Patents by Inventor Richard Hebel

Richard Hebel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11275069
    Abstract: Disclosed is an inspection system having a background positioned adjacent an inspection zone; and an image capturing device configured to receive background electromagnetic radiation (EMR) from the background and from the inspection zone, the inspection zone being configured and arranged to receive material for transport into the inspection zone; wherein the background has a background property defined by a background emission, a background absorbance, and a background reflectance, the background property being matched in EMR to a material EMR of material to be transported into the inspection zone, the material having a material property defined by a material emission, a material absorbance, and a material reflectance; and wherein the image capturing device is configured to detect a foreign object within material when transported into the inspection zone by deducting the background EMR from the material EMR.
    Type: Grant
    Filed: July 10, 2019
    Date of Patent: March 15, 2022
    Assignee: METTLER-TOLEDO, LLC
    Inventors: Gary Joyce, Richard Hebel
  • Publication number: 20210010987
    Abstract: Disclosed is an inspection system having a background positioned adjacent an inspection zone; and an image capturing device configured to receive background electromagnetic radiation (EMR) from the background and from the inspection zone, the inspection zone being configured and arranged to receive material for transport into the inspection zone; wherein the background has a background property defined by a background emission, a background absorbance, and a background reflectance, the background property being matched in EMR to a material EMR of material to be transported into the inspection zone, the material having a material property defined by a material emission, a material absorbance, and a material reflectance; and wherein the image capturing device is configured to detect a foreign object within material when transported into the inspection zone by deducting the background EMR from the material EMR.
    Type: Application
    Filed: July 10, 2019
    Publication date: January 14, 2021
    Applicant: Mettler-Toledo LLC
    Inventors: Gary Joyce, Richard Hebel