Abstract: The invention relates to apparatus and methods for automated tissue sectioning, including slicing and transferring a tissue section to a slide. The invention also relates to automated systems and methods for transferring a tissue section onto a slide using an adhesive strip.

Abstract: This invention relates to apparatus and methods for transferring a tissue section to a slide. The invention also relates to automated systems and methods for transferring a tissue section onto a slide using a bath at ambient temperature and for smoothly mounting a tissue section on a slide.

Abstract: The present invention includes an apparatus and method that facilitates the manual sorting of slides into slide folders. The apparatus includes a horizontal display surface and a controller configured to receive slides and folders into which the slides are to be placed (or sorted). The controller operates components of the apparatus to selectively illuminate the display surface to guide a user in placing folders at multiple folder locations and in sorting the slides into the folders. In one aspect of the invention, the apparatus is configured to allow multiple folders to be stacked at a folder location during the slide sorting process. In these aspects, the apparatus is configured to determine number of folders stacked at each folder location.

Abstract: The present invention includes an apparatus and method that facilitates the manual sorting of slides into slide folders. The apparatus includes a horizontal display surface and a controller configured to receive slides and folders into which the slides are to be placed (or sorted). The controller operates components of the apparatus to selectively illuminate the display surface to guide a user in placing folders at multiple folder locations and in sorting the slides into the folders. In one aspect of the invention, the apparatus is configured to allow multiple folders to be stacked at a folder location during the slide sorting process. In these aspects, the apparatus is configured to determine number of folders stacked at each folder location.

Abstract: An atomic force microscope (AFM) system comprises a cantilever arm attached to a probe tip. The system controls a height of the cantilever arm to press the probe tip against a sample and then separate the probe tip from the sample, to detect a disturbance of the cantilever arm after the separation of the probe tip from the surface, and to engage active damping of the cantilever arm to suppress the disturbance.

Abstract: An atomic force microscope (AFM) system comprises a cantilever arm attached to a probe tip. The system controls a height of the cantilever arm to press the probe tip against a sample and then separate the probe tip from the sample, to detect a disturbance of the cantilever arm after the separation of the probe tip from the surface, and to engage active damping of the cantilever arm to suppress the disturbance.

Abstract: Linear PID controllers have a transfer function that resembles the frequency response of a notch filter. The PID parameters, KP, KI, and KD (proportional, integral, and derivative gains, respectively) can be extracted from the parameters of a linear notch filter. The linearized modes of scanning probe microscope (SPM) actuators have frequency responses that resemble those of simple second order resonance. Reasonable feedback control can be achieved by an inverse dynamics model of the resonance. A properly parameterized notch filter can cancel the dynamics of a resonance to give good closed-loop response.

Abstract: In accordance with the invention, a computer pointing device is interfaced with an SPM system to provide real time control of the SPM and improve the ease of use.

Abstract: Linear PID controllers have a transfer function that resembles the frequency response of a notch filter. The PID parameters, KP, KI, and KD (proportional, integral, and derivative gains, respectively) can be extracted from the parameters of a linear notch filter. The linearized modes of scanning probe microscope (SPM) actuators have frequency responses that resemble those of simple second order resonance. Reasonable feedback control can be achieved by an inverse dynamics model of the resonance. A properly parameterized notch filter can cancel the dynamics of a resonance to give good closed-loop response.

Abstract: In accordance with the invention, the spring constant of a scanning probe microscope cantilever mechanically coupled to a microelectromechanical system (MEMS) actuator may be determined in-situ using a frequency resonance method.

Abstract: In accordance with the invention, the spring constant of a scanning probe microscope cantilever mechanically coupled to a MEMs actuator may be determined in-situ by application of a force to the scanning probe microscope cantilever.

Abstract: In accordance with the invention, a computer pointing device is interfaced with an SPM system to provide real time control of the SPM and improve the ease of use.

Abstract: In accordance with the invention, the spring constant of a scanning probe microscope cantilever mechanically coupled to a MEMs actuator may be determined in-situ using a displacement method.

Abstract: In accordance with the invention, the spring constant of a scanning probe microscope cantilever mechanically coupled to a MEMs actuator may be determined in-situ by application of a force to the scanning probe microscope cantilever.

Abstract: In accordance with the invention, the spring constant of a scanning probe microscope cantilever mechanically coupled to a microelectromechanical system (MEMS) actuator may be determined in-situ using a frequency resonance method.