with the first direction that are substantially in excess of three degrees. Data accumulated by the radiation detectors may be processed to form a three-dimensional tomographic data image of at least a portion of the item under inspection.

Abstract: An inspection system that forms material sensitive X-ray images of items under inspection. The images are decomposed into basis function images using basis functions representative of materials of interest. The decomposed images may be processed separately to detect concentrations of a material of interest corresponding to one or more of the basis functions. When operated in this mode, the inspection system may be used in applications such as material sorting or security screening. At least one basis function is selected to distinguish a material of interest from other materials likely contained with the item, allowing one of the basis function images to be analyzed to obtain information about a specific material of interest. The images may be automatically analyzed or may be superimposed for display with different visual characteristics assigned to the components associated with each basis function for analysis by a human operator.

Abstract: A security system for detecting contraband such as explosives. The system has a source of radiation and a detector array. A detector array is made of many small detectors, each with a fast response time. The fast response time allows individual radiation photon interactions with each detector to be counted. By counting the number of interactions in an interval of time, the amount of radiation reaching the detector can be measured. The magnitude of the response from the detector to each radiation interaction allows measurement of the energy level of the photons interacting with the detector. Such a system provides significant flexibility in analyzing data collected from items under inspection. For example, objects such as contraband can be identified within the item under inspection by processing the data to accurately determine both the density and type of material.

Abstract: In one aspect, an x-ray scanning device is provided. The x-ray scanning device comprises a target adapted to convert electron-beam (e-beam) energy into x-ray energy, a detector array positioned to detect at least some x-rays emitted from the target, and a conveyer mechanism adapted to convey items to be inspected through an inspection region formed by the target and the detector array, wherein the target and the detector array are rotated out of alignment with each other such that x-rays emitted from the target impinge on diametrically positioned detectors of the detector array without passing through near-side detectors of the detector array.

Abstract: A radiation (e.g., X-ray) source and collimator assembly with no moving parts provides a swept-line scan of radiation suitable for imaging or analyzing radiation scattered from an object. Scatter radiation is sensed by (e.g., scintillation devices) to produce a signal which is then able to be processed to produce an image, or to be analyzed.

Abstract: An inspection system having a user friendly operator display. Characteristics of items under inspection are represented in the display by color and brightness. Each pixel on the display is assigned an intensity representation of a first characteristic of a region of an item, such as density. Color is assigned to each pixel based on anther characteristic of the regions, such as atomic number. The intensity assigned to each pixel in the display is based in part on the color assigned to that pixel so that each pixel representing the same value of the first characteristic will appear to a human with the same brightness, regardless of the color assigned to the pixels. Such a display is used in an x-ray inspection system to represent attenuation of x-rays by brightness and effective atomic number by color.

Abstract: A contraband detection system using a cone beam computed tomography scanner. The cone beam scanner allows for rapid acquisition of data for computing three dimensional density maps of objects within items under inspection. Where greater resolution is desired, the image information obtained with the cone beam computed tomography scanner may be combined with higher resolution images formed with a single view scanner. A multi-energy single view scanner may be used to additionally provide information on the effective atomic number of objects contained within items under inspection. Additionally, information obtained with the cone beam computed tomography scanner may be used to increase the accuracy of the computation of the effective atomic number of objects within the item under inspection.

Abstract: A method or apparatus for analyzing an object includes an X-ray prescanner that performs a prescan of the object to determine prescan information about the object. Then, a CT scanner performs a CT scan on at least one plane of the object based on the prescan information to determine CT information. In one embodiment, if the CT scan of the object includes or is in the vicinity of metal, then metal artifact correction of a reconstructed image from the CT scan is performed based on the prescan information.

Abstract: A method or apparatus for analyzing an object includes an X-ray prescanner that performs a prescan of the object to determine prescan information about the object. Then, a CT scanner performs a CT scan on at least one plane of the object based on the prescan information to determine CT information. In one embodiment, if the CT scan of the object includes or is in the vicinity of metal, then metal artifact correction of a reconstructed image from the CT scan is performed based on the prescan information.

Abstract: A method or apparatus for analyzing an object includes an X-ray prescanner that performs a prescan of the object to determine prescan information about the object. Then, a CT scanner performs a CT scan on at least one plane of the object based on the prescan information to determine CT information. In one embodiment, if the CT scan of the object includes or is in the vicinity of metal, then metal artifact correction of a reconstructed image from the CT scan is performed based on the prescan information.