Abstract: A panel which may be used as a part of a surface covering system, such as that for a wall or a ceiling, and which is useful to provide easy installation, durability, beneficial fire preventive performance, resistance to mold growth, and resistance to moisture. The panels may have a first major surface, a second major surface opposite the first major surface, and a side surface extending between the first and second major surfaces. The panel may be formed from polyvinyl chloride present in an amount from about 45 to about 70 wt. %; carbonate present in an amount from about 10 to about 31 wt. %; stearate present in an amount from about 1 to about 6 wt. %; and aluminum hydroxide present in an amount from about 10 to about 30 wt. %.

Abstract: A ceiling panel having an upper face, a lower face opposite the upper face, and first through fourth edges having a first edge portion adjacent the upper face and a second edge portion below the first edge portion. Each of the first and second edges may have a tongue and each of the third and fourth edges may have a groove. The first edge portion of each of the third and fourth edges may include a first flange having a distal surface. The first edge portion of each of the first and second edges may include a first recess having a first recess wall surface. The first flange may nest within the first recess of an identical adjacent ceiling panel with the distal surface of the first flange of the ceiling panel being spaced from the first recess wall surface of the first recess of the identical adjacent ceiling panel.

Abstract: A ceiling system, a ceiling panel, and a method of covering a ceiling support with a plurality of ceiling panels. In one aspect, the invention may be a ceiling system comprising: a plurality of ceiling panels, each of the ceiling panels comprising: an upper face; a lower face opposite the upper face; a first edge, a second edge, a third edge opposite the first edge, and a fourth edge opposite the second edge; each of the first and second edges comprising a tongue; and each of the third and fourth edges comprising a groove; and a plurality of alignment clips, each of the alignment clips comprising a cruciform rib element.

Abstract: A ceiling system, a ceiling panel, and a method of covering a ceiling support with a plurality of ceiling panels. In one aspect, the invention may be a ceiling system comprising: a plurality of ceiling panels, each of the ceiling panels comprising: an upper face; a lower face opposite the upper face; a first edge, a second edge, a third edge opposite the first edge, and a fourth edge opposite the second edge; each of the first and second edges comprising a tongue; and each of the third and fourth edges comprising a groove; and a plurality of alignment clips, each of the alignment clips comprising a cruciform rib element.

Abstract: A ceiling system, a ceiling panel, and a method of covering a ceiling support with a plurality of ceiling panels. In one aspect, the invention may be a ceiling system comprising: a plurality of ceiling panels, each of the ceiling panels comprising: an upper face; a lower face opposite the upper face; a first edge, a second edge, a third edge opposite the first edge, and a fourth edge opposite the second edge; each of the first and second edges comprising a tongue; and each of the third and fourth edges comprising a groove; and a plurality of alignment clips, each of the alignment clips comprising a cruciform rib element.

Abstract: A ceiling system, a ceiling panel, and a method of covering a ceiling support with a plurality of ceiling panels. In one aspect, the invention may be a ceiling system comprising: a plurality of ceiling panels, each of the ceiling panels comprising: an upper face; a lower face opposite the upper face; a first edge, a second edge, a third edge opposite the first edge, and a fourth edge opposite the second edge; each of the first and second edges comprising a tongue; and each of the third and fourth edges comprising a groove; and a plurality of alignment clips, each of the alignment clips comprising a cruciform rib element.

Abstract: A ceiling system, a ceiling panel, and a method of covering a ceiling support with a plurality of ceiling panels. In one aspect, the invention may be a ceiling system comprising: a plurality of ceiling panels, each of the ceiling panels comprising: an upper face; a lower face opposite the upper face; a first edge, a second edge, a third edge opposite the first edge, and a fourth edge opposite the second edge; each of the first and second edges comprising a tongue; and each of the third and fourth edges comprising a groove; and a plurality of alignment clips, each of the alignment clips comprising a cruciform rib element.

Abstract: A ceiling system, a ceiling panel, and a method of covering a ceiling support with a plurality of ceiling panels. In one aspect, the invention may be a ceiling system comprising: a plurality of ceiling panels, each of the ceiling panels comprising: an upper face; a lower face opposite the upper face; a first edge, a second edge, a third edge opposite the first edge, and a fourth edge opposite the second edge; each of the first and second edges comprising a tongue; and each of the third and fourth edges comprising a groove; and a plurality of alignment clips, each of the alignment clips comprising a cruciform rib element.

Abstract: The invention relates to a method for determining the thickness of an OPC layer 24 that is strongly absorptive to light at a first wavelength and substantially transmissive to light at a second wavelength. According to the method, the OPC layer is illuminated with light from an array 34 of fluorescent lamps 36 and the light transmitted through the layer is incident on a first filter 42 that is transmissive to light of the first wavelength. A first light intensity pattern transmitted through the first filter is sensed and stored in a first memory frame. Then OPC layer is illuminated again with light and the light transmitted through the layer is incident on a second filter 44 transmissive to light of the second wavelength. A second light intensity pattern transmitted through the second filter is sensed and stored in a second memory frame. The ratio of the first light intensity pattern and the second light intensity pattern is determined and utilized to calculate the thickness of the layer.

Abstract: In a method of detecting blemishes in the proximity of the perimeter of a CCD image, pairs of adjacent pixels in the proximity of the perimeter are sequentially considered. For each pair of adjacent pixels, a plurality of pixels, in a blemish detection pixel pattern extending toward the center of the image are considered. The sum of the four outer pixels in the pixel pattern are compared to the sum of the inner pixels and the variance is compared to selected minimum and maximum differences. When the variance is outside either the minimum or the maximum differences a blemish has been detected. When the difference is within the two differences no blemish has been found. The blemish pattern is moved one pixel toward the center of the image and the process repeated. The difference comparison is repeated for a selected plurality of times and if desired the differences can be changed for some of the comparisons.

Abstract: A system for measuring the intensity profiles of the electron beams of color kinescopes includes a camera having a CCD. A color field is placed on the kinescope screen and a pixel in the center of one of the colored stripes is selected. The color field is turned off and the beam is scanned in short lines in one direction and incrementally stepped across the selected pixel in the perpendicular direction. The charge level on the selected pixel is representative of the beam intensity and is recorded. The entire beam is stepped across the pixel to measure the intensity profile in one direction. The directions of scanning and stepping are then interchanged to measure the beam intensity profile in the normal direction. The process is then repeated for the other electron beams in the kinescope.

Abstract: The perimeter of an object is detected using a CCD. When a pixel is dark a right detection turn is taken and when a pixel is light a left detection turn is taken. When a transition from light to dark or from dark to light occurs the address of the light pixel is recorded to identify the light pixel as a perimeter pixel.

Abstract: A system for inspecting images projected onto a charge coupled device (CCD) compares the image cast onto the CCD by an object to be inspected with an optimum reference image to identify and locate faults in the object being inspected, or to modify the image to match the reference.

Abstract: A system for measuring figures projected onto a charge coupled device (CCD) sums the data from a preselected number of adjacent pixels in a particular pixel line. The sum signal is divided by a full pixel signal to provide a mean pixel signal. The mean pixel signal is multiplied by a dimension per pixel value to provide a dimension signal representative of the dimension being measured. The dimension signal is compared with a reference dimension to determine the acceptability of the figure being measured.

Abstract: An inspection system utilizing a CCD includes a CCD data transfer generator which allows the changing of the CCD without redesigning the system. The numbers of horizontal rows and vertical columns of pixels of the CCD are set into a digital memory and into a waveform generator. The waveform generator provides horizontal scanning and vertical scanning waveforms in accordance with the row and column settings whereby the CCD can be replaced with a different size CCD and new numbers set into the memory and waveform generator.

Abstract: A system for detecting blemishes on an illuminted object, such as the screen of a kinescope, includes a charge coupled device (CCD). The signal from each CCD pixel is compared with the average of the signals of all pixels immediately adjacent to the pixel being investigated to provide a difference signal. The difference signal is compared to a threshold level and a blemish signal generated when the difference signal exceeds the threshold.