Patents by Inventor Richard Roelke

Richard Roelke has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Calibration artifact and method of using the same
    Patent number: 6704102
    Abstract: A calibration artifact and a method of calibrating a machine vision measurement system. The calibration artifact includes a substrate and a number of concentric rings on one surface of the substrate. Each ring is of a different pre-defined size. The change in the size of any two adjacent rings is different than the change in size of any other two adjacent rings.
    Type: Grant
    Filed: February 6, 2001
    Date of Patent: March 9, 2004
    Assignee: Metronics, Inc.
    Inventor: Richard Roelke
  • Calibration artifact and method of using the same
    Publication number: 20020105639
    Abstract: A calibration artifact and a method of calibrating a machine vision measurement system. The calibration artifact includes a substrate and a number of concentric rings on one surface of the substrate. Each ring is of a different pre-defined size. The change in the size of any two adjacent rings is different than the change in size of any other two adjacent rings.
    Type: Application
    Filed: February 6, 2001
    Publication date: August 8, 2002
    Inventor: Richard Roelke