Patents by Inventor Richard Lloyd Trantow

Richard Lloyd Trantow has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Molded eddy current array probe
    Patent number: 6812697
    Abstract: The present invention provides an eddy current array probe having a complaint body molded around a rigid insert. A flexible eddy current array circuit is wrapped around the outer surface of the compliant body.
    Type: Grant
    Filed: September 24, 2002
    Date of Patent: November 2, 2004
    Assignee: General Electric Company
    Inventors: William Stewart McKnight, Shridhar Champaknath Nath, Sandie Elizabeth Gresham, Richard Lloyd Trantow, Douglas Edward Ingram, John William Ertel, Thomas James Batzinger, Curtis Wayne Rose, Francis Howard Little
  • Molded eddy current array probe
    Publication number: 20040056656
    Abstract: The present invention provides an eddy current array probe having a complaint body molded around a rigid insert. A flexible eddy current array circuit is wrapped around the outer surface of the compliant body.
    Type: Application
    Filed: September 24, 2002
    Publication date: March 25, 2004
    Applicant: General Electric Company
    Inventors: William Stewart McKnight, Shridhar Champaknath Nath, Sandie Elizabeth Gresham, Richard Lloyd Trantow, Douglas Edward Ingram, John William Ertel, Thomas James Batzinger, Curtis Wayne Rose, Francis Howard Little
  • Eddy current inspection probe
    Patent number: 6563307
    Abstract: An eddy current inspection probe for inspecting a preselected surface. The eddy current inspection probe includes an expandable element at least partially defining an interior space which is expandable by introducing a pressurized fluid into the interior space from a collapsed position to an expanded position for contacting the preselected surface of the component for inspecting the surface. The probe also includes an eddy current array positioned over the expandable element for generating and detecting magnetic fields in the component to inspect the preselected surface.
    Type: Grant
    Filed: August 3, 2001
    Date of Patent: May 13, 2003
    Assignee: General Electric Company
    Inventors: Richard Lloyd Trantow, Francis Howard Little
  • Eddy current inspection probe
    Publication number: 20030025496
    Abstract: An eddy current inspection probe for inspecting a preselected surface. The eddy current inspection probe includes an expandable element at least partially defining an interior space which is expandable by introducing a pressurized fluid into the interior space from a collapsed position to an expanded position for contacting the preselected surface of the component for inspecting the surface. The probe also includes an eddy current array positioned over the expandable element for generating and detecting magnetic fields in the component to inspect the preselected surface.
    Type: Application
    Filed: August 3, 2001
    Publication date: February 6, 2003
    Inventors: Richard Lloyd Trantow, Francis Howard Little
  • Eddy current inspection probe and method of use
    Patent number: 6469503
    Abstract: An eddy current inspection probe for inspecting a preselected surface at least partially defining an opening in a component. The probe includes a cast core having an exterior surface sized and shaped for receipt within the opening of the component and an eddy current array positioned over the exterior surface of the core for generating and detecting magnetic fields in the component to inspect the preselected surface of the component.
    Type: Grant
    Filed: March 26, 2001
    Date of Patent: October 22, 2002
    Assignee: General Electric Company
    Inventors: Richard Lloyd Trantow, Sandie Elizabeth Gresham, Douglas Edward Ingram
  • EDDY CURRENT INSPECTION PROBE AND METHOD OF USE
    Publication number: 20020135363
    Abstract: An eddy current inspection probe for inspecting a preselected surface at least partially defining an opening in a component. The probe includes a cast core having an exterior surface sized and shaped for receipt within the opening of the component and an eddy current array positioned over the exterior surface of the core for generating and detecting magnetic fields in the component to inspect the preselected surface of the component.
    Type: Application
    Filed: March 26, 2001
    Publication date: September 26, 2002
    Inventors: Richard Lloyd Trantow, Sandie Elizabeth Gresham, Douglas Edward Ingram