Patents by Inventor Riku Tamura

Riku Tamura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240177983
    Abstract: Provided are a mass spectrometer and a method for controlling the same capable of suppressing decrease in sensitivity even where the atmospheric pressure around the mass spectrometer varies. The mass spectrometer includes an ion source, a mass analysis unit, a control unit, and a storage unit. The ion source includes an ion source chamber, an inlet, a first gas introduction port, a second gas introduction port, an outlet, and a gas discharge port. The storage unit stores a table indicating a relationship between a measurement condition and a flow rate of the second gas. The control unit changes the flow rate of the second gas according to the measurement condition on the basis of the table, and controls a flow rate of the first gas to suppress a variation in a pressure inside the ion source chamber.
    Type: Application
    Filed: March 22, 2022
    Publication date: May 30, 2024
    Applicant: HITACHI HIGH-TECH COORPORATION
    Inventors: Masuyuki Sugiyama, Hideki Hasegawa, Yuka Sugawara, Riku Tamura, Hiroyuki Yasuda, Yuichiro Hashimoto
  • Publication number: 20240063010
    Abstract: A mass spectrometry device can reduce a deviation in a mass axis due to the generation of heat from an AC voltage control circuit; and a method for controlling the mass spectrometry device. The mass spectrometry device has a quadrupole electrode, to which a controlled AC voltage is applied, and uses the quadrupole electrode as a mass filter. Before measurement, the mass spectrometry device applies an AC voltage of a prescribed amplitude V1 to the multipole electrode for a prescribed time T1, and a heating value J1 that is generated when the AC voltage of the prescribed amplitude V1 is applied to the multipole electrode for the prescribed time T1 is equivalent to a heating value that is generated when the AC voltage of the amplitude that is applied during the measurement is applied until a thermally steady state is reached (see FIG. 3A).
    Type: Application
    Filed: January 17, 2022
    Publication date: February 22, 2024
    Inventors: Yuka SUGAWARA, Yuichiro HASHIMOTO, Hiroyuki YASUDA, Masuyuki SUGIYAMA, Riku TAMURA
  • Publication number: 20240006174
    Abstract: A method for controlling a mass spectrometer capable of identifying an abnormal location in a device is provided. A method for controlling a mass spectrometer including an ion source that ionizes a compound in a sample, a mass spectrometry unit that separates ions based on a mass-to-charge ratio, and a plurality of electrodes that form an electric field that transports ions generated by the ion source to the mass spectrometry unit includes ionizing the sample by the ion source, detecting, based on a change in ion permeability over time, ions accumulated in the electrodes and quadrupole mass filters forming the mass spectrometry unit, and detecting a change in ionization efficiency of the ion source based on a change in an amount of ions with respect to a gas flow rate for the ion source or a voltage of the ion source.
    Type: Application
    Filed: December 17, 2021
    Publication date: January 4, 2024
    Inventors: Riku TAMURA, Hiroyuki YASUDA, Yuka SUGAWARA, Yuichiro HASHIMOTO
  • Publication number: 20230136178
    Abstract: To provide a mass spectrometer for higher ion permeation efficiency. In a mass spectrometer to transfer ions generated in an ion source 101 to a detector 106 through a vacuum chamber equipped with electrodes, the vacuum chamber includes a first vacuum chamber 107 and a second vacuum chamber 108 communicated by a pore 104 and an air flow containing ions introduced from the ion source 101 into the first vacuum chamber 107 is separated to an air flow 704 and an ion flow 703 by an ion guide 103 in the first vacuum chamber 107. The first vacuum chamber 107 has a current plate 113 to reduce mixing of the separated air flow 704 and ion flow 703.
    Type: Application
    Filed: February 10, 2021
    Publication date: May 4, 2023
    Inventors: Yuka SUGAWARA, Masuyuki SUGIYAMA, Yuichiro HASHIMOTO, Hiroyuki YASUDA, Riku TAMURA
  • Publication number: 20220283193
    Abstract: There is provided a specimen analyzer that can measure carry-over without degrading a specimen processing capability. A specimen analyzer according to the present invention measures a first sample including a first specimen and a first internal reference material, subsequently measures a second sample including a second specimen and a second internal reference material, and calculates an amount of the second specimen included in the second sample using an amount of the first internal reference material measured when the first sample has been measured and an amount of the second internal reference material measured when the second sample has been measured.
    Type: Application
    Filed: July 17, 2020
    Publication date: September 8, 2022
    Applicant: Hitachi High-Tech Corporation
    Inventors: Riku Tamura, Yuichiro Hashimoto, Yuka Sugawara, Hiroyuki Yasuda
  • Publication number: 20220270868
    Abstract: There is provided a mass spectrometer that can appropriately maintain the atmospheric pressure of a vacuum chamber, and a method of controlling the same. An example of a mass spectrometer according to the present invention includes first vacuum chambers, first vacuum pumps, an atmospheric pressure relating value acquiring unit, and an adjustment unit configured to adjust the effective exhaust velocity of the first vacuum pumps, and controllers. The controllers control the adjustment unit corresponding to an atmospheric pressure relating value.
    Type: Application
    Filed: July 22, 2020
    Publication date: August 25, 2022
    Applicant: Hitachi High-Tech Corporation
    Inventors: Hiroyuki Yasuda, Yuichiro Hashimoto, Yuka Sugawara, Riku Tamura