Patents by Inventor Richard Walter Oldrey

Richard Walter Oldrey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High power device fault localization via die surface contouring
    Patent number: 11940271
    Abstract: A method of preparing a computer processor die includes determining a warpage shape of the computer processor die at a testing temperature. The method also includes selectively contouring a thickness of the computer processor die at a contouring temperature by physically removing material from a surface of the computer processor die such that the surface will be substantially flat at the testing temperature.
    Type: Grant
    Filed: November 17, 2020
    Date of Patent: March 26, 2024
    Assignee: International Business Machines Corporation
    Inventors: David J. Lewison, Jay A. Bunt, Frank L. Pompeo, Richard Walter Oldrey, John D. Sylvestri, Phong T. Tran
  • HIGH POWER DEVICE FAULT LOCALIZATION VIA DIE SURFACE CONTOURING
    Publication number: 20220155049
    Abstract: A method of preparing a computer processor die includes determining a warpage shape of the computer processor die at a testing temperature. The method also includes selectively contouring a thickness of the computer processor die at a contouring temperature by physically removing material from a surface of the computer processor die such that the surface will be substantially flat at the testing temperature.
    Type: Application
    Filed: November 17, 2020
    Publication date: May 19, 2022
    Inventors: David J. Lewison, Jay A. Bunt, Frank L. Pompeo, Richard Walter Oldrey, John D. Sylvestri, Phong T. Tran
  • Inert gas delivery system for electrical inspection apparatus
    Patent number: 9052338
    Abstract: An apparatus for electrical inspection is disclosed. The apparatus comprises an inert gas delivery system that delivers inert gas near a microscope imaging element and electrical test probes. A gas supply provides an inert gas such as argon or nitrogen. The inert gas displaces oxygen to prevent premature oxidation of the test probes. In one embodiment, one or more delivery tubes deliver inert gas to the measurement area.
    Type: Grant
    Filed: November 18, 2013
    Date of Patent: June 9, 2015
    Assignee: International Business Machines Corporation
    Inventors: Terence Lawrence Kane, Richard Walter Oldrey, Michael P. Tenney
  • Inert gas delivery system for electrical inspection apparatus
    Patent number: 8701511
    Abstract: An apparatus for electrical inspection is disclosed. The apparatus comprises an inert gas delivery system that delivers inert gas near a microscope imaging element and electrical test probes. A gas supply provides an inert gas such as argon or nitrogen. The inert gas displaces oxygen to prevent premature oxidation of the test probes. In one embodiment, one or more delivery tubes deliver inert gas to the measurement area.
    Type: Grant
    Filed: March 22, 2011
    Date of Patent: April 22, 2014
    Assignee: International Business Machines Corporation
    Inventors: Richard Walter Oldrey, Terence Lawrence Kane, Michael Tenney
  • INERT GAS DELIVERY SYSTEM FOR ELECTRICAL INSPECTION APPARATUS
    Publication number: 20140069165
    Abstract: An apparatus for electrical inspection is disclosed. The apparatus comprises an inert gas delivery system that delivers inert gas near a microscope imaging element and electrical test probes. A gas supply provides an inert gas such as argon or nitrogen. The inert gas displaces oxygen to prevent premature oxidation of the test probes. In one embodiment, one or more delivery tubes deliver inert gas to the measurement area.
    Type: Application
    Filed: November 18, 2013
    Publication date: March 13, 2014
    Inventors: Terence Lawrence Kane, Richard Walter Oldrey, Michael P. Tenney
  • INERT GAS DELIVERY SYSTEM FOR ELECTRICAL INSPECTION APPARATUS
    Publication number: 20120240657
    Abstract: An apparatus for electrical inspection is disclosed. The apparatus comprises an inert gas delivery system that delivers inert gas near a microscope imaging element and electrical test probes. A gas supply provides an inert gas such as argon or nitrogen. The inert gas displaces oxygen to prevent premature oxidation of the test probes. In one embodiment, one or more delivery tubes deliver inert gas to the measurement area.
    Type: Application
    Filed: March 22, 2011
    Publication date: September 27, 2012
    Applicant: International Business Machines Corporation
    Inventors: Richard Walter Oldrey, Terence Lawrence Kane, Michael Tenney