Patents by Inventor Richard M. Wasserman

Richard M. Wasserman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7324682
    Abstract: Systems and methods are provided for excluding extraneous image features from inspection operations in a machine vision inspection system. The method identifies extraneous features that are close to image features to be inspected. No image modifications are performed on the “non-excluded” image features to be inspected. A video tool region of interest provided by a user interface of the vision system can encompass both the feature to be inspected and the extraneous features, making the video tool easy to use. The extraneous feature excluding operations are concentrated in the region of interest. The user interface for the video tool may operate similarly whether there are extraneous features in the region of interest, or not. The invention is of particular use when inspecting flat panel display screen masks having occluded features that are to be inspected.
    Type: Grant
    Filed: March 25, 2004
    Date of Patent: January 29, 2008
    Assignee: Mitutoyo Corporation
    Inventor: Richard M. Wasserman
  • Patent number: 7120286
    Abstract: A method and apparatus for tracing an edge contour of an object in three dimensional space is provided. The method and apparatus is utilized in a computer vision system that is designed to obtain precise dimensional measurements of a scanned object. In order to save focusing time during an automatic tracing measurement, multiple images may be collected and saved for a number of Z heights for a particular position of the XY stage. These saved images can later be used to calculate a focal position for each edge point trial location in the selected XY area rather than requiring a physical Z stage movement. In addition, a Z height extrapolation based on the Z heights of previous edge points can significantly speed up the searching process, particularly for objects where the Z height change of a contour is gradual and predictable.
    Type: Grant
    Filed: November 21, 2001
    Date of Patent: October 10, 2006
    Assignee: Mitutoyo Corporation
    Inventors: Dahai Yu, Richard M. Wasserman
  • Patent number: 7092860
    Abstract: The systems and methods of this invention provide simulated images to vision inspection systems. The simulated images emulate the vision of a vision inspection system. Graphical models of objects in a virtual world and lens effects models are used to provide the simulated images.
    Type: Grant
    Filed: February 3, 1999
    Date of Patent: August 15, 2006
    Assignee: Mitutoyo Corporation
    Inventor: Richard M. Wasserman
  • Patent number: 7030351
    Abstract: Auto focus systems and methods for a machine vision metrology and inspection system provide high speed and high precision auto focusing, while using relatively low-cost and flexible hardware. One aspect of various embodiments of the invention is that the portion of an image frame that is output by a camera is minimized for auto focus images, based on a reduced readout pixel set determined in conjunction with a desired region of interest. The reduced readout pixel set allows a maximized image acquisition rate, which in turn allows faster motion between auto focus image acquisition positions to achieve a desired auto focus precision at a corresponding auto focus execution speed that is approximately optimized in relation to a particular region of interest. In various embodiments, strobe illumination is used to further improve auto focus speed and accuracy. A method is provided for adapting and programming the various associated auto focus control parameters.
    Type: Grant
    Filed: November 24, 2003
    Date of Patent: April 18, 2006
    Assignee: Mitutoyo Corporation
    Inventors: Richard M. Wasserman, Paul G. Gladnick, Kim W. Atherton
  • Patent number: 6987876
    Abstract: Systems and methods where a lighting configuration of a vision system is determined using a controllable lighting system and at least one image evaluation tool. The lighting configuration is usable to obtain a desired inspection image of at least one feature of a workpiece Base images are obtained using actual illumination settings of the controllable lighting system. Simulated or synthetic sets image results are generated, based on base images and synthetic lighting configurations. The synthetic lighting configurations include at least one illumination setting which is different from the actual illumination settings used to obtain one or more component base images. A best actual or synthetic lighting configuration is chosen based on the best corresponding set of image results.
    Type: Grant
    Filed: August 6, 2001
    Date of Patent: January 17, 2006
    Assignee: Mitutoyo Corporation
    Inventors: Andrew D. Silber, Richard M. Wasserman
  • Publication number: 20040223053
    Abstract: A precision machine vision inspection system and method for increased inspection throughput. The vision inspection system includes a movable stage for scanning and measuring selected workpiece features. In prior systems, conventional interspersing of image processing and inspection operations with image acquisition operations required stopping and starting the stage motion during image acquisition, necessitating associated delays or wait-states in various operations. Such delays are avoided in this invention by acquiring images continuously, with a timing that is independent of image inspection operations, so that delays and wait-states are avoided. In addition, continuous stage motion is combined with a strobe lighting feature during the image acquisition operations to acquire blur-free images at a high rate. Improved image acquisition and image analysis routines including these features are created and stored by the system.
    Type: Application
    Filed: May 7, 2003
    Publication date: November 11, 2004
    Applicant: Mitutoyo Corporation
    Inventors: Paul G. Gladnick, Richard M. Wasserman, Barry E. Saylor, Mark L. Delaney
  • Patent number: 6677948
    Abstract: The defocused image generating methods and systems defocus an image using sets of image elements of a multi-resolution pyramid representation of the input image. Each pixel in the original image generates a region of confusion based on the image depth data for that pixel. The sets of image elements are used to represent the region of confusion using increasingly higher resolution image elements. The final defocused image is generated by compositing or combining together the sets of image elements after the region of confusion of each pixel has been decomposed into the sets of image elements.
    Type: Grant
    Filed: June 14, 1999
    Date of Patent: January 13, 2004
    Assignee: Mitutoyo Corporation
    Inventors: Richard M. Wasserman, Dahai Yu
  • Patent number: 6627863
    Abstract: Image simulation system and method simulate an image based on a number of base images and a current lighting vector. An actual object to be viewed using the vision system is placed within the overall field of view of the vision system. Depending on the desired analysis to be made, either the entire object, or a specific portion of the object, is illuminated using one of the various illumination sources of the vision system. The base images of the objects, or of the particular portion of the object, are captured, where each base image is illuminated using a different illumination intensity of that single illumination source. This is repeated for each of the different illumination sources provided in the vision system. The simulated image is generated by combining various ones of the base images based on the light intensities of the lighting services defined in the current lighting vector. The simulated image can be evaluated to determine if it has a desired image quality.
    Type: Grant
    Filed: December 15, 2000
    Date of Patent: September 30, 2003
    Assignee: Mitutoyo Corporation
    Inventor: Richard M. Wasserman
  • Publication number: 20030095700
    Abstract: A method and apparatus for tracing an edge contour of an object in three dimensional space is provided. The method and apparatus is utilized in a computer vision system that is designed to obtain precise dimensional measurements of a scanned object. In order to save focusing time during an automatic tracing measurement, multiple images may be collected and saved for a number of Z heights for a particular position of the XY stage. These saved images can later be used to calculate a focal position for each edge point trial location in the selected XY area rather than requiring a physical Z stage movement. In addition, a Z height extrapolation based on the Z heights of previous edge points can significantly speed up the searching process, particularly for objects where the Z height change of a contour is gradual and predictable.
    Type: Application
    Filed: November 21, 2001
    Publication date: May 22, 2003
    Applicant: Mitutoyo Corporation
    Inventors: Dahai Yu, Richard M. Wasserman
  • Patent number: 6542180
    Abstract: The lighting behavior of a vision system is inconsistent between vision systems, within a vision system over time or between parts being viewed. This inconsistency makes it difficult to correctly run part programs even within a single run of parts on a single machine. The multi area image quality tool systems, methods and graphical user interfaces adjust the light intensity of a vision system to obtain a desired image quality or characteristic of a captured image. The multi area image quality tool is used to define a plurality of regions of interest within a captured image to be used to determine the image quality or characteristic of the captured image resulting from a current illumination level. The multi area image quality tool allows a user to easily and quickly define multiple regions of interest that can be used to determine the image quality of a captured image.
    Type: Grant
    Filed: January 18, 2000
    Date of Patent: April 1, 2003
    Assignee: Mitutoyo Corporation
    Inventors: Richard M. Wasserman, Ana M. Tessadro
  • Publication number: 20020076096
    Abstract: Systems and methods where a lighting configuration of a vision system is determined using a controllable lighting system and at least one image evaluation tool. The lighting configuration is usable to obtain a desired inspection image of at least one feature of a workpiece Base images are obtained using actual illumination settings of the controllable lighting system. Simulated or synthetic sets image results are generated, based on base images and synthetic lighting configurations. The synthetic lighting configurations include at least one illumination setting which is different from the actual illumination settings used to obtain one or more component base images. A best actual or synthetic lighting configuration is chosen based on the best corresponding set of image results.
    Type: Application
    Filed: August 6, 2001
    Publication date: June 20, 2002
    Applicant: MITUTOYO CORPORATION
    Inventors: Andrew D. Silber, Richard M. Wasserman
  • Publication number: 20020074480
    Abstract: Image simulation system and method simulate an image based on a number of base images and a current lighting vector. An actual object to be viewed using the vision system is placed within the overall field of view of the vision system. Depending on the desired analysis to be made, either the entire object, or a specific portion of the object, is illuminated using one of the various illumination sources of the vision system. The base images of the objects, or of the particular portion of the object, are captured, where each base image is illuminated using a different illumination intensity of that single illumination source. This is repeated for each of the different illumination sources provided in the vision system. The simulated image is generated by combining various ones of the base images based on the light intensities of the lighting services defined in the current lighting vector. The simulated image can be evaluated to determine if it has a desired image quality.
    Type: Application
    Filed: December 15, 2000
    Publication date: June 20, 2002
    Applicant: Mitutoya Corporation
    Inventor: Richard M. Wasserman