Abstract: A method of metrology target design is described. The method includes determining a sensitivity of a parameter for a metrology target design to an optical aberration, determining the parameter for a product design exposed using an optical system of a lithographic apparatus, and determining an impact on the parameter of the metrology target design based on the parameter for the product design and the product of the sensitivity and one or more of the respective aberrations of the optical system.

Abstract: A method for tracking high-level source attribution of a generated assembly language code includes: receiving commands for compiling or linking a high-level language code; analyzing the received commands to determine whether a command is a compiler command for compiling the high-level language code or a link command for linking the low level object code; when the command is a compiler command: generating assembly language code by compiling the high-level language code, parsing the generated assembly language code to generate an internal representation for the assembly language code, storing the internal representation in a computer memory; and generating associated linker input artifacts for linking; when the command is a link command: updating the internal representation with the associated linker input artifacts; and generating a report file from the updated internal representation.

Abstract: A system and methods for a self-rotating fluidic traverse actuator are presented. A turbine rotates in response to a fluid flow, and an outer cylinder with a longitudinal slot that ejects the fluid flow. An inner cylinder rotates inside the outer cylinder in response to a rotation of the turbine and at least one helical slot of the inner cylinder ejects the fluid flow into the longitudinal slot.

Abstract: A method of metrology target design is described. The method includes determining a sensitivity of a parameter for a metrology target design to an optical aberration, determining the parameter for a product design exposed using an optical system of a lithographic apparatus, and determining an impact on the parameter of the metrology target design based on the parameter for the product design and the product of the sensitivity and one or more of the respective aberrations of the optical system.

Abstract: A method of metrology target design is described. The method includes determining a sensitivity of a parameter for a metrology target design to an optical aberration, determining the parameter for a product design exposed using an optical system of a lithographic apparatus, and determining an impact on the parameter of the metrology target design based on the parameter for the product design and the product of the sensitivity and one or more of the respective aberrations of the optical system.

Abstract: Methods and systems for automatically generating robust metrology targets which can accommodate a variety of lithography processes and process perturbations. Individual steps of an overall lithography process are modeled into a single process sequence to simulate the physical substrate processing. That process sequence drives the creation of a three-dimensional device geometry as a whole, rather than “building” the device geometry element-by-element.

Abstract: A wrist strap for the barrel of a firearm includes a strap having a first end and a second end. The strap has a loop at the first end. The second end of the strap is configured to be attached to the barrel of the firearm. Wherein, the loop is configured for a user to insert their hand and utilize their wrist for stabilizing and/or controlling the barrel of the firearm. Whereby, the strap provides increased stability and/or control of the barrel of the firearm.

Abstract: Isolation structures for isolating semiconductor devices from a substrate include floor isolation regions buried within the substrate and one or more trenches extending from a surface of the substrate to the buried floor isolation region.

Abstract: An isolation structure formed in a semiconductor substrate of a first conductivity type includes a floor isolation region of a second conductivity type opposite to the first conductivity type submerged in the substrate. A first trench extends downward from a surface of the substrate and overlaps onto the floor isolation region. The first trench includes walls lined with a dielectric material and contains a conductive material. The first trench and the floor isolation region electrically isolate a pocket of the first conductivity type from the substrate.

Abstract: An isolation structure formed in a semiconductor substrate of a first conductivity type includes a region of a second conductivity type opposite to the first conductivity type. The region of the second conductivity type is saucer-shaped and has a floor portion substantially parallel to the top surface of the substrate and a sloped sidewall portion. The sloped sidewall portion extends downward from the top surface of the substrate at an oblique angle and merges with the floor portion. The floor portion and the sloped sidewall portion together form an isolated pocket of the substrate.

Abstract: A bandage with an integrated, wireless, transcutaneous electrical neuron-stimulation (TENS) device, and method of using the same. The integrated bandage and TENS device provides electric stimulation to an anatomical site that is covered by the bandage. The bandage includes controls that enable the user to control the intensity levels of the electric stimulation, which is provided through at least one electrode. The electrical circuit in the TENS device provides biphasic or monophasic sequence of pulses to the electrodes, and the sequence of pulses form a plurality of waveforms available for specific clinical needs.

Abstract: A method for preparing a pigment composition for a plastics colorant is disclosed. The pigment composition is prepared by mixing a press cake of the pigment with a liquid containing a selected type of dispersant before the resulting slurry is dried. Thus prepared pigment composition has improved dispersibility in a thermoplastic or thermoset resin and greatly reduces the filter pressure rise in the molding systems for preparing masterbatches or various plastic compositions for molding, fiber, film and sheet.

Abstract: A method of metrology target design is described. The method includes determining a sensitivity of a parameter for a metrology target design to an optical aberration, determining the parameter for a product design exposed using an optical system of a lithographic apparatus, and determining an impact on the parameter of the metrology target design based on the parameter for the product design and the product of the sensitivity and one or more of the respective aberrations of the optical system.

Abstract: A positioning system and method for determining a position of a machine are disclosed. The system may have an optical sensing device configured to generate determined shape data associated with a portion of the worksite at the position of the machine. The system may have a first signal device configured to transmit a radio frequency signal and receive a response signal. The system may have a second signal configured to receive the transmitted radio frequency signal and transmit the response signal. The system may have a controller in communication with the optical sensing device and at least one of the first and second signal devices. The controller may be configured to determine an approximate position based on the radio frequency signal and the response signal, identify a reference shape data corresponding to the determined shape data, and determine the position based on the approximate position and the reference shape data.

Abstract: A positioning system and method for determining a position of a machine are disclosed. The system may have an optical sensing device configured to generate determined shape data associated with a portion of the worksite at the position of the machine. The system may have a first signal device configured to transmit a radio frequency signal and receive a response signal. The system may have a second signal configured to receive the transmitted radio frequency signal and transmit the response signal. The system may have a controller in communication with the optical sensing device and at least one of the first and second signal devices. The controller may be configured to determine an approximate position based on the radio frequency signal and the response signal, identify a reference shape data corresponding to the determined shape data, and determine the position based on the approximate position and the reference shape data.

Abstract: Isolation structures for isolating semiconductor devices from a substrate include floor isolation regions buried within the substrate and one or more trenches extending from a surface of the substrate to the buried floor isolation region.

Abstract: An LED driver IC for driving external strings of LEDs comprises a prefix register and a data register connected in series with each other and with the prefix and data registers in other driver ICs. The prefix and data registers of the driver ICs are connected in a daisy chain arrangement with an interface IC. The interface IC loads data identifying a functional latch into the prefix register and data defining a functional condition into the data register of each driver IC. The data in the data register is then transferred to the functional latch to control the functional condition within the LED driver IC.

Abstract: A tool coupler for connecting a machine to a tool is disclosed. The tool coupler may have a first frame module having a first pair of side plates and a pair of aligned bores passing through the first pair of side plates. The aligned bores may be configured to receive pins that are connectable to a linkage of the machine. The tool coupler may also have a second frame module releasably attached to the first frame module. The second frame module may have a second pair of side plates and a pair of hooks fixedly connected to the second pair of side plates. The pair of hooks may be configured to receive corresponding pins that are connectable to the tool.

Abstract: An LED driver IC for driving external strings of LEDs comprises a prefix register and a data register connected in series with each other and with the prefix and data registers in other driver ICs. The prefix and data registers of the driver ICs are connected in a daisy chain arrangement with an interface IC. The interface IC loads data identifying a functional latch into the prefix register and data defining a functional condition into the data register of each driver IC. The data in the data register is then transferred to the functional latch to control the functional condition within the LED driver IC.

Abstract: An LED driver IC for driving external strings of LEDs comprises a prefix register and a data register connected in series with each other and with the prefix and data registers in other driver ICs. The prefix and data registers of the driver ICs are connected in a daisy chain arrangement with an interface IC. The interface IC loads data identifying a functional latch into the prefix register and data defining a functional condition into the data register of each driver IC. The data in the data register is then transferred to the functional latch to control the functional condition within the LED driver IC.